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LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 5819–5821 (2004) https://doi.org/10.1063/1.1835554
Appl. Phys. Lett. 85, 5822–5824 (2004) https://doi.org/10.1063/1.1836864
Appl. Phys. Lett. 85, 5825–5826 (2004) https://doi.org/10.1063/1.1833561
Appl. Phys. Lett. 85, 5827–5829 (2004) https://doi.org/10.1063/1.1835550
Appl. Phys. Lett. 85, 5830–5832 (2004) https://doi.org/10.1063/1.1830676
Appl. Phys. Lett. 85, 5833–5835 (2004) https://doi.org/10.1063/1.1835997
Appl. Phys. Lett. 85, 5836–5838 (2004) https://doi.org/10.1063/1.1833567
Appl. Phys. Lett. 85, 5839–5841 (2004) https://doi.org/10.1063/1.1835557
Appl. Phys. Lett. 85, 5842–5844 (2004) https://doi.org/10.1063/1.1834715
Appl. Phys. Lett. 85, 5845–5847 (2004) https://doi.org/10.1063/1.1836019
Appl. Phys. Lett. 85, 5848–5850 (2004) https://doi.org/10.1063/1.1835556
Appl. Phys. Lett. 85, 5851–5853 (2004) https://doi.org/10.1063/1.1836876
Appl. Phys. Lett. 85, 5854–5856 (2004) https://doi.org/10.1063/1.1830675

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 85, 5857–5859 (2004) https://doi.org/10.1063/1.1834994

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 5860–5862 (2004) https://doi.org/10.1063/1.1830074
Appl. Phys. Lett. 85, 5863–5865 (2004) https://doi.org/10.1063/1.1835531
Appl. Phys. Lett. 85, 5866–5868 (2004) https://doi.org/10.1063/1.1836002
Appl. Phys. Lett. 85, 5869–5871 (2004) https://doi.org/10.1063/1.1835532
Appl. Phys. Lett. 85, 5872–5874 (2004) https://doi.org/10.1063/1.1829387
Appl. Phys. Lett. 85, 5875–5877 (2004) https://doi.org/10.1063/1.1835995
Appl. Phys. Lett. 85, 5878–5880 (2004) https://doi.org/10.1063/1.1834988
Appl. Phys. Lett. 85, 5881–5883 (2004) https://doi.org/10.1063/1.1832758
Appl. Phys. Lett. 85, 5884–5886 (2004) https://doi.org/10.1063/1.1831554
Appl. Phys. Lett. 85, 5887–5889 (2004) https://doi.org/10.1063/1.1835533
Appl. Phys. Lett. 85, 5890–5892 (2004) https://doi.org/10.1063/1.1833560
Appl. Phys. Lett. 85, 5893–5895 (2004) https://doi.org/10.1063/1.1839642
Appl. Phys. Lett. 85, 5896–5898 (2004) https://doi.org/10.1063/1.1834719
Appl. Phys. Lett. 85, 5899–5901 (2004) https://doi.org/10.1063/1.1836879
Appl. Phys. Lett. 85, 5902–5904 (2004) https://doi.org/10.1063/1.1834989
Appl. Phys. Lett. 85, 5905–5907 (2004) https://doi.org/10.1063/1.1836868
Appl. Phys. Lett. 85, 5908–5910 (2004) https://doi.org/10.1063/1.1829801

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 5911–5913 (2004) https://doi.org/10.1063/1.1831558
Appl. Phys. Lett. 85, 5914–5916 (2004) https://doi.org/10.1063/1.1830685
Appl. Phys. Lett. 85, 5917–5919 (2004) https://doi.org/10.1063/1.1829781
Appl. Phys. Lett. 85, 5920–5922 (2004) https://doi.org/10.1063/1.1835535
Appl. Phys. Lett. 85, 5923–5925 (2004) https://doi.org/10.1063/1.1836870
Appl. Phys. Lett. 85, 5926–5928 (2004) https://doi.org/10.1063/1.1804239

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 5929–5931 (2004) https://doi.org/10.1063/1.1833565
Appl. Phys. Lett. 85, 5932–5934 (2004) https://doi.org/10.1063/1.1825060
Appl. Phys. Lett. 85, 5935–5937 (2004) https://doi.org/10.1063/1.1836866
Appl. Phys. Lett. 85, 5938–5940 (2004) https://doi.org/10.1063/1.1839273
Appl. Phys. Lett. 85, 5941–5943 (2004) https://doi.org/10.1063/1.1836016
Appl. Phys. Lett. 85, 5944–5946 (2004) https://doi.org/10.1063/1.1833583
Appl. Phys. Lett. 85, 5947–5949 (2004) https://doi.org/10.1063/1.1835534

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 5950–5952 (2004) https://doi.org/10.1063/1.1836875
Appl. Phys. Lett. 85, 5953–5955 (2004) https://doi.org/10.1063/1.1829773
Appl. Phys. Lett. 85, 5956–5958 (2004) https://doi.org/10.1063/1.1825071
Appl. Phys. Lett. 85, 5959–5961 (2004) https://doi.org/10.1063/1.1835001
Appl. Phys. Lett. 85, 5962–5964 (2004) https://doi.org/10.1063/1.1834999
Appl. Phys. Lett. 85, 5965–5967 (2004) https://doi.org/10.1063/1.1834992

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 5968–5970 (2004) https://doi.org/10.1063/1.1830083
Appl. Phys. Lett. 85, 5971–5973 (2004) https://doi.org/10.1063/1.1835992
Appl. Phys. Lett. 85, 5974–5976 (2004) https://doi.org/10.1063/1.1834987
Appl. Phys. Lett. 85, 5977–5979 (2004) https://doi.org/10.1063/1.1829156
Appl. Phys. Lett. 85, 5980–5982 (2004) https://doi.org/10.1063/1.1833570
Appl. Phys. Lett. 85, 5983–5985 (2004) https://doi.org/10.1063/1.1835549
Appl. Phys. Lett. 85, 5986–5988 (2004) https://doi.org/10.1063/1.1829391
Appl. Phys. Lett. 85, 5989–5991 (2004) https://doi.org/10.1063/1.1836863
Appl. Phys. Lett. 85, 5992–5994 (2004) https://doi.org/10.1063/1.1836872
Appl. Phys. Lett. 85, 5995–5997 (2004) https://doi.org/10.1063/1.1836865
Appl. Phys. Lett. 85, 5998–6000 (2004) https://doi.org/10.1063/1.1836018
Appl. Phys. Lett. 85, 6001–6003 (2004) https://doi.org/10.1063/1.1834991
Appl. Phys. Lett. 85, 6004–6006 (2004) https://doi.org/10.1063/1.1836873
Appl. Phys. Lett. 85, 6007–6009 (2004) https://doi.org/10.1063/1.1836000

DEVICE PHYSICS

Appl. Phys. Lett. 85, 6010–6012 (2004) https://doi.org/10.1063/1.1835536
Appl. Phys. Lett. 85, 6013–6015 (2004) https://doi.org/10.1063/1.1830688
Appl. Phys. Lett. 85, 6016–6018 (2004) https://doi.org/10.1063/1.1835548
Appl. Phys. Lett. 85, 6019–6021 (2004) https://doi.org/10.1063/1.1836001
Appl. Phys. Lett. 85, 6022–6024 (2004) https://doi.org/10.1063/1.1834732
Appl. Phys. Lett. 85, 6025–6027 (2004) https://doi.org/10.1063/1.1835558
Appl. Phys. Lett. 85, 6028–6029 (2004) https://doi.org/10.1063/1.1835551
Appl. Phys. Lett. 85, 6030–6032 (2004) https://doi.org/10.1063/1.1834729
Appl. Phys. Lett. 85, 6033–6035 (2004) https://doi.org/10.1063/1.1835537
Appl. Phys. Lett. 85, 6036–6038 (2004) https://doi.org/10.1063/1.1834716
Appl. Phys. Lett. 85, 6039–6041 (2004) https://doi.org/10.1063/1.1836877

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 6042–6044 (2004) https://doi.org/10.1063/1.1834996
Appl. Phys. Lett. 85, 6045–6047 (2004) https://doi.org/10.1063/1.1835000
Appl. Phys. Lett. 85, 6048–6050 (2004) https://doi.org/10.1063/1.1836874
Appl. Phys. Lett. 85, 6051–6053 (2004) https://doi.org/10.1063/1.1835553
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