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LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 92, 241101 (2008) https://doi.org/10.1063/1.2937841
Appl. Phys. Lett. 92, 241102 (2008) https://doi.org/10.1063/1.2946660
Appl. Phys. Lett. 92, 241103 (2008) https://doi.org/10.1063/1.2948857
Appl. Phys. Lett. 92, 241104 (2008) https://doi.org/10.1063/1.2939562
Appl. Phys. Lett. 92, 241105 (2008) https://doi.org/10.1063/1.2944263
Appl. Phys. Lett. 92, 241106 (2008) https://doi.org/10.1063/1.2937911
Appl. Phys. Lett. 92, 241107 (2008) https://doi.org/10.1063/1.2945276
Appl. Phys. Lett. 92, 241108 (2008) https://doi.org/10.1063/1.2938413
Appl. Phys. Lett. 92, 241109 (2008) https://doi.org/10.1063/1.2945664
Appl. Phys. Lett. 92, 241110 (2008) https://doi.org/10.1063/1.2947589
Appl. Phys. Lett. 92, 241111 (2008) https://doi.org/10.1063/1.2945274
Appl. Phys. Lett. 92, 241112 (2008) https://doi.org/10.1063/1.2945277
Appl. Phys. Lett. 92, 241113 (2008) https://doi.org/10.1063/1.2944136
Appl. Phys. Lett. 92, 241114 (2008) https://doi.org/10.1063/1.2948852
Appl. Phys. Lett. 92, 241115 (2008) https://doi.org/10.1063/1.2948860
Appl. Phys. Lett. 92, 241116 (2008) https://doi.org/10.1063/1.2949552
Appl. Phys. Lett. 92, 241117 (2008) https://doi.org/10.1063/1.2949683
Appl. Phys. Lett. 92, 241118 (2008) https://doi.org/10.1063/1.2945892
Appl. Phys. Lett. 92, 241119 (2008) https://doi.org/10.1063/1.2944265
Appl. Phys. Lett. 92, 241120 (2008) https://doi.org/10.1063/1.2945631

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 92, 241501 (2008) https://doi.org/10.1063/1.2940325
Appl. Phys. Lett. 92, 241502 (2008) https://doi.org/10.1063/1.2948874
Appl. Phys. Lett. 92, 241503 (2008) https://doi.org/10.1063/1.2945888
Appl. Phys. Lett. 92, 241504 (2008) https://doi.org/10.1063/1.2945795

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 92, 241901 (2008) https://doi.org/10.1063/1.2938031
Appl. Phys. Lett. 92, 241902 (2008) https://doi.org/10.1063/1.2945634
Appl. Phys. Lett. 92, 241903 (2008) https://doi.org/10.1063/1.2943150
Appl. Phys. Lett. 92, 241904 (2008) https://doi.org/10.1063/1.2946655
Appl. Phys. Lett. 92, 241905 (2008) https://doi.org/10.1063/1.2937445
Appl. Phys. Lett. 92, 241906 (2008) https://doi.org/10.1063/1.2939434
Appl. Phys. Lett. 92, 241907 (2008) https://doi.org/10.1063/1.2944140
Appl. Phys. Lett. 92, 241908 (2008) https://doi.org/10.1063/1.2945285
Appl. Phys. Lett. 92, 241909 (2008) https://doi.org/10.1063/1.2938724
Appl. Phys. Lett. 92, 241910 (2008) https://doi.org/10.1063/1.2943650
Appl. Phys. Lett. 92, 241911 (2008) https://doi.org/10.1063/1.2948854
Appl. Phys. Lett. 92, 241912 (2008) https://doi.org/10.1063/1.2948905
Appl. Phys. Lett. 92, 241913 (2008) https://doi.org/10.1063/1.2945891
Appl. Phys. Lett. 92, 241914 (2008) https://doi.org/10.1063/1.2946494
Appl. Phys. Lett. 92, 241915 (2008) https://doi.org/10.1063/1.2951610
Appl. Phys. Lett. 92, 241916 (2008) https://doi.org/10.1063/1.2948903
Appl. Phys. Lett. 92, 241917 (2008) https://doi.org/10.1063/1.2938690
Appl. Phys. Lett. 92, 241918 (2008) https://doi.org/10.1063/1.2945640
Appl. Phys. Lett. 92, 241919 (2008) https://doi.org/10.1063/1.2949739
Appl. Phys. Lett. 92, 241920 (2008) https://doi.org/10.1063/1.2943279
Appl. Phys. Lett. 92, 241921 (2008) https://doi.org/10.1063/1.2946661
Appl. Phys. Lett. 92, 241922 (2008) https://doi.org/10.1063/1.2947592
Appl. Phys. Lett. 92, 241923 (2008) https://doi.org/10.1063/1.2944254
Appl. Phys. Lett. 92, 241924 (2008) https://doi.org/10.1063/1.2949750
Appl. Phys. Lett. 92, 241925 (2008) https://doi.org/10.1063/1.2945880

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 92, 242101 (2008) https://doi.org/10.1063/1.2944892
Appl. Phys. Lett. 92, 242102 (2008) https://doi.org/10.1063/1.2948856
Appl. Phys. Lett. 92, 242103 (2008) https://doi.org/10.1063/1.2945232
Appl. Phys. Lett. 92, 242104 (2008) https://doi.org/10.1063/1.2939001
Appl. Phys. Lett. 92, 242105 (2008) https://doi.org/10.1063/1.2945286
Appl. Phys. Lett. 92, 242106 (2008) https://doi.org/10.1063/1.2946486
Appl. Phys. Lett. 92, 242107 (2008) https://doi.org/10.1063/1.2939006
Appl. Phys. Lett. 92, 242108 (2008) https://doi.org/10.1063/1.2943659
Appl. Phys. Lett. 92, 242109 (2008) https://doi.org/10.1063/1.2949072
Appl. Phys. Lett. 92, 242110 (2008) https://doi.org/10.1063/1.2949684
Appl. Phys. Lett. 92, 242111 (2008) https://doi.org/10.1063/1.2949086
Appl. Phys. Lett. 92, 242112 (2008) https://doi.org/10.1063/1.2945883

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 92, 242501 (2008) https://doi.org/10.1063/1.2946662
Appl. Phys. Lett. 92, 242502 (2008) https://doi.org/10.1063/1.2946654
Appl. Phys. Lett. 92, 242503 (2008) https://doi.org/10.1063/1.2937842
Appl. Phys. Lett. 92, 242504 (2008) https://doi.org/10.1063/1.2939220
Appl. Phys. Lett. 92, 242505 (2008) https://doi.org/10.1063/1.2948863
Appl. Phys. Lett. 92, 242506 (2008) https://doi.org/10.1063/1.2948904
Appl. Phys. Lett. 92, 242507 (2008) https://doi.org/10.1063/1.2949083
Appl. Phys. Lett. 92, 242508 (2008) https://doi.org/10.1063/1.2948900
Appl. Phys. Lett. 92, 242509 (2008) https://doi.org/10.1063/1.2949740
Appl. Phys. Lett. 92, 242510 (2008) https://doi.org/10.1063/1.2949077
Appl. Phys. Lett. 92, 242511 (2008) https://doi.org/10.1063/1.2945802

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 92, 242901 (2008) https://doi.org/10.1063/1.2944253
Appl. Phys. Lett. 92, 242902 (2008) https://doi.org/10.1063/1.2945884

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 92, 243101 (2008) https://doi.org/10.1063/1.2943414
Appl. Phys. Lett. 92, 243102 (2008) https://doi.org/10.1063/1.2947590
Appl. Phys. Lett. 92, 243103 (2008) https://doi.org/10.1063/1.2944813
Appl. Phys. Lett. 92, 243104 (2008) https://doi.org/10.1063/1.2944914
Appl. Phys. Lett. 92, 243105 (2008) https://doi.org/10.1063/1.2943653
Appl. Phys. Lett. 92, 243106 (2008) https://doi.org/10.1063/1.2946663
Appl. Phys. Lett. 92, 243107 (2008) https://doi.org/10.1063/1.2944143
Appl. Phys. Lett. 92, 243108 (2008) https://doi.org/10.1063/1.2944255
Appl. Phys. Lett. 92, 243109 (2008) https://doi.org/10.1063/1.2938028
Appl. Phys. Lett. 92, 243110 (2008) https://doi.org/10.1063/1.2945639
Appl. Phys. Lett. 92, 243111 (2008) https://doi.org/10.1063/1.2943282
Appl. Phys. Lett. 92, 243112 (2008) https://doi.org/10.1063/1.2939560
Appl. Phys. Lett. 92, 243113 (2008) https://doi.org/10.1063/1.2948898
Appl. Phys. Lett. 92, 243114 (2008) https://doi.org/10.1063/1.2948970
Appl. Phys. Lett. 92, 243115 (2008) https://doi.org/10.1063/1.2949075
Appl. Phys. Lett. 92, 243116 (2008) https://doi.org/10.1063/1.2945644
Appl. Phys. Lett. 92, 243117 (2008) https://doi.org/10.1063/1.2945885
Appl. Phys. Lett. 92, 243118 (2008) https://doi.org/10.1063/1.2938885
Appl. Phys. Lett. 92, 243119 (2008) https://doi.org/10.1063/1.2951594
Appl. Phys. Lett. 92, 243120 (2008) https://doi.org/10.1063/1.2947586
Appl. Phys. Lett. 92, 243121 (2008) https://doi.org/10.1063/1.2949074
Appl. Phys. Lett. 92, 243122 (2008) https://doi.org/10.1063/1.2942383
Appl. Phys. Lett. 92, 243123 (2008) https://doi.org/10.1063/1.2949071
Appl. Phys. Lett. 92, 243124 (2008) https://doi.org/10.1063/1.2949749
Appl. Phys. Lett. 92, 243125 (2008) https://doi.org/10.1063/1.2949753
Appl. Phys. Lett. 92, 243126 (2008) https://doi.org/10.1063/1.2949983

ORGANIC ELECTRONICS AND PHOTONICS

Appl. Phys. Lett. 92, 243301 (2008) https://doi.org/10.1063/1.2948853
Appl. Phys. Lett. 92, 243302 (2008) https://doi.org/10.1063/1.2944264
Appl. Phys. Lett. 92, 243303 (2008) https://doi.org/10.1063/1.2924364
Appl. Phys. Lett. 92, 243304 (2008) https://doi.org/10.1063/1.2938089
Appl. Phys. Lett. 92, 243305 (2008) https://doi.org/10.1063/1.2948862
Appl. Phys. Lett. 92, 243306 (2008) https://doi.org/10.1063/1.2945632
Appl. Phys. Lett. 92, 243307 (2008) https://doi.org/10.1063/1.2940232
Appl. Phys. Lett. 92, 243308 (2008) https://doi.org/10.1063/1.2937844
Appl. Phys. Lett. 92, 243309 (2008) https://doi.org/10.1063/1.2949321
Appl. Phys. Lett. 92, 243310 (2008) https://doi.org/10.1063/1.2949745
Appl. Phys. Lett. 92, 243311 (2008) https://doi.org/10.1063/1.2945801
Appl. Phys. Lett. 92, 243312 (2008) https://doi.org/10.1063/1.2949754

DEVICE PHYSICS

Appl. Phys. Lett. 92, 243501 (2008) https://doi.org/10.1063/1.2947588
Appl. Phys. Lett. 92, 243502 (2008) https://doi.org/10.1063/1.2946658
Appl. Phys. Lett. 92, 243503 (2008) https://doi.org/10.1063/1.2947591
Appl. Phys. Lett. 92, 243504 (2008) https://doi.org/10.1063/1.2936932
Appl. Phys. Lett. 92, 243505 (2008) https://doi.org/10.1063/1.2948855
Appl. Phys. Lett. 92, 243506 (2008) https://doi.org/10.1063/1.2949079
Appl. Phys. Lett. 92, 243507 (2008) https://doi.org/10.1063/1.2945284
Appl. Phys. Lett. 92, 243508 (2008) https://doi.org/10.1063/1.2949316
Appl. Phys. Lett. 92, 243509 (2008) https://doi.org/10.1063/1.2945797
Appl. Phys. Lett. 92, 243510 (2008) https://doi.org/10.1063/1.2949742

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 92, 244101 (2008) https://doi.org/10.1063/1.2946664
Appl. Phys. Lett. 92, 244102 (2008) https://doi.org/10.1063/1.2936297
Appl. Phys. Lett. 92, 244103 (2008) https://doi.org/10.1063/1.2939099
Appl. Phys. Lett. 92, 244104 (2008) https://doi.org/10.1063/1.2949553
Appl. Phys. Lett. 92, 244105 (2008) https://doi.org/10.1063/1.2945882
Appl. Phys. Lett. 92, 244106 (2008) https://doi.org/10.1063/1.2948861
Appl. Phys. Lett. 92, 244107 (2008) https://doi.org/10.1063/1.2945799
Appl. Phys. Lett. 92, 244108 (2008) https://doi.org/10.1063/1.2945803

ERRATA

Appl. Phys. Lett. 92, 249901 (2008) https://doi.org/10.1063/1.2953410
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