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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 5499–5501 (2004) https://doi.org/10.1063/1.1830075
Appl. Phys. Lett. 85, 5502–5504 (2004) https://doi.org/10.1063/1.1832731
Appl. Phys. Lett. 85, 5505–5507 (2004) https://doi.org/10.1063/1.1832761
Appl. Phys. Lett. 85, 5508–5510 (2004) https://doi.org/10.1063/1.1832737
Appl. Phys. Lett. 85, 5511–5513 (2004) https://doi.org/10.1063/1.1830681
Appl. Phys. Lett. 85, 5514–5516 (2004) https://doi.org/10.1063/1.1829392
Appl. Phys. Lett. 85, 5517–5519 (2004) https://doi.org/10.1063/1.1825068
Appl. Phys. Lett. 85, 5520–5522 (2004) https://doi.org/10.1063/1.1830271
Appl. Phys. Lett. 85, 5523–5525 (2004) https://doi.org/10.1063/1.1827337
Appl. Phys. Lett. 85, 5526–5528 (2004) https://doi.org/10.1063/1.1831570
Appl. Phys. Lett. 85, 5529–5531 (2004) https://doi.org/10.1063/1.1830072
Appl. Phys. Lett. 85, 5532–5534 (2004) https://doi.org/10.1063/1.1831557
Appl. Phys. Lett. 85, 5535–5537 (2004) https://doi.org/10.1063/1.1829793
Appl. Phys. Lett. 85, 5538–5540 (2004) https://doi.org/10.1063/1.1830674
Appl. Phys. Lett. 85, 5541–5543 (2004) https://doi.org/10.1063/1.1826227
Appl. Phys. Lett. 85, 5544–5546 (2004) https://doi.org/10.1063/1.1834714
Appl. Phys. Lett. 85, 5547–5549 (2004) https://doi.org/10.1063/1.1835552

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 5550–5552 (2004) https://doi.org/10.1063/1.1832732
Appl. Phys. Lett. 85, 5553–5555 (2004) https://doi.org/10.1063/1.1833559
Appl. Phys. Lett. 85, 5556–5558 (2004) https://doi.org/10.1063/1.1833552
Appl. Phys. Lett. 85, 5559–5561 (2004) https://doi.org/10.1063/1.1832757
Appl. Phys. Lett. 85, 5562–5564 (2004) https://doi.org/10.1063/1.1830679
Appl. Phys. Lett. 85, 5565–5567 (2004) https://doi.org/10.1063/1.1827932
Appl. Phys. Lett. 85, 5568–5570 (2004) https://doi.org/10.1063/1.1832759
Appl. Phys. Lett. 85, 5571–5573 (2004) https://doi.org/10.1063/1.1832756
Appl. Phys. Lett. 85, 5574–5576 (2004) https://doi.org/10.1063/1.1831561
Appl. Phys. Lett. 85, 5577–5579 (2004) https://doi.org/10.1063/1.1831559
Appl. Phys. Lett. 85, 5580–5582 (2004) https://doi.org/10.1063/1.1829385
Appl. Phys. Lett. 85, 5583–5585 (2004) https://doi.org/10.1063/1.1833563
Appl. Phys. Lett. 85, 5586–5588 (2004) https://doi.org/10.1063/1.1832734
Appl. Phys. Lett. 85, 5589–5591 (2004) https://doi.org/10.1063/1.1830687
Appl. Phys. Lett. 85, 5592–5594 (2004) https://doi.org/10.1063/1.1833564
Appl. Phys. Lett. 85, 5595–5597 (2004) https://doi.org/10.1063/1.1823596

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 5598–5600 (2004) https://doi.org/10.1063/1.1832749
Appl. Phys. Lett. 85, 5601–5603 (2004) https://doi.org/10.1063/1.1832736
Appl. Phys. Lett. 85, 5604–5606 (2004) https://doi.org/10.1063/1.1832760
Appl. Phys. Lett. 85, 5607–5609 (2004) https://doi.org/10.1063/1.1831566
Appl. Phys. Lett. 85, 5610–5612 (2004) https://doi.org/10.1063/1.1830073
Appl. Phys. Lett. 85, 5613–5615 (2004) https://doi.org/10.1063/1.1830680
Appl. Phys. Lett. 85, 5616–5618 (2004) https://doi.org/10.1063/1.1831568
Appl. Phys. Lett. 85, 5619–5621 (2004) https://doi.org/10.1063/1.1835996
Appl. Phys. Lett. 85, 5622–5624 (2004) https://doi.org/10.1063/1.1829797
Appl. Phys. Lett. 85, 5625–5627 (2004) https://doi.org/10.1063/1.1833562
Appl. Phys. Lett. 85, 5628–5630 (2004) https://doi.org/10.1063/1.1835991
Appl. Phys. Lett. 85, 5631–5633 (2004) https://doi.org/10.1063/1.1759381

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 5634–5636 (2004) https://doi.org/10.1063/1.1829140
Appl. Phys. Lett. 85, 5637–5639 (2004) https://doi.org/10.1063/1.1829800
Appl. Phys. Lett. 85, 5640–5642 (2004) https://doi.org/10.1063/1.1829792
Appl. Phys. Lett. 85, 5643–5645 (2004) https://doi.org/10.1063/1.1834733
Appl. Phys. Lett. 85, 5646–5648 (2004) https://doi.org/10.1063/1.1833568

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 5649–5651 (2004) https://doi.org/10.1063/1.1833558
Appl. Phys. Lett. 85, 5652–5654 (2004) https://doi.org/10.1063/1.1832738
Appl. Phys. Lett. 85, 5655–5657 (2004) https://doi.org/10.1063/1.1831560
Appl. Phys. Lett. 85, 5658–5660 (2004) https://doi.org/10.1063/1.1829394
Appl. Phys. Lett. 85, 5661–5663 (2004) https://doi.org/10.1063/1.1834731
Appl. Phys. Lett. 85, 5664–5666 (2004) https://doi.org/10.1063/1.1827937
Appl. Phys. Lett. 85, 5667–5669 (2004) https://doi.org/10.1063/1.1836017

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 5670–5672 (2004) https://doi.org/10.1063/1.1831563
Appl. Phys. Lett. 85, 5673–5675 (2004) https://doi.org/10.1063/1.1829164
Appl. Phys. Lett. 85, 5676–5678 (2004) https://doi.org/10.1063/1.1829780
Appl. Phys. Lett. 85, 5679–5681 (2004) https://doi.org/10.1063/1.1832733
Appl. Phys. Lett. 85, 5682–5684 (2004) https://doi.org/10.1063/1.1833557
Appl. Phys. Lett. 85, 5685–5687 (2004) https://doi.org/10.1063/1.1832750
Appl. Phys. Lett. 85, 5688–5690 (2004) https://doi.org/10.1063/1.1831556
Appl. Phys. Lett. 85, 5691–5693 (2004) https://doi.org/10.1063/1.1833569
Appl. Phys. Lett. 85, 5694–5696 (2004) https://doi.org/10.1063/1.1828575
Appl. Phys. Lett. 85, 5697–5699 (2004) https://doi.org/10.1063/1.1831564
Appl. Phys. Lett. 85, 5700–5702 (2004) https://doi.org/10.1063/1.1829795
Appl. Phys. Lett. 85, 5703–5705 (2004) https://doi.org/10.1063/1.1829160
Appl. Phys. Lett. 85, 5706–5708 (2004) https://doi.org/10.1063/1.1830684
Appl. Phys. Lett. 85, 5709–5711 (2004) https://doi.org/10.1063/1.1830683
Appl. Phys. Lett. 85, 5712–5714 (2004) https://doi.org/10.1063/1.1829390
Appl. Phys. Lett. 85, 5715–5717 (2004) https://doi.org/10.1063/1.1830689
Appl. Phys. Lett. 85, 5718–5720 (2004) https://doi.org/10.1063/1.1832739
Appl. Phys. Lett. 85, 5721–5723 (2004) https://doi.org/10.1063/1.1829161
Appl. Phys. Lett. 85, 5724–5726 (2004) https://doi.org/10.1063/1.1829778
Appl. Phys. Lett. 85, 5727–5729 (2004) https://doi.org/10.1063/1.1831567
Appl. Phys. Lett. 85, 5730–5732 (2004) https://doi.org/10.1063/1.1829774
Appl. Phys. Lett. 85, 5733–5735 (2004) https://doi.org/10.1063/1.1828598
Appl. Phys. Lett. 85, 5736–5738 (2004) https://doi.org/10.1063/1.1832735
Appl. Phys. Lett. 85, 5739–5741 (2004) https://doi.org/10.1063/1.1834713
Appl. Phys. Lett. 85, 5742–5744 (2004) https://doi.org/10.1063/1.1835994

DEVICE PHYSICS

Appl. Phys. Lett. 85, 5745–5747 (2004) https://doi.org/10.1063/1.1830677
Appl. Phys. Lett. 85, 5748–5750 (2004) https://doi.org/10.1063/1.1833555
Appl. Phys. Lett. 85, 5751–5753 (2004) https://doi.org/10.1063/1.1833551
Appl. Phys. Lett. 85, 5754–5756 (2004) https://doi.org/10.1063/1.1831562
Appl. Phys. Lett. 85, 5757–5759 (2004) https://doi.org/10.1063/1.1829776
Appl. Phys. Lett. 85, 5760–5762 (2004) https://doi.org/10.1063/1.1829388
Appl. Phys. Lett. 85, 5763–5765 (2004) https://doi.org/10.1063/1.1829166
Appl. Phys. Lett. 85, 5766–5768 (2004) https://doi.org/10.1063/1.1831565
Appl. Phys. Lett. 85, 5769–5771 (2004) https://doi.org/10.1063/1.1836867

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 5772–5774 (2004) https://doi.org/10.1063/1.1831569
Appl. Phys. Lett. 85, 5775–5777 (2004) https://doi.org/10.1063/1.1830682

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 5778–5780 (2004) https://doi.org/10.1063/1.1833554
Appl. Phys. Lett. 85, 5781–5783 (2004) https://doi.org/10.1063/1.1829165
Appl. Phys. Lett. 85, 5784–5786 (2004) https://doi.org/10.1063/1.1830678
Appl. Phys. Lett. 85, 5787–5789 (2004) https://doi.org/10.1063/1.1829162

ERRATA

Appl. Phys. Lett. 85, 5790 (2004) https://doi.org/10.1063/1.1839180
Appl. Phys. Lett. 85, 5791 (2004) https://doi.org/10.1063/1.1835559
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