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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 513–515 (2004) https://doi.org/10.1063/1.1771799
Appl. Phys. Lett. 85, 516–518 (2004) https://doi.org/10.1063/1.1775878
Appl. Phys. Lett. 85, 519–521 (2004) https://doi.org/10.1063/1.1771814
Appl. Phys. Lett. 85, 522–524 (2004) https://doi.org/10.1063/1.1776336
Appl. Phys. Lett. 85, 525–527 (2004) https://doi.org/10.1063/1.1774248
Appl. Phys. Lett. 85, 528–530 (2004) https://doi.org/10.1063/1.1774249
Appl. Phys. Lett. 85, 531–533 (2004) https://doi.org/10.1063/1.1772864
Appl. Phys. Lett. 85, 534–536 (2004) https://doi.org/10.1063/1.1771451
Appl. Phys. Lett. 85, 537–539 (2004) https://doi.org/10.1063/1.1775287
Appl. Phys. Lett. 85, 540–542 (2004) https://doi.org/10.1063/1.1775290
Appl. Phys. Lett. 85, 543–545 (2004) https://doi.org/10.1063/1.1775291
Appl. Phys. Lett. 85, 546–548 (2004) https://doi.org/10.1063/1.1775293

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 85, 549–551 (2004) https://doi.org/10.1063/1.1775885

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 552–554 (2004) https://doi.org/10.1063/1.1775883
Appl. Phys. Lett. 85, 555–557 (2004) https://doi.org/10.1063/1.1775887
Appl. Phys. Lett. 85, 558–560 (2004) https://doi.org/10.1063/1.1775888
Appl. Phys. Lett. 85, 561–563 (2004) https://doi.org/10.1063/1.1776329
Appl. Phys. Lett. 85, 564–566 (2004) https://doi.org/10.1063/1.1776332
Appl. Phys. Lett. 85, 567–569 (2004) https://doi.org/10.1063/1.1773914
Appl. Phys. Lett. 85, 570–572 (2004) https://doi.org/10.1063/1.1776334
Appl. Phys. Lett. 85, 573–575 (2004) https://doi.org/10.1063/1.1774268
Appl. Phys. Lett. 85, 576–578 (2004) https://doi.org/10.1063/1.1776616
Appl. Phys. Lett. 85, 579–581 (2004) https://doi.org/10.1063/1.1775035
Appl. Phys. Lett. 85, 582–584 (2004) https://doi.org/10.1063/1.1769594
Appl. Phys. Lett. 85, 585–587 (2004) https://doi.org/10.1063/1.1775284
Appl. Phys. Lett. 85, 588–590 (2004) https://doi.org/10.1063/1.1775286
Appl. Phys. Lett. 85, 591–593 (2004) https://doi.org/10.1063/1.1777391
Appl. Phys. Lett. 85, 594–596 (2004) https://doi.org/10.1063/1.1773368

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 597–599 (2004) https://doi.org/10.1063/1.1771805
Appl. Phys. Lett. 85, 600–602 (2004) https://doi.org/10.1063/1.1773913
Appl. Phys. Lett. 85, 603–605 (2004) https://doi.org/10.1063/1.1774274
Appl. Phys. Lett. 85, 606–608 (2004) https://doi.org/10.1063/1.1776613
Appl. Phys. Lett. 85, 609–611 (2004) https://doi.org/10.1063/1.1776622
Appl. Phys. Lett. 85, 612–614 (2004) https://doi.org/10.1063/1.1775283

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 615–617 (2004) https://doi.org/10.1063/1.1773619
Appl. Phys. Lett. 85, 618–620 (2004) https://doi.org/10.1063/1.1775882
Appl. Phys. Lett. 85, 621–623 (2004) https://doi.org/10.1063/1.1775877

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 624–626 (2004) https://doi.org/10.1063/1.1775880
Appl. Phys. Lett. 85, 627–629 (2004) https://doi.org/10.1063/1.1773925
Appl. Phys. Lett. 85, 630–632 (2004) https://doi.org/10.1063/1.1773360

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 633–635 (2004) https://doi.org/10.1063/1.1775884
Appl. Phys. Lett. 85, 636–638 (2004) https://doi.org/10.1063/1.1773613
Appl. Phys. Lett. 85, 639–641 (2004) https://doi.org/10.1063/1.1775889
Appl. Phys. Lett. 85, 642–644 (2004) https://doi.org/10.1063/1.1776327
Appl. Phys. Lett. 85, 645–647 (2004) https://doi.org/10.1063/1.1773915
Appl. Phys. Lett. 85, 648–650 (2004) https://doi.org/10.1063/1.1774270
Appl. Phys. Lett. 85, 651–653 (2004) https://doi.org/10.1063/1.1774275
Appl. Phys. Lett. 85, 654–656 (2004) https://doi.org/10.1063/1.1775036
Appl. Phys. Lett. 85, 657–659 (2004) https://doi.org/10.1063/1.1775037

DEVICE PHYSICS

Appl. Phys. Lett. 85, 660–662 (2004) https://doi.org/10.1063/1.1773615
Appl. Phys. Lett. 85, 663–665 (2004) https://doi.org/10.1063/1.1775891
Appl. Phys. Lett. 85, 666–668 (2004) https://doi.org/10.1063/1.1775879
Appl. Phys. Lett. 85, 669–671 (2004) https://doi.org/10.1063/1.1774272
Appl. Phys. Lett. 85, 672–674 (2004) https://doi.org/10.1063/1.1772855
Appl. Phys. Lett. 85, 675–677 (2004) https://doi.org/10.1063/1.1775034
Appl. Phys. Lett. 85, 678–680 (2004) https://doi.org/10.1063/1.1769591
Appl. Phys. Lett. 85, 681–683 (2004) https://doi.org/10.1063/1.1767606
Appl. Phys. Lett. 85, 684–686 (2004) https://doi.org/10.1063/1.1775289

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 687–688 (2004) https://doi.org/10.1063/1.1772523

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 689–691 (2004) https://doi.org/10.1063/1.1775039

COMMENTS

Appl. Phys. Lett. 85, 692 (2004) https://doi.org/10.1063/1.1771470
Appl. Phys. Lett. 85, 693 (2004) https://doi.org/10.1063/1.1771471
Appl. Phys. Lett. 85, 694–695 (2004) https://doi.org/10.1063/1.1771817
Appl. Phys. Lett. 85, 696 (2004) https://doi.org/10.1063/1.1771818
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