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Operando systems for synchrotron studies of additive manufacturing processes
This Special Topic collects articles on in situ/operando systems for synchrotron x-ray studies of additive manufacturing of soft and hard materials, with a focus on technical details of the instrumentation and beamline experiments.
Guest Editor: Tao Sun
Preface
Tao Sun
Equipment and Techniques for Microscopy; Imaging Methods; Positioning Systems, Nanoparticles
Pierre Lhuissier; Louis Hébrard; Xavier Bataillon; Pierre Lapouge; Frédéric Coste; Patrice Peyre; Elodie Boller; Jean-Jacques Blandin; Luc Salvo; Guilhem Martin
General Instruments, General Experimental Techniques or Analyses
Adrita Dass; Ashlee Gabourel; Darren Pagan; Atieh Moridi
CONTRIBUTED REVIEW ARTICLES
Xiaolin Zhang; Zijue Tang; Yi Wu; Oleg Devoino; Haowei Wang; Hongze Wang
Equipment and Techniques for Microscopy; Imaging Methods; Positioning Systems, Nanoparticles
Luis I. Escano; Niranjan D. Parab; Qilin Guo; Minglei Qu; Kamel Fezzaa; Wes Everhart; Tao Sun; Lianyi Chen
Equipment and Techniques for Microscopy; Imaging Methods; Positioning Systems, Nanoparticles
Aiden A. Martin; Jenny Wang; Philip J. DePond; Maria Strantza; Jean-Baptiste Forien; Sanam Gorgannejad; Gabriel M. Guss; Vivek Thampy; Anthony Y. Fong; Johanna Nelson Weker; Kevin H. Stone; Christopher J. Tassone; Manyalibo J. Matthews; Nicholas P. Calta
Equipment and Techniques for Microscopy; Imaging Methods; Positioning Systems, Nanoparticles
Samantha Webster; Marco Giovannini; Yi Shi; Nicolas Martinez-Prieto; Kamel Fezzaa; Tao Sun; Kornel Ehmann; Jian Cao
Equipment and Techniques for Microscopy; Imaging Methods; Positioning Systems, Nanoparticles
Guang Yang; Halil Tetik; Johanna Nelson Weker; Xianghui Xiao; Shuting Lei; Dong Lin