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Issues
21 March 2005
ISSN 0003-6951
EISSN 1077-3118
In this Issue
LASERS, OPTICS, AND OPTOELECTRONICS
White polymeric light-emitting diode based on a fluorene polymer∕Ir complex blend system
Appl. Phys. Lett. 86, 121101 (2005)
https://doi.org/10.1063/1.1873046
Ultrafast all-optical switching in two-dimensional organic photonic crystal
Appl. Phys. Lett. 86, 121102 (2005)
https://doi.org/10.1063/1.1884254
Simple scheme for rapid three-dimensional orientation determination of the emission dipole of single molecules
Appl. Phys. Lett. 86, 121104 (2005)
https://doi.org/10.1063/1.1888040
Photonic band structure of colloidal crystal self-assembled in hollow core optical fiber
Appl. Phys. Lett. 86, 121106 (2005)
https://doi.org/10.1063/1.1887814
Extraordinarily high-contrast and wide-view liquid-crystal displays
Appl. Phys. Lett. 86, 121107 (2005)
https://doi.org/10.1063/1.1887815
Quasi-periodic planar metamaterial substrates
Appl. Phys. Lett. 86, 121108 (2005)
https://doi.org/10.1063/1.1887822
Waveguide structures in heavy metal oxide glass written with femtosecond laser pulses above the critical self-focusing threshold
J. Siegel; J. M. Fernández-Navarro; A. García-Navarro; V. Diez-Blanco; O. Sanz; J. Solis; F. Vega; J Armengol
Appl. Phys. Lett. 86, 121109 (2005)
https://doi.org/10.1063/1.1888032
Propagation losses of silicon nitride waveguides in the near-infrared range
Appl. Phys. Lett. 86, 121111 (2005)
https://doi.org/10.1063/1.1889242
Optical nonlinearity in glass: Kramers–Kronig analyses
Appl. Phys. Lett. 86, 121112 (2005)
https://doi.org/10.1063/1.1891269
High-intensity terahertz radiation from a microstructured large-area photoconductor
Appl. Phys. Lett. 86, 121114 (2005)
https://doi.org/10.1063/1.1891304
High resistance narrow band quantum cascade photodetectors
Appl. Phys. Lett. 86, 121116 (2005)
https://doi.org/10.1063/1.1884257
STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER
Local environment of dopant in by near-edge x-ray absorption fine structure analysis
Appl. Phys. Lett. 86, 121902 (2005)
https://doi.org/10.1063/1.1885175
Solid-state dewetting for ordered arrays of crystallographically oriented metal particles
Appl. Phys. Lett. 86, 121903 (2005)
https://doi.org/10.1063/1.1885180
Fluorine segregation and incorporation during solid-phase epitaxy of Si
S. Mirabella; G. Impellizzeri; E. Bruno; L. Romano; M. G. Grimaldi; F. Priolo; E. Napolitani; A. Carnera
Appl. Phys. Lett. 86, 121905 (2005)
https://doi.org/10.1063/1.1886907
Refractive indices of on -plane sapphire
Appl. Phys. Lett. 86, 121906 (2005)
https://doi.org/10.1063/1.1865325
Oxidation kinetics of ion-amorphized (0001) 6H–SiC: Competition between oxidation and recrystallization processes
Appl. Phys. Lett. 86, 121907 (2005)
https://doi.org/10.1063/1.1887820
Identification of vacancies in the ordered intermetallic compound
Appl. Phys. Lett. 86, 121908 (2005)
https://doi.org/10.1063/1.1885176
Thermal decomposition of sputtered thin layers used in super-resolution optical disks
Appl. Phys. Lett. 86, 121909 (2005)
https://doi.org/10.1063/1.1886255
Self-recovery of stressed nanomembranes
Appl. Phys. Lett. 86, 121912 (2005)
https://doi.org/10.1063/1.1889239
Electrodeposition of bismuth thin films on (110)
Appl. Phys. Lett. 86, 121916 (2005)
https://doi.org/10.1063/1.1886248
Mechanically induced excess enthalpy in inorganic glasses
Appl. Phys. Lett. 86, 121917 (2005)
https://doi.org/10.1063/1.1895483
Temperature dependence of photoluminescence and photoreflectance spectra of dilute GaAsN alloys
Appl. Phys. Lett. 86, 121918 (2005)
https://doi.org/10.1063/1.1891293
ELECTRONIC TRANSPORT AND SEMICONDUCTORS
On the band structure lineup at interfaces of , , and high- dielectrics
Appl. Phys. Lett. 86, 122101 (2005)
https://doi.org/10.1063/1.1866641
Current transport property of heterojunction: Influence of interface states
Appl. Phys. Lett. 86, 122102 (2005)
https://doi.org/10.1063/1.1886906
Spin current injection by intersubband transitions in quantum wells
Appl. Phys. Lett. 86, 122103 (2005)
https://doi.org/10.1063/1.1882747
Midgap levels in both - and -type 4H–SiC epilayers investigated by deep level transient spectroscopy
Appl. Phys. Lett. 86, 122104 (2005)
https://doi.org/10.1063/1.1886904
Comparison of the electronic properties of sublimation- and vapor-Bridgman-grown crystals of tetracene
Appl. Phys. Lett. 86, 122105 (2005)
https://doi.org/10.1063/1.1884751
Electronic mean free path in as-produced and purified single-wall carbon nanotubes
Appl. Phys. Lett. 86, 122106 (2005)
https://doi.org/10.1063/1.1885189
Hydrogen passivation effect in nitrogen-doped ZnO thin films
Xiaonan Li; Brian Keyes; Sally Asher; S. B. Zhang; Su-Huai Wei; Timothy J. Coutts; Sukit Limpijumnong; Chris G. Van de Walle
Appl. Phys. Lett. 86, 122107 (2005)
https://doi.org/10.1063/1.1886256
Molecular-weight-dependent mobilities in regioregular poly(3-hexyl-thiophene) diodes
Appl. Phys. Lett. 86, 122110 (2005)
https://doi.org/10.1063/1.1891301
Electrical characterization of strained wafers using transient capacitance measurements
Appl. Phys. Lett. 86, 122111 (2005)
https://doi.org/10.1063/1.1891303
Potential mapping of pentacene thin-film transistors using purely electric atomic-force-microscope potentiometry
Appl. Phys. Lett. 86, 122112 (2005)
https://doi.org/10.1063/1.1891306
MAGNETISM AND SUPERCONDUCTIVITY
Magnetoelectric composite thin films derived by a sol-gel process
Appl. Phys. Lett. 86, 122501 (2005)
https://doi.org/10.1063/1.1889237
Universal behavior of giant electroresistance in epitaxial thin films
Y. G. Zhao; Y. H. Wang; G. M. Zhang; B. Zhang; X. P. Zhang; C. X. Yang; P. L. Lang; M. H. Zhu; P. C. Guan
Appl. Phys. Lett. 86, 122502 (2005)
https://doi.org/10.1063/1.1889241
Self-planarizing process for the fabrication of stacks
Appl. Phys. Lett. 86, 122503 (2005)
https://doi.org/10.1063/1.1875764
Influence of exchange bias coupling on the single-crystalline FeMn ultrathin film
Appl. Phys. Lett. 86, 122504 (2005)
https://doi.org/10.1063/1.1883318
Spin-polarized quasiparticles injection in heterostructure devices
Appl. Phys. Lett. 86, 122505 (2005)
https://doi.org/10.1063/1.1886258
Effect of Zr on the crystallographic texture of precipitation-hardened ribbons
Appl. Phys. Lett. 86, 122506 (2005)
https://doi.org/10.1063/1.1888038
Microstructure and exchange coupling in nanocrystalline particles produced by spark erosion
Appl. Phys. Lett. 86, 122507 (2005)
https://doi.org/10.1063/1.1890474
Formation of nanosized precipitates and their contribution to flux pinning in Ir-doped quasi-multilayers
Appl. Phys. Lett. 86, 122508 (2005)
https://doi.org/10.1063/1.1894599
exchange spring multilayer films with high energy product
Appl. Phys. Lett. 86, 122509 (2005)
https://doi.org/10.1063/1.1889238
Photoinduced phase transition in an iron(II) spin-crossover complex with a macrocyclic ligand
Appl. Phys. Lett. 86, 122511 (2005)
https://doi.org/10.1063/1.1890478
DIELECTRICS AND FERROELECTRICITY
Potential imaging of /polycrystalline silicon gate stacks: Evidence for an oxide dipole
Appl. Phys. Lett. 86, 122901 (2005)
https://doi.org/10.1063/1.1890483
Improved microwave dielectric properties of ceramics
Appl. Phys. Lett. 86, 122902 (2005)
https://doi.org/10.1063/1.1883333
Dielectric measurement of ferroelectric single crystal fiber using cavity perturbation method
Appl. Phys. Lett. 86, 122903 (2005)
https://doi.org/10.1063/1.1891294
NANOSCALE SCIENCE AND DESIGN
Effective tip radius in electrostatic force microscopy
Appl. Phys. Lett. 86, 123101 (2005)
https://doi.org/10.1063/1.1884764
Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode
Appl. Phys. Lett. 86, 123103 (2005)
https://doi.org/10.1063/1.1886262
Multiwalled carbon nanotube/ nanocomposites: Electrical and rectification properties
Appl. Phys. Lett. 86, 123104 (2005)
https://doi.org/10.1063/1.1884763
Electrochemical approach for fabricating nanogap electrodes with well controllable separation
Appl. Phys. Lett. 86, 123105 (2005)
https://doi.org/10.1063/1.1871361
Effects of chemical modifications on the thermal conductivity of carbon nanotube composites
Appl. Phys. Lett. 86, 123106 (2005)
https://doi.org/10.1063/1.1887839
F-doping effects on electrical and optical properties of ZnO nanocrystalline films
Appl. Phys. Lett. 86, 123107 (2005)
https://doi.org/10.1063/1.1884256
Self-aligned carbon nanotube transistors with charge transfer doping
Appl. Phys. Lett. 86, 123108 (2005)
https://doi.org/10.1063/1.1888054
Highly thermally stable TiN nanocrystals as charge trapping sites for nonvolatile memory device applications
Appl. Phys. Lett. 86, 123110 (2005)
https://doi.org/10.1063/1.1890481
Field emission of carbon nanotubes on anodic aluminum oxide template with controlled tube density
Appl. Phys. Lett. 86, 123111 (2005)
https://doi.org/10.1063/1.1886260
Superconductivity near 35 K in aligned amorphous magnesium-doped nanowires
Appl. Phys. Lett. 86, 123113 (2005)
https://doi.org/10.1063/1.1895477
Critical height and growth mode in epitaxial copper nanowire arrays fabricated using glancing angle deposition
Appl. Phys. Lett. 86, 123114 (2005)
https://doi.org/10.1063/1.1891287
Carbon nanotubes synthesized by biased thermal chemical vapor deposition as an electron source in an x-ray tube
Appl. Phys. Lett. 86, 123115 (2005)
https://doi.org/10.1063/1.1891299
Photoluminescence intermittency in an individual single-walled carbon nanotube at room temperature
Appl. Phys. Lett. 86, 123116 (2005)
https://doi.org/10.1063/1.1894609
Adsorption and desorption of oxygen probed from ZnO nanowire films by photocurrent measurements
Appl. Phys. Lett. 86, 123117 (2005)
https://doi.org/10.1063/1.1883711
Room-temperature operation of an exclusive-OR circuit using a highly doped Si single-electron transistor
Appl. Phys. Lett. 86, 123118 (2005)
https://doi.org/10.1063/1.1894594
Surface-tension-driven nanoelectromechanical relaxation oscillator
Appl. Phys. Lett. 86, 123119 (2005)
https://doi.org/10.1063/1.1887827
DEVICE PHYSICS
Temperature effect on carrier transport characteristics in /Si heterojunction
Haizhong Guo; Yanhong Huang; Kuijuan Jin; Qingli Zhou; Huibin Lu; Lifeng Liu; Yueliang Zhou; Bolin Cheng; Zhenghao Chen
Appl. Phys. Lett. 86, 123502 (2005)
https://doi.org/10.1063/1.1888039
Solid-state electrochromic devices based on poly (phenylene vinylene) polymers
Appl. Phys. Lett. 86, 123504 (2005)
https://doi.org/10.1063/1.1883321
Transparent thin-film transistors with pentacene channel, gate, and electrodes
Appl. Phys. Lett. 86, 123505 (2005)
https://doi.org/10.1063/1.1886901
Effects of nitrogen-incorporated interface layer on the transient characteristics of hafnium oxide -metal–oxide–semiconductor field-effect transistors
Chang Yong Kang; Se Jong Rhee; Chang Hwan Choi; Chang Seok Kang; Rino Choi; Mohammad S. Akbar; Manhong Zhang; Siddarth A. Krishnan; Jack C. Lee
Appl. Phys. Lett. 86, 123506 (2005)
https://doi.org/10.1063/1.1890479
Stable efficient nanocrystalline dye-sensitized solar cell based on an electrolyte of low volatility
Appl. Phys. Lett. 86, 123508 (2005)
https://doi.org/10.1063/1.1887825
Light intensity dependence of open-circuit voltage of polymer:fullerene solar cells
Appl. Phys. Lett. 86, 123509 (2005)
https://doi.org/10.1063/1.1889240
Emission behavior of nm-thick film-based planar cold cathodes for electronic cooling
Appl. Phys. Lett. 86, 123511 (2005)
https://doi.org/10.1063/1.1894593
Fabrication and characterization of vertical-type, self-aligned asymmetric double-gate metal-oxide-semiconductor field-effect-transistors
Meishoku Masahara; Yongxun Liu; Kenichi Ishii; Kunihiro Sakamoto; Takashi Matsukawa; Hisao Tanoue; Seigo Kanemaru; Eiichi Suzuki
Appl. Phys. Lett. 86, 123512 (2005)
https://doi.org/10.1063/1.1891289
Semiconductive metal oxide ferroelectric memory transistor: A long-retention nonvolatile memory transistor
Appl. Phys. Lett. 86, 123513 (2005)
https://doi.org/10.1063/1.1886252
APPLIED BIOPHYSICS
Probing local water contents of in vitro protein films by ultrasonic force microscopy
Appl. Phys. Lett. 86, 123901 (2005)
https://doi.org/10.1063/1.1891283
INTERDISCIPLINARY AND GENERAL PHYSICS
Fabrication of microvessels and microlenses from polymers by solvent droplets
Appl. Phys. Lett. 86, 124101 (2005)
https://doi.org/10.1063/1.1886263
Observation of negative refraction and negative phase velocity in left-handed metamaterials
Appl. Phys. Lett. 86, 124102 (2005)
https://doi.org/10.1063/1.1888051
Computed tomographic reconstruction based on x-ray refraction contrast
Appl. Phys. Lett. 86, 124105 (2005)
https://doi.org/10.1063/1.1891305
COMMENTS
Comment on “Submicron imaging with a planar silver lens” [Appl. Phys. Lett. 84, 4403 (2004)]
Appl. Phys. Lett. 86, 126101 (2005)
https://doi.org/10.1063/1.1881780
Response to “Comment on ‘Submicron imaging with a planar silver lens’ ” [Appl. Phys. Lett. 86, 126101 (2005)]
Appl. Phys. Lett. 86, 126102 (2005)
https://doi.org/10.1063/1.1881781
ERRATA
Erratum: “Percolation model for electrical breakdown in insulating polymers” [Appl. Phys. Lett. 85, 4454 (2004)]
Appl. Phys. Lett. 86, 129902 (2005)
https://doi.org/10.1063/1.1882743
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.
Superconducting flip-chip devices using indium microspheres on Au-passivated Nb or NbN as under-bump metallization layer
Achintya Paradkar, Paul Nicaise, et al.
Special issue APL organic and hybrid photodetectors
Karl Leo, Canek Fuentes-Hernandez, et al.