A computer program called IMD is described. IMD is used for modeling the optical properties (reflectance, transmittance, electric-field intensities, etc.) of multilayer films, i.e., films consisting of any number of layers of any thickness. IMD includes a full graphical user interface and affords modeling with up to eight simultaneous independent variables, as well as parameter estimation (including confidence interval generation) using nonlinear, least-squares curve fitting to user-supplied experimental optical data. The computation methods and user interface are described, and numerous examples are presented that illustrate some of IMD’s unique modeling, fitting, and visualization capabilities. © 1998 American Institute of Physics.
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Research Article| July 01 1998
IMD—Software for modeling the optical properties of multilayer films
David L. Windt; IMD—Software for modeling the optical properties of multilayer films. Comput. Phys. 1 July 1998; 12 (4): 360–370. https://doi.org/10.1063/1.168689
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