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Radiation Effects in Materials
The incorporation of new materials and advanced systems ranging from microelectronics to structural metals into radiation applications requires a detailed fundamental understanding of the chemical and microstructural evolutions. This special topic covers theoretical and experimental studies exploring radiation effects from the atomic to the system level. Both radiations induced materials modification and desired manipulation as well as degradation are of interest. Further, multiple stimuli in addition to radiation will be of interest to this special issue. Interesting and novel methods to examine materials changes due to radiation will be considered.
Guest Editors: Lorenzo Malerba, Takeshi Ohshima, Rudy Konings, and Khalid Hattar

EDITORIALS
Khalid Hattar; Rudy J. M. Konings; Lorenzo Malerba; Takeshi Ohshima
10.1063/5.0164237
Physics of Semiconductors
A. Y. Polyakov; А. I. Kochkova; A. Azarov; V. Venkatachalapathy; A. V. Miakonkikh; A. A. Vasilev; A. V. Chernykh; I. V. Shchemerov; A. A. Romanov; A. Kuznetsov; S. J. Pearton
10.1063/5.0133181
Emerging, Interdisciplinary, and Other Fields of Applied Physics
Rajan Agrahari; Prashant Kumar Rajbhar; Manpuran Mahto; Pradip Kumar Jain
10.1063/5.0139074
Physics of Semiconductors
F. Mirkhosravi; A. Rashidi; A. T. Elshafiey; J. Gallagher; Z. Abedi; K. Ahn; A. Lintereur; E. K. Mace; M. A. Scarpulla; D. Feezell
10.1063/5.0119294
Physics of Semiconductors
Jian-Sian Li; Chao-Ching Chiang; Xinyi Xia; Sergei Stepanoff; Aman Haque; Douglas E. Wolfe; Fan Ren; S. J. Pearton
10.1063/5.0134823
Physics of Materials, Including Electrical, Thermal, Mechanical and Other Properties
Tatsuo Fukuda; Masaaki Kobata; Takahisa Shobu; Kenji Yoshii; Junichiro Kamiya; Yosuke Iwamoto; Takahiro Makino; Yuichi Yamazaki; Takeshi Ohshima; Yasuhiro Shirai; Tsuyoshi Yaita
10.1063/5.0099136
Physics of Materials, Including Electrical, Thermal, Mechanical and Other Properties
Qianran Yu; Giacomo Po; Jaime Marian
10.1063/5.0101561
Quantum Physics and Technology
Chikara Shinei; Yuta Masuyama; Masashi Miyakawa; Hiroshi Abe; Shuya Ishii; Seiichi Saiki; Shinobu Onoda; Takashi Taniguchi; Takeshi Ohshima; Tokuyuki Teraji
10.1063/5.0103332
Physics of Matter under Extreme Conditions
Isabelle Zacharie-Aubrun; Rebecca Dowek; Jean Noirot; Thierry Blay; Martiane Cabié; Myriam Dumont
10.1063/5.0104865
Physics of Matter under Extreme Conditions
Jean Noirot; Rébecca Dowek; Isabelle Zacharie-Aubrun; Thierry Blay; Martiane Cabié; Myriam Dumont
10.1063/5.0105072
Physics of Materials, Including Electrical, Thermal, Mechanical and Other Properties
M. Prester; D. Drobac; Ž. Marohnić; M. Roldán; F. J. Sánchez; Z. Siketić; T. Tadić
10.1063/5.0098439
Physics of Materials, Including Electrical, Thermal, Mechanical and Other Properties
Jean-Christophe Griveau; Jean-François Vigier; Karin Popa; Sorin-Octavian Vălu; Eric Colineau; Rudy J. M. Konings
10.1063/5.0112674
Physics of Devices and Sensors
A. Barthel; L. Sayre; G. Kusch; R. A. Oliver; L. C. Hirst
10.1063/5.0103381
Physics of Materials, Including Electrical, Thermal, Mechanical and Other Properties
C. Robertson; M. H. Mathon; B. K. Panigrahi; S. Amirthapandian; S. Sojak; S. Santra
10.1063/5.0092138
Thin Films, Interfaces, and Surfaces
Tetsuya Kimata; Sho Kato; Tomohiro Kobayashi; Shunya Yamamoto; Tetsuya Yamaki; Takayuki Terai
10.1063/5.0103520
Physics of Materials, Including Electrical, Thermal, Mechanical and Other Properties
Didier Bathellier; Luca Messina; Michel Freyss; Marjorie Bertolus; Thomas Schuler; Maylise Nastar; Pär Olsson; Emeric Bourasseau
10.1063/5.0103166
Magnetism, Spintronics, and Superconductivity
A. Iwase; K. Fukuda; Y. Saitoh; Y. Okamoto; S. Semboshi; H. Amekura; T. Matsui
10.1063/5.0102438
Physics of Matter under Extreme Conditions
Awen Liu; Hefei Huang; Zhenbo Zhu; Ruoyu Li; Weichi Ji; Yan Li
10.1063/5.0097484
Thin Films, Interfaces, and Surfaces
E. S. Srinadhu; D. D. Kulkarni; D. A. Field; J. E. Harriss; C. E. Sosolik
10.1063/5.0098945
Physics of Matter under Extreme Conditions
M. Yu. Lavrentiev; A. Hollingsworth; J. Hess; S. Davies; A. Wohlers; B. Thomas; H. Salter; A. Baron-Wiechec; I. Jepu; Y. Zayachuk; N. Peng
10.1063/5.0099051