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LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 86, 011101 (2005) https://doi.org/10.1063/1.1842855
Appl. Phys. Lett. 86, 011102 (2005) https://doi.org/10.1063/1.1842860
Appl. Phys. Lett. 86, 011103 (2005) https://doi.org/10.1063/1.1842862
Appl. Phys. Lett. 86, 011104 (2005) https://doi.org/10.1063/1.1842854
Appl. Phys. Lett. 86, 011105 (2005) https://doi.org/10.1063/1.1842853
Appl. Phys. Lett. 86, 011106 (2005) https://doi.org/10.1063/1.1843275
Appl. Phys. Lett. 86, 011107 (2005) https://doi.org/10.1063/1.1844038
Appl. Phys. Lett. 86, 011108 (2005) https://doi.org/10.1063/1.1844039
Appl. Phys. Lett. 86, 011109 (2005) https://doi.org/10.1063/1.1844042
Appl. Phys. Lett. 86, 011110 (2005) https://doi.org/10.1063/1.1844608
Appl. Phys. Lett. 86, 011111 (2005) https://doi.org/10.1063/1.1844600
Appl. Phys. Lett. 86, 011112 (2005) https://doi.org/10.1063/1.1845593
Appl. Phys. Lett. 86, 011113 (2005) https://doi.org/10.1063/1.1845589
Appl. Phys. Lett. 86, 011114 (2005) https://doi.org/10.1063/1.1846143
Appl. Phys. Lett. 86, 011115 (2005) https://doi.org/10.1063/1.1846145
Appl. Phys. Lett. 86, 011116 (2005) https://doi.org/10.1063/1.1846148
Appl. Phys. Lett. 86, 011117 (2005) https://doi.org/10.1063/1.1846936
Appl. Phys. Lett. 86, 011118 (2005) https://doi.org/10.1063/1.1847716

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 86, 011501 (2005) https://doi.org/10.1063/1.1847715
Appl. Phys. Lett. 86, 011502 (2005) https://doi.org/10.1063/1.1846155

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 86, 011901 (2005) https://doi.org/10.1063/1.1844031
Appl. Phys. Lett. 86, 011902 (2005) https://doi.org/10.1063/1.1844045
Appl. Phys. Lett. 86, 011903 (2005) https://doi.org/10.1063/1.1844609
Appl. Phys. Lett. 86, 011904 (2005) https://doi.org/10.1063/1.1845595
Appl. Phys. Lett. 86, 011905 (2005) https://doi.org/10.1063/1.1845596
Appl. Phys. Lett. 86, 011906 (2005) https://doi.org/10.1063/1.1842863
Appl. Phys. Lett. 86, 011907 (2005) https://doi.org/10.1063/1.1844591
Appl. Phys. Lett. 86, 011908 (2005) https://doi.org/10.1063/1.1844601
Appl. Phys. Lett. 86, 011909 (2005) https://doi.org/10.1063/1.1846937
Appl. Phys. Lett. 86, 011910 (2005) https://doi.org/10.1063/1.1843280
Appl. Phys. Lett. 86, 011911 (2005) https://doi.org/10.1063/1.1843284
Appl. Phys. Lett. 86, 011912 (2005) https://doi.org/10.1063/1.1844035
Appl. Phys. Lett. 86, 011913 (2005) https://doi.org/10.1063/1.1844046
Appl. Phys. Lett. 86, 011914 (2005) https://doi.org/10.1063/1.1844593
Appl. Phys. Lett. 86, 011915 (2005) https://doi.org/10.1063/1.1844595
Appl. Phys. Lett. 86, 011916 (2005) https://doi.org/10.1063/1.1844598
Appl. Phys. Lett. 86, 011917 (2005) https://doi.org/10.1063/1.1845599
Appl. Phys. Lett. 86, 011918 (2005) https://doi.org/10.1063/1.1845590
Appl. Phys. Lett. 86, 011919 (2005) https://doi.org/10.1063/1.1845571
Appl. Phys. Lett. 86, 011920 (2005) https://doi.org/10.1063/1.1846151
Appl. Phys. Lett. 86, 011921 (2005) https://doi.org/10.1063/1.1846951
Appl. Phys. Lett. 86, 011922 (2005) https://doi.org/10.1063/1.1847692
Appl. Phys. Lett. 86, 011923 (2005) https://doi.org/10.1063/1.1849832
Appl. Phys. Lett. 86, 011924 (2005) https://doi.org/10.1063/1.1841477

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 86, 012101 (2005) https://doi.org/10.1063/1.1842865
Appl. Phys. Lett. 86, 012102 (2005) https://doi.org/10.1063/1.1844040
Appl. Phys. Lett. 86, 012103 (2005) https://doi.org/10.1063/1.1842861
Appl. Phys. Lett. 86, 012104 (2005) https://doi.org/10.1063/1.1846149
Appl. Phys. Lett. 86, 012105 (2005) https://doi.org/10.1063/1.1844037
Appl. Phys. Lett. 86, 012106 (2005) https://doi.org/10.1063/1.1844610
Appl. Phys. Lett. 86, 012107 (2005) https://doi.org/10.1063/1.1845598
Appl. Phys. Lett. 86, 012108 (2005) https://doi.org/10.1063/1.1843287
Appl. Phys. Lett. 86, 012109 (2005) https://doi.org/10.1063/1.1844034
Appl. Phys. Lett. 86, 012110 (2005) https://doi.org/10.1063/1.1848179

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 86, 012501 (2005) https://doi.org/10.1063/1.1842857
Appl. Phys. Lett. 86, 012502 (2005) https://doi.org/10.1063/1.1842859
Appl. Phys. Lett. 86, 012503 (2005) https://doi.org/10.1063/1.1842852
Appl. Phys. Lett. 86, 012504 (2005) https://doi.org/10.1063/1.1843276
Appl. Phys. Lett. 86, 012505 (2005) https://doi.org/10.1063/1.1843290
Appl. Phys. Lett. 86, 012506 (2005) https://doi.org/10.1063/1.1842851
Appl. Phys. Lett. 86, 012507 (2005) https://doi.org/10.1063/1.1844597
Appl. Phys. Lett. 86, 012508 (2005) https://doi.org/10.1063/1.1845591
Appl. Phys. Lett. 86, 012509 (2005) https://doi.org/10.1063/1.1846144
Appl. Phys. Lett. 86, 012510 (2005) https://doi.org/10.1063/1.1846157
Appl. Phys. Lett. 86, 012511 (2005) https://doi.org/10.1063/1.1847714

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 86, 012901 (2005) https://doi.org/10.1063/1.1845588
Appl. Phys. Lett. 86, 012902 (2005) https://doi.org/10.1063/1.1845573
Appl. Phys. Lett. 86, 012903 (2005) https://doi.org/10.1063/1.1843288
Appl. Phys. Lett. 86, 012904 (2005) https://doi.org/10.1063/1.1844611
Appl. Phys. Lett. 86, 012905 (2005) https://doi.org/10.1063/1.1844043
Appl. Phys. Lett. 86, 012906 (2005) https://doi.org/10.1063/1.1845594
Appl. Phys. Lett. 86, 012907 (2005) https://doi.org/10.1063/1.1847693
Appl. Phys. Lett. 86, 012908 (2005) https://doi.org/10.1063/1.1847710
Appl. Phys. Lett. 86, 012909 (2005) https://doi.org/10.1063/1.1847711
Appl. Phys. Lett. 86, 012910 (2005) https://doi.org/10.1063/1.1847712

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 86, 013101 (2005) https://doi.org/10.1063/1.1843278
Appl. Phys. Lett. 86, 013102 (2005) https://doi.org/10.1063/1.1842864
Appl. Phys. Lett. 86, 013103 (2005) https://doi.org/10.1063/1.1844041
Appl. Phys. Lett. 86, 013104 (2005) https://doi.org/10.1063/1.1846146
Appl. Phys. Lett. 86, 013105 (2005) https://doi.org/10.1063/1.1843281
Appl. Phys. Lett. 86, 013106 (2005) https://doi.org/10.1063/1.1843289
Appl. Phys. Lett. 86, 013107 (2005) https://doi.org/10.1063/1.1846952
Appl. Phys. Lett. 86, 013108 (2005) https://doi.org/10.1063/1.1846953
Appl. Phys. Lett. 86, 013109 (2005) https://doi.org/10.1063/1.1844602
Appl. Phys. Lett. 86, 013110 (2005) https://doi.org/10.1063/1.1846154
Appl. Phys. Lett. 86, 013111 (2005) https://doi.org/10.1063/1.1847713

DEVICE PHYSICS

Appl. Phys. Lett. 86, 013501 (2005) https://doi.org/10.1063/1.1846147
Appl. Phys. Lett. 86, 013502 (2005) https://doi.org/10.1063/1.1842858
Appl. Phys. Lett. 86, 013503 (2005) https://doi.org/10.1063/1.1843286
Appl. Phys. Lett. 86, 013504 (2005) https://doi.org/10.1063/1.1844032
Appl. Phys. Lett. 86, 013505 (2005) https://doi.org/10.1063/1.1844592
Appl. Phys. Lett. 86, 013506 (2005) https://doi.org/10.1063/1.1844594
Appl. Phys. Lett. 86, 013507 (2005) https://doi.org/10.1063/1.1846950
Appl. Phys. Lett. 86, 013508 (2005) https://doi.org/10.1063/1.1848185

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 86, 014101 (2005) https://doi.org/10.1063/1.1843277
Appl. Phys. Lett. 86, 014102 (2005) https://doi.org/10.1063/1.1843282
Appl. Phys. Lett. 86, 014103 (2005) https://doi.org/10.1063/1.1840117
Appl. Phys. Lett. 86, 014104 (2005) https://doi.org/10.1063/1.1844596
Appl. Phys. Lett. 86, 014105 (2005) https://doi.org/10.1063/1.1845597
Appl. Phys. Lett. 86, 014106 (2005) https://doi.org/10.1063/1.1845572
Appl. Phys. Lett. 86, 014107 (2005) https://doi.org/10.1063/1.1846156

COMMENTS

Appl. Phys. Lett. 86, 016101 (2005) https://doi.org/10.1063/1.1844603
Appl. Phys. Lett. 86, 016102 (2005) https://doi.org/10.1063/1.1844604
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