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LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 92, 221101 (2008) https://doi.org/10.1063/1.2939215
Appl. Phys. Lett. 92, 221102 (2008) https://doi.org/10.1063/1.2938053
Appl. Phys. Lett. 92, 221103 (2008) https://doi.org/10.1063/1.2936934
Appl. Phys. Lett. 92, 221104 (2008) https://doi.org/10.1063/1.2936961
Appl. Phys. Lett. 92, 221105 (2008) https://doi.org/10.1063/1.2939435
Appl. Phys. Lett. 92, 221106 (2008) https://doi.org/10.1063/1.2938055
Appl. Phys. Lett. 92, 221107 (2008) https://doi.org/10.1063/1.2938874
Appl. Phys. Lett. 92, 221108 (2008) https://doi.org/10.1063/1.2937209
Appl. Phys. Lett. 92, 221109 (2008) https://doi.org/10.1063/1.2939559
Appl. Phys. Lett. 92, 221110 (2008) https://doi.org/10.1063/1.2938062
Appl. Phys. Lett. 92, 221111 (2008) https://doi.org/10.1063/1.2940340
Appl. Phys. Lett. 92, 221112 (2008) https://doi.org/10.1063/1.2936865
Appl. Phys. Lett. 92, 221113 (2008) https://doi.org/10.1063/1.2940231
Appl. Phys. Lett. 92, 221114 (2008) https://doi.org/10.1063/1.2912503

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 92, 221501 (2008) https://doi.org/10.1063/1.2938054
Appl. Phys. Lett. 92, 221502 (2008) https://doi.org/10.1063/1.2938056
Appl. Phys. Lett. 92, 221503 (2008) https://doi.org/10.1063/1.2938414
Appl. Phys. Lett. 92, 221504 (2008) https://doi.org/10.1063/1.2938692
Appl. Phys. Lett. 92, 221505 (2008) https://doi.org/10.1063/1.2938717
Appl. Phys. Lett. 92, 221506 (2008) https://doi.org/10.1063/1.2938074
Appl. Phys. Lett. 92, 221507 (2008) https://doi.org/10.1063/1.2939437
Appl. Phys. Lett. 92, 221508 (2008) https://doi.org/10.1063/1.2938720

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 92, 221901 (2008) https://doi.org/10.1063/1.2939000
Appl. Phys. Lett. 92, 221902 (2008) https://doi.org/10.1063/1.2937405
Appl. Phys. Lett. 92, 221903 (2008) https://doi.org/10.1063/1.2937444
Appl. Phys. Lett. 92, 221904 (2008) https://doi.org/10.1063/1.2938718
Appl. Phys. Lett. 92, 221905 (2008) https://doi.org/10.1063/1.2939097
Appl. Phys. Lett. 92, 221906 (2008) https://doi.org/10.1063/1.2937097
Appl. Phys. Lett. 92, 221907 (2008) https://doi.org/10.1063/1.2938862
Appl. Phys. Lett. 92, 221908 (2008) https://doi.org/10.1063/1.2938880
Appl. Phys. Lett. 92, 221909 (2008) https://doi.org/10.1063/1.2938881
Appl. Phys. Lett. 92, 221910 (2008) https://doi.org/10.1063/1.2937835
Appl. Phys. Lett. 92, 221911 (2008) https://doi.org/10.1063/1.2939100
Appl. Phys. Lett. 92, 221912 (2008) https://doi.org/10.1063/1.2940595
Appl. Phys. Lett. 92, 221913 (2008) https://doi.org/10.1063/1.2938883

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 92, 222101 (2008) https://doi.org/10.1063/1.2939005
Appl. Phys. Lett. 92, 222102 (2008) https://doi.org/10.1063/1.2939096
Appl. Phys. Lett. 92, 222103 (2008) https://doi.org/10.1063/1.2937473
Appl. Phys. Lett. 92, 222104 (2008) https://doi.org/10.1063/1.2938693
Appl. Phys. Lett. 92, 222105 (2008) https://doi.org/10.1063/1.2937111
Appl. Phys. Lett. 92, 222106 (2008) https://doi.org/10.1063/1.2931087
Appl. Phys. Lett. 92, 222107 (2008) https://doi.org/10.1063/1.2937307
Appl. Phys. Lett. 92, 222108 (2008) https://doi.org/10.1063/1.2938995
Appl. Phys. Lett. 92, 222109 (2008) https://doi.org/10.1063/1.2940204
Appl. Phys. Lett. 92, 222110 (2008) https://doi.org/10.1063/1.2939438
Appl. Phys. Lett. 92, 222111 (2008) https://doi.org/10.1063/1.2939575
Appl. Phys. Lett. 92, 222112 (2008) https://doi.org/10.1063/1.2939586
Appl. Phys. Lett. 92, 222113 (2008) https://doi.org/10.1063/1.2938049
Appl. Phys. Lett. 92, 222114 (2008) https://doi.org/10.1063/1.2940596

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 92, 222501 (2008) https://doi.org/10.1063/1.2937913
Appl. Phys. Lett. 92, 222502 (2008) https://doi.org/10.1063/1.2937305
Appl. Phys. Lett. 92, 222503 (2008) https://doi.org/10.1063/1.2938695
Appl. Phys. Lett. 92, 222504 (2008) https://doi.org/10.1063/1.2940235
Appl. Phys. Lett. 92, 222505 (2008) https://doi.org/10.1063/1.2939439
Appl. Phys. Lett. 92, 222506 (2008) https://doi.org/10.1063/1.2939217
Appl. Phys. Lett. 92, 222507 (2008) https://doi.org/10.1063/1.2940599
Appl. Phys. Lett. 92, 222508 (2008) https://doi.org/10.1063/1.2936989

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 92, 222901 (2008) https://doi.org/10.1063/1.2939101
Appl. Phys. Lett. 92, 222902 (2008) https://doi.org/10.1063/1.2938064
Appl. Phys. Lett. 92, 222903 (2008) https://doi.org/10.1063/1.2939102
Appl. Phys. Lett. 92, 222904 (2008) https://doi.org/10.1063/1.2931031
Appl. Phys. Lett. 92, 222905 (2008) https://doi.org/10.1063/1.2938876
Appl. Phys. Lett. 92, 222906 (2008) https://doi.org/10.1063/1.2939556
Appl. Phys. Lett. 92, 222907 (2008) https://doi.org/10.1063/1.2938697
Appl. Phys. Lett. 92, 222908 (2008) https://doi.org/10.1063/1.2938721
Appl. Phys. Lett. 92, 222909 (2008) https://doi.org/10.1063/1.2938364
Appl. Phys. Lett. 92, 222910 (2008) https://doi.org/10.1063/1.2940601
Appl. Phys. Lett. 92, 222911 (2008) https://doi.org/10.1063/1.2942387

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 92, 223101 (2008) https://doi.org/10.1063/1.2937839
Appl. Phys. Lett. 92, 223102 (2008) https://doi.org/10.1063/1.2938701
Appl. Phys. Lett. 92, 223103 (2008) https://doi.org/10.1063/1.2939216
Appl. Phys. Lett. 92, 223104 (2008) https://doi.org/10.1063/1.2928219
Appl. Phys. Lett. 92, 223105 (2008) https://doi.org/10.1063/1.2936847
Appl. Phys. Lett. 92, 223106 (2008) https://doi.org/10.1063/1.2938058
Appl. Phys. Lett. 92, 223107 (2008) https://doi.org/10.1063/1.2937143
Appl. Phys. Lett. 92, 223108 (2008) https://doi.org/10.1063/1.2939436
Appl. Phys. Lett. 92, 223109 (2008) https://doi.org/10.1063/1.2939563
Appl. Phys. Lett. 92, 223110 (2008) https://doi.org/10.1063/1.2939219
Appl. Phys. Lett. 92, 223111 (2008) https://doi.org/10.1063/1.2939585
Appl. Phys. Lett. 92, 223112 (2008) https://doi.org/10.1063/1.2940230
Appl. Phys. Lett. 92, 223113 (2008) https://doi.org/10.1063/1.2940304
Appl. Phys. Lett. 92, 223114 (2008) https://doi.org/10.1063/1.2940590
Appl. Phys. Lett. 92, 223115 (2008) https://doi.org/10.1063/1.2938416
Appl. Phys. Lett. 92, 223116 (2008) https://doi.org/10.1063/1.2938694
Appl. Phys. Lett. 92, 223117 (2008) https://doi.org/10.1063/1.2938702
Appl. Phys. Lett. 92, 223118 (2008) https://doi.org/10.1063/1.2938861
Appl. Phys. Lett. 92, 223119 (2008) https://doi.org/10.1063/1.2937128

ORGANIC ELECTRONICS AND PHOTONICS

Appl. Phys. Lett. 92, 223301 (2008) https://doi.org/10.1063/1.2937403
Appl. Phys. Lett. 92, 223302 (2008) https://doi.org/10.1063/1.2937845
Appl. Phys. Lett. 92, 223303 (2008) https://doi.org/10.1063/1.2938865
Appl. Phys. Lett. 92, 223304 (2008) https://doi.org/10.1063/1.2918981
Appl. Phys. Lett. 92, 223305 (2008) https://doi.org/10.1063/1.2938878
Appl. Phys. Lett. 92, 223306 (2008) https://doi.org/10.1063/1.2939221
Appl. Phys. Lett. 92, 223307 (2008) https://doi.org/10.1063/1.2939554
Appl. Phys. Lett. 92, 223308 (2008) https://doi.org/10.1063/1.2938059
Appl. Phys. Lett. 92, 223309 (2008) https://doi.org/10.1063/1.2940220
Appl. Phys. Lett. 92, 223310 (2008) https://doi.org/10.1063/1.2929716
Appl. Phys. Lett. 92, 223311 (2008) https://doi.org/10.1063/1.2938269

DEVICE PHYSICS

Appl. Phys. Lett. 92, 223501 (2008) https://doi.org/10.1063/1.2937404
Appl. Phys. Lett. 92, 223502 (2008) https://doi.org/10.1063/1.2937837
Appl. Phys. Lett. 92, 223503 (2008) https://doi.org/10.1063/1.2937136
Appl. Phys. Lett. 92, 223504 (2008) https://doi.org/10.1063/1.2926423
Appl. Phys. Lett. 92, 223505 (2008) https://doi.org/10.1063/1.2938875
Appl. Phys. Lett. 92, 223506 (2008) https://doi.org/10.1063/1.2938888
Appl. Phys. Lett. 92, 223507 (2008) https://doi.org/10.1063/1.2939218
Appl. Phys. Lett. 92, 223508 (2008) https://doi.org/10.1063/1.2939555
Appl. Phys. Lett. 92, 223509 (2008) https://doi.org/10.1063/1.2938722
Appl. Phys. Lett. 92, 223510 (2008) https://doi.org/10.1063/1.2942377

APPLIED BIOPHYSICS

Appl. Phys. Lett. 92, 223901 (2008) https://doi.org/10.1063/1.2937402
Appl. Phys. Lett. 92, 223902 (2008) https://doi.org/10.1063/1.2938887

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 92, 224101 (2008) https://doi.org/10.1063/1.2938075
Appl. Phys. Lett. 92, 224102 (2008) https://doi.org/10.1063/1.2920164
Appl. Phys. Lett. 92, 224103 (2008) https://doi.org/10.1063/1.2938110
Appl. Phys. Lett. 92, 224104 (2008) https://doi.org/10.1063/1.2940339
Appl. Phys. Lett. 92, 224105 (2008) https://doi.org/10.1063/1.2942380

ERRATA

Appl. Phys. Lett. 92, 229901 (2008) https://doi.org/10.1063/1.2943190
Appl. Phys. Lett. 92, 229902 (2008) https://doi.org/10.1063/1.2938419
Appl. Phys. Lett. 92, 229903 (2008) https://doi.org/10.1063/1.2938420
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