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LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 93, 041101 (2008) https://doi.org/10.1063/1.2959854
Appl. Phys. Lett. 93, 041102 (2008) https://doi.org/10.1063/1.2963029
Appl. Phys. Lett. 93, 041103 (2008) https://doi.org/10.1063/1.2950087
Appl. Phys. Lett. 93, 041104 (2008) https://doi.org/10.1063/1.2960999
Appl. Phys. Lett. 93, 041105 (2008) https://doi.org/10.1063/1.2963030
Appl. Phys. Lett. 93, 041106 (2008) https://doi.org/10.1063/1.2964093
Appl. Phys. Lett. 93, 041107 (2008) https://doi.org/10.1063/1.2965124
Appl. Phys. Lett. 93, 041108 (2008) https://doi.org/10.1063/1.2965126
Appl. Phys. Lett. 93, 041109 (2008) https://doi.org/10.1063/1.2966339
Appl. Phys. Lett. 93, 041110 (2008) https://doi.org/10.1063/1.2955518
Appl. Phys. Lett. 93, 041111 (2008) https://doi.org/10.1063/1.2960352
Appl. Phys. Lett. 93, 041112 (2008) https://doi.org/10.1063/1.2962991
Appl. Phys. Lett. 93, 041113 (2008) https://doi.org/10.1063/1.2965614
Appl. Phys. Lett. 93, 041114 (2008) https://doi.org/10.1063/1.2966180
Appl. Phys. Lett. 93, 041115 (2008) https://doi.org/10.1063/1.2963981
Appl. Phys. Lett. 93, 041116 (2008) https://doi.org/10.1063/1.2965451
Appl. Phys. Lett. 93, 041117 (2008) https://doi.org/10.1063/1.2965810
Appl. Phys. Lett. 93, 041118 (2008) https://doi.org/10.1063/1.2967730
Appl. Phys. Lett. 93, 041119 (2008) https://doi.org/10.1063/1.2966342
Appl. Phys. Lett. 93, 041120 (2008) https://doi.org/10.1063/1.2968190
Appl. Phys. Lett. 93, 041121 (2008) https://doi.org/10.1063/1.2968211

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 93, 041501 (2008) https://doi.org/10.1063/1.2963472
Appl. Phys. Lett. 93, 041502 (2008) https://doi.org/10.1063/1.2965453
Appl. Phys. Lett. 93, 041503 (2008) https://doi.org/10.1063/1.2967016
Appl. Phys. Lett. 93, 041504 (2008) https://doi.org/10.1063/1.2966371

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 93, 041901 (2008) https://doi.org/10.1063/1.2961006
Appl. Phys. Lett. 93, 041902 (2008) https://doi.org/10.1063/1.2965107
Appl. Phys. Lett. 93, 041903 (2008) https://doi.org/10.1063/1.2965801
Appl. Phys. Lett. 93, 041904 (2008) https://doi.org/10.1063/1.2964179
Appl. Phys. Lett. 93, 041905 (2008) https://doi.org/10.1063/1.2965613
Appl. Phys. Lett. 93, 041906 (2008) https://doi.org/10.1063/1.2965637
Appl. Phys. Lett. 93, 041907 (2008) https://doi.org/10.1063/1.2963473
Appl. Phys. Lett. 93, 041908 (2008) https://doi.org/10.1063/1.2963480
Appl. Phys. Lett. 93, 041909 (2008) https://doi.org/10.1063/1.2963489
Appl. Phys. Lett. 93, 041910 (2008) https://doi.org/10.1063/1.2966338
Appl. Phys. Lett. 93, 041911 (2008) https://doi.org/10.1063/1.2957471
Appl. Phys. Lett. 93, 041912 (2008) https://doi.org/10.1063/1.2958349
Appl. Phys. Lett. 93, 041913 (2008) https://doi.org/10.1063/1.2959829
Appl. Phys. Lett. 93, 041914 (2008) https://doi.org/10.1063/1.2966358
Appl. Phys. Lett. 93, 041915 (2008) https://doi.org/10.1063/1.2966368
Appl. Phys. Lett. 93, 041916 (2008) https://doi.org/10.1063/1.2967195
Appl. Phys. Lett. 93, 041917 (2008) https://doi.org/10.1063/1.2968201

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 93, 042101 (2008) https://doi.org/10.1063/1.2945289
Appl. Phys. Lett. 93, 042102 (2008) https://doi.org/10.1063/1.2963983
Appl. Phys. Lett. 93, 042103 (2008) https://doi.org/10.1063/1.2965487
Appl. Phys. Lett. 93, 042104 (2008) https://doi.org/10.1063/1.2965483
Appl. Phys. Lett. 93, 042105 (2008) https://doi.org/10.1063/1.2965807
Appl. Phys. Lett. 93, 042106 (2008) https://doi.org/10.1063/1.2966141
Appl. Phys. Lett. 93, 042107 (2008) https://doi.org/10.1063/1.2959079
Appl. Phys. Lett. 93, 042108 (2008) https://doi.org/10.1063/1.2963476
Appl. Phys. Lett. 93, 042109 (2008) https://doi.org/10.1063/1.2965123
Appl. Phys. Lett. 93, 042110 (2008) https://doi.org/10.1063/1.2955532
Appl. Phys. Lett. 93, 042111 (2008) https://doi.org/10.1063/1.2963483
Appl. Phys. Lett. 93, 042112 (2008) https://doi.org/10.1063/1.2967726
Appl. Phys. Lett. 93, 042113 (2008) https://doi.org/10.1063/1.2966148
Appl. Phys. Lett. 93, 042114 (2008) https://doi.org/10.1063/1.2966158
Appl. Phys. Lett. 93, 042115 (2008) https://doi.org/10.1063/1.2967194
Appl. Phys. Lett. 93, 042116 (2008) https://doi.org/10.1063/1.2967857

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 93, 042501 (2008) https://doi.org/10.1063/1.2961032
Appl. Phys. Lett. 93, 042502 (2008) https://doi.org/10.1063/1.2959186
Appl. Phys. Lett. 93, 042503 (2008) https://doi.org/10.1063/1.2960337
Appl. Phys. Lett. 93, 042504 (2008) https://doi.org/10.1063/1.2960338
Appl. Phys. Lett. 93, 042505 (2008) https://doi.org/10.1063/1.2961001
Appl. Phys. Lett. 93, 042506 (2008) https://doi.org/10.1063/1.2964195
Appl. Phys. Lett. 93, 042507 (2008) https://doi.org/10.1063/1.2965463
Appl. Phys. Lett. 93, 042508 (2008) https://doi.org/10.1063/1.2956392
Appl. Phys. Lett. 93, 042509 (2008) https://doi.org/10.1063/1.2960551
Appl. Phys. Lett. 93, 042510 (2008) https://doi.org/10.1063/1.2964182
Appl. Phys. Lett. 93, 042511 (2008) https://doi.org/10.1063/1.2966143
Appl. Phys. Lett. 93, 042512 (2008) https://doi.org/10.1063/1.2966364
Appl. Phys. Lett. 93, 042513 (2008) https://doi.org/10.1063/1.2967739
Appl. Phys. Lett. 93, 042514 (2008) https://doi.org/10.1063/1.2966360
Appl. Phys. Lett. 93, 042515 (2008) https://doi.org/10.1063/1.2967189
Appl. Phys. Lett. 93, 042516 (2008) https://doi.org/10.1063/1.2967729

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 93, 042901 (2008) https://doi.org/10.1063/1.2956410
Appl. Phys. Lett. 93, 042902 (2008) https://doi.org/10.1063/1.2965462
Appl. Phys. Lett. 93, 042903 (2008) https://doi.org/10.1063/1.2966147
Appl. Phys. Lett. 93, 042904 (2008) https://doi.org/10.1063/1.2966352
Appl. Phys. Lett. 93, 042905 (2008) https://doi.org/10.1063/1.2966934
Appl. Phys. Lett. 93, 042906 (2008) https://doi.org/10.1063/1.2966366
Appl. Phys. Lett. 93, 042907 (2008) https://doi.org/10.1063/1.2967736

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 93, 043101 (2008) https://doi.org/10.1063/1.2963352
Appl. Phys. Lett. 93, 043102 (2008) https://doi.org/10.1063/1.2955514
Appl. Phys. Lett. 93, 043103 (2008) https://doi.org/10.1063/1.2955521
Appl. Phys. Lett. 93, 043104 (2008) https://doi.org/10.1063/1.2958237
Appl. Phys. Lett. 93, 043105 (2008) https://doi.org/10.1063/1.2965125
Appl. Phys. Lett. 93, 043106 (2008) https://doi.org/10.1063/1.2965484
Appl. Phys. Lett. 93, 043107 (2008) https://doi.org/10.1063/1.2965803
Appl. Phys. Lett. 93, 043108 (2008) https://doi.org/10.1063/1.2957991
Appl. Phys. Lett. 93, 043109 (2008) https://doi.org/10.1063/1.2963195
Appl. Phys. Lett. 93, 043110 (2008) https://doi.org/10.1063/1.2963363
Appl. Phys. Lett. 93, 043111 (2008) https://doi.org/10.1063/1.2965486
Appl. Phys. Lett. 93, 043112 (2008) https://doi.org/10.1063/1.2965615
Appl. Phys. Lett. 93, 043113 (2008) https://doi.org/10.1063/1.2965805
Appl. Phys. Lett. 93, 043114 (2008) https://doi.org/10.1063/1.2966340
Appl. Phys. Lett. 93, 043115 (2008) https://doi.org/10.1063/1.2957041
Appl. Phys. Lett. 93, 043116 (2008) https://doi.org/10.1063/1.2958235
Appl. Phys. Lett. 93, 043117 (2008) https://doi.org/10.1063/1.2963367
Appl. Phys. Lett. 93, 043118 (2008) https://doi.org/10.1063/1.2965121
Appl. Phys. Lett. 93, 043119 (2008) https://doi.org/10.1063/1.2965798
Appl. Phys. Lett. 93, 043120 (2008) https://doi.org/10.1063/1.2939095
Appl. Phys. Lett. 93, 043121 (2008) https://doi.org/10.1063/1.2963196
Appl. Phys. Lett. 93, 043122 (2008) https://doi.org/10.1063/1.2963975
Appl. Phys. Lett. 93, 043123 (2008) https://doi.org/10.1063/1.2963976
Appl. Phys. Lett. 93, 043124 (2008) https://doi.org/10.1063/1.2967211
Appl. Phys. Lett. 93, 043125 (2008) https://doi.org/10.1063/1.2965471
Appl. Phys. Lett. 93, 043126 (2008) https://doi.org/10.1063/1.2967468

ORGANIC ELECTRONICS AND PHOTONICS

Appl. Phys. Lett. 93, 043301 (2008) https://doi.org/10.1063/1.2952769
Appl. Phys. Lett. 93, 043302 (2008) https://doi.org/10.1063/1.2958341
Appl. Phys. Lett. 93, 043303 (2008) https://doi.org/10.1063/1.2959728
Appl. Phys. Lett. 93, 043304 (2008) https://doi.org/10.1063/1.2965468
Appl. Phys. Lett. 93, 043305 (2008) https://doi.org/10.1063/1.2959076
Appl. Phys. Lett. 93, 043306 (2008) https://doi.org/10.1063/1.2960348
Appl. Phys. Lett. 93, 043307 (2008) https://doi.org/10.1063/1.2962986
Appl. Phys. Lett. 93, 043308 (2008) https://doi.org/10.1063/1.2965120
Appl. Phys. Lett. 93, 043309 (2008) https://doi.org/10.1063/1.2966354
Appl. Phys. Lett. 93, 043310 (2008) https://doi.org/10.1063/1.2966784
Appl. Phys. Lett. 93, 043311 (2008) https://doi.org/10.1063/1.2967193

DEVICE PHYSICS

Appl. Phys. Lett. 93, 043501 (2008) https://doi.org/10.1063/1.2964203
Appl. Phys. Lett. 93, 043502 (2008) https://doi.org/10.1063/1.2965469
Appl. Phys. Lett. 93, 043503 (2008) https://doi.org/10.1063/1.2961034
Appl. Phys. Lett. 93, 043504 (2008) https://doi.org/10.1063/1.2965464
Appl. Phys. Lett. 93, 043505 (2008) https://doi.org/10.1063/1.2965616
Appl. Phys. Lett. 93, 043506 (2008) https://doi.org/10.1063/1.2965808
Appl. Phys. Lett. 93, 043507 (2008) https://doi.org/10.1063/1.2965809
Appl. Phys. Lett. 93, 043508 (2008) https://doi.org/10.1063/1.2958224
Appl. Phys. Lett. 93, 043509 (2008) https://doi.org/10.1063/1.2958343
Appl. Phys. Lett. 93, 043510 (2008) https://doi.org/10.1063/1.2960351
Appl. Phys. Lett. 93, 043511 (2008) https://doi.org/10.1063/1.2966142
Appl. Phys. Lett. 93, 043512 (2008) https://doi.org/10.1063/1.2966155
Appl. Phys. Lett. 93, 043513 (2008) https://doi.org/10.1063/1.2959824
Appl. Phys. Lett. 93, 043514 (2008) https://doi.org/10.1063/1.2963401
Appl. Phys. Lett. 93, 043515 (2008) https://doi.org/10.1063/1.2964187
Appl. Phys. Lett. 93, 043516 (2008) https://doi.org/10.1063/1.2964194
Appl. Phys. Lett. 93, 043517 (2008) https://doi.org/10.1063/1.2966157
Appl. Phys. Lett. 93, 043518 (2008) https://doi.org/10.1063/1.2967192

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 93, 044101 (2008) https://doi.org/10.1063/1.2965108
Appl. Phys. Lett. 93, 044102 (2008) https://doi.org/10.1063/1.2963364
Appl. Phys. Lett. 93, 044103 (2008) https://doi.org/10.1063/1.2967334

COMMENTS

Appl. Phys. Lett. 93, 046101 (2008) https://doi.org/10.1063/1.2965457

ERRATA

Appl. Phys. Lett. 93, 049901 (2008) https://doi.org/10.1063/1.2960322
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