Thermal magnetization fluctuations in tunneling magnetoresistive heads with track width of have been studied through high-frequency magnetic noise measurement as a function of both transverse and longitudinal fields. The study suggests that in the dynamic region of the heads, the related power spectral density is determined by the magnetization fluctuations of the free layer. At high fields which drive the sensor to the magnetization saturation, an “abnormal” resonance with substantially high amplitude in comparison with that of the free layer is observed when the magnetization of the free layer is nearly antiparallel to that of the reference layer. This abnormal resonance is excluded from the spin torque effect. The detailed analysis suggests that this resonance is due to the magnetization fluctuations in the reference/pinned layers.
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15 September 2006
Research Article|
September 29 2006
Field dependence of high-frequency magnetic noise in tunneling magnetoresistive heads
G. C. Han;
G. C. Han
a)
Data Storage Institute
, DSI Building, 5 Engineering Drive 1, Singapore 117608, Singapore
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Y. K. Zheng;
Y. K. Zheng
Data Storage Institute
, DSI Building, 5 Engineering Drive 1, Singapore 117608, Singapore
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Z. Y. Liu;
Z. Y. Liu
Data Storage Institute
, DSI Building, 5 Engineering Drive 1, Singapore 117608, Singapore
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B. Liu;
B. Liu
Data Storage Institute
, DSI Building, 5 Engineering Drive 1, Singapore 117608, Singapore
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S. N. Mao
S. N. Mao
Seagate Technology
, 7801 Computer Avenue, Minneapolis, Minnesota 55435
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a)
Electronic mail: haṉguchang@dsi.a-star.edu.sg
J. Appl. Phys. 100, 063912 (2006)
Article history
Received:
May 22 2006
Accepted:
June 22 2006
Citation
G. C. Han, Y. K. Zheng, Z. Y. Liu, B. Liu, S. N. Mao; Field dependence of high-frequency magnetic noise in tunneling magnetoresistive heads. J. Appl. Phys. 15 September 2006; 100 (6): 063912. https://doi.org/10.1063/1.2338133
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