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Advances in Quantum Metrology

With the 2019 revision of the international system of units, quantum metrology has become the foundation of all physical measurements. Now, the seven SI base units are defined by fixed values of seven so-called defining constants, among them the caesium hyperfine frequency ΔνCs, Planck’s constant h, and the elementary charge e. This allows the realization in every lab of identical measurement standards, which are precise, intrinsically stable and do not require any calibration. While some quantum standards like Cs atomic clocks, Josephson voltage standards, and quantum Hall resistance standards, are already well established, others like advanced optical clocks, single electron pumps, among others, have yet to achieve practical utility. Additionally, quantum metrology enables more sensitive measurements taking advantage of quantum effects like squeezing for noise reduction, opening up applications such as ultra precise geodesy, gravitational wave detection, magnetometry, and even tests of quantum gravity. Furthermore, the advance of quantum applications like quantum computing, creates the need for a reliable metrology for such quantum systems, components, and devices.

In this special issue, we solicit submissions that address the foundations and applications of quantum-based measurements, in order to promote the further development of the field of quantum metrology.

Guest Editors: Hans Schumacher, Stefan Kueck, JT Janssen, Nenad Kralj, Helen Margolis, and Samuel Benz

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Nathaniel J. Huáng; Jessica L. Boland; Kajetan M. Fijalkowski; Charles Gould; Thorsten Hesjedal; Olga Kazakova; Susmit Kumar; Hansjörg Scherer
Hristina Georgieva; Thomas Gerrits; Lijun Ma; Riley Dawkins; Marco López; Oliver Slattery; Niklas Kanold; Arsenty Kaganskiy; Sven Rodt; Stephan Reitzenstein; Alan Migdall; Stefan Kück
S. Virzì; A. Meda; E. Redolfi; M. Gramegna; G. Brida; M. Genovese; I. P. Degiovanni
L. Arabskyj; B. Dejen; T. S. Santana; M. Lucamarini; C. J. Chunnilall; P. R. Dolan
B. Dejen; A. Vaquero-Stainer; T. S. Santana; L. Arabskyj; P. R. Dolan; C. J. Chunnilall
Wayne McKenzie; Anne Marie Richards; Shirali Patel; Thomas Gerrits; T. G. Akin; Steven Peil; Adam T. Black; David Tulchinsky; Alexander Hastings; Ya-Shian Li-Baboud; Anouar Rahmouni; Ivan A. Burenkov; Alan Mink; Matthew Diaz; Nijil Lal; Yicheng Shi; Paulina Kuo; Pranish Shrestha; Mheni Merzouki; Alejandro Rodriguez Perez; Eleanya Onuma; Daniel E. Jones; Atiyya A. Davis; Thomas A. Searles; J. D. Whalen; Qudsia Sara Quraishi; Kate S. Collins; La Vida Cooper; Harry Shaw; Bruce Crabill; Oliver Slattery; Abdella Battou
Elrina Hartman; Michael E. Tobar; Ben T. McAllister; Jeremy Bourhill; Maxim Goryachev
Rais S. Shaikhaidarov; Ilya Antonov; Kyung Ho Kim; Artem Shesterikov; Sven Linzen; Evgeni V. Il'ichev; Vladimir N Antonov; Oleg V Astafiev
N. Schoinas; Y. Rath; S. Norimoto; W. Xie; P. See; J. P. Griffiths; C. Chen; D. A. Ritchie; M. Kataoka; A. Rossi; I. Rungger
S. Norimoto; P. See; N. Schoinas; I. Rungger; T. O. Boykin, II; M. D. Stewart, Jr.; J. P. Griffiths; C. Chen; D. A. Ritchie; M. Kataoka
S.-H. Shin; M. Stanley; W. N. Wong; T. Sweetnam; A. Elarabi; T. Lindström; N. M. Ridler; S. E. de Graaf
Michael E. Tobar; Michael T. Hatzon; Graeme R. Flower; Maxim Goryachev
J. Z. Han; N. C. Xin; J. W. Zhang; Y. M. Yu; J. G. Li; L. Qian; L. J. Wang
Yefei Yin; Mattias Kruskopf; Stephan Bauer; Teresa Tschirner; Klaus Pierz; Frank Hohls; Rolf J. Haug; Hans W. Schumacher
S. P. Benz; J. Biesecker; C. J. Burroughs; M. A. Castellanos-Beltran; P. D. Dresselhaus; N. E. Flowers-Jacobs; A. E. Fox; P. F. Hopkins; R. Johnson-Wilke; D. Olaya; A. Rüfenacht; A. J. Sirois; J. N. Thomas
Xiao-Yan Yang; Hai-Feng Zhang; Lei Du; Hao-Ran Tao; Liang-Liang Guo; Tian-Le Wang; Zhi-Long Jia; Wei-Cheng Kong; Zhao-Yun Chen; Peng Duan; Guo-Ping Guo
A. Kaiser; S. Dickopf; M. Door; R. Behr; U. Beutel; S. Eliseev; A. Kaushik; K. Kromer; M. Müller; L. Palafox; S. Ulmer; A. Mooser; K. Blaum
Y. Kalboussi; B. Delatte; S. Bira; K. Dembele; X. Li; F. Miserque; N. Brun; M. Walls; J. L. Maurice; D. Dragoe; J. Leroy; D. Longuevergne; A. Gentils; S. Jublot-Leclerc; G. Jullien; F. Eozenou; M. Baudrier; L. Maurice; T. Proslier
Sheng-Xian Xiao; Ying Liang; Ya Zhang; Tao Wang

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