In this study, photopyroelectric spectroscopy (PPES) was used to obtain thermal and optical properties of CdTe thin films in the 300–1200 nm wavelength range. The samples studied were grown on glass or substrates using the hot wall epitaxy technique with varying thicknesses. The normalized photopyroelectric signal intensity and its phase were independently measured as a function of wavelength and chopping frequency . Equations of both the intensity and the phase of the PPES signal, taking into account the thermal and the optical characteristics of the pyroelectric detector, were used to fit the experimental results. From the fittings, we have obtained the values of thermal diffusivity coefficient , thermal conductivity , optical absorption coefficient, and the optical gap of CdTe.
Skip Nav Destination
Article navigation
15 May 2007
Research Article|
May 25 2007
Study of thermal and optical properties of the semiconductor CdTe by photopyroelectric spectroscopy
J. E. de Albuquerque;
J. E. de Albuquerque
a)
Departamento de Física,
Universidade Federal de Viçosa
, Viçosa, 36571-000, MG, Brazil
Search for other works by this author on:
P. M. S. de Oliveira;
P. M. S. de Oliveira
Departamento de Física,
Universidade Federal de Viçosa
, Viçosa, 36571-000, MG, Brazil
Search for other works by this author on:
S. O. Ferreira
S. O. Ferreira
Departamento de Física,
Universidade Federal de Viçosa
, Viçosa, 36571-000, MG, Brazil
Search for other works by this author on:
a)
Author to whom correspondence should be addressed; electronic mail: [email protected]
J. Appl. Phys. 101, 103527 (2007)
Article history
Received:
November 30 2006
Accepted:
March 20 2007
Citation
J. E. de Albuquerque, P. M. S. de Oliveira, S. O. Ferreira; Study of thermal and optical properties of the semiconductor CdTe by photopyroelectric spectroscopy. J. Appl. Phys. 15 May 2007; 101 (10): 103527. https://doi.org/10.1063/1.2734940
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.
Related Content
Determination of thermal and optical parameters of melanins by photopyroelectric spectroscopy
Appl. Phys. Lett. (August 2005)
Determination of thermal and optical properties of ion implanted polyetheretherketone films by photothermal spectroscopies
J. Appl. Phys. (March 2007)
Photopyroelectric technique for the measurement of thermal and optical properties of pigments in liquid solution
Rev. Sci. Instrum. (July 2011)
On the piezoelectric contribution to the photopyroelectric signal
Rev. Sci. Instrum. (February 2005)
Superficial and In‐depth Images of a Biological Sample Using Photopyroelectric Microscopy
AIP Conference Proceedings (November 2007)