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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 5131–5133 (2004) https://doi.org/10.1063/1.1826234
Appl. Phys. Lett. 85, 5134–5136 (2004) https://doi.org/10.1063/1.1828211
Appl. Phys. Lett. 85, 5137–5139 (2004) https://doi.org/10.1063/1.1828578
Appl. Phys. Lett. 85, 5140–5142 (2004) https://doi.org/10.1063/1.1825067
Appl. Phys. Lett. 85, 5143–5145 (2004) https://doi.org/10.1063/1.1825612
Appl. Phys. Lett. 85, 5146–5148 (2004) https://doi.org/10.1063/1.1828223
Appl. Phys. Lett. 85, 5149–5151 (2004) https://doi.org/10.1063/1.1828596
Appl. Phys. Lett. 85, 5152–5154 (2004) https://doi.org/10.1063/1.1828233
Appl. Phys. Lett. 85, 5155–5157 (2004) https://doi.org/10.1063/1.1828235
Appl. Phys. Lett. 85, 5158–5160 (2004) https://doi.org/10.1063/1.1830076
Appl. Phys. Lett. 85, 5161–5163 (2004) https://doi.org/10.1063/1.1830071
Appl. Phys. Lett. 85, 5164–5166 (2004) https://doi.org/10.1063/1.1829158
Appl. Phys. Lett. 85, 5167–5169 (2004) https://doi.org/10.1063/1.1827336
Appl. Phys. Lett. 85, 5170–5172 (2004) https://doi.org/10.1063/1.1828594
Appl. Phys. Lett. 85, 5173–5175 (2004) https://doi.org/10.1063/1.1829798
Appl. Phys. Lett. 85, 5176–5178 (2004) https://doi.org/10.1063/1.1829141
Appl. Phys. Lett. 85, 5179–5181 (2004) https://doi.org/10.1063/1.1829167
Appl. Phys. Lett. 85, 5182–5184 (2004) https://doi.org/10.1063/1.1828593

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 5185–5187 (2004) https://doi.org/10.1063/1.1827331
Appl. Phys. Lett. 85, 5188–5190 (2004) https://doi.org/10.1063/1.1828579
Appl. Phys. Lett. 85, 5191–5193 (2004) https://doi.org/10.1063/1.1826232
Appl. Phys. Lett. 85, 5194–5196 (2004) https://doi.org/10.1063/1.1827332
Appl. Phys. Lett. 85, 5197–5199 (2004) https://doi.org/10.1063/1.1828213
Appl. Phys. Lett. 85, 5200–5202 (2004) https://doi.org/10.1063/1.1829139
Appl. Phys. Lett. 85, 5203–5205 (2004) https://doi.org/10.1063/1.1828234
Appl. Phys. Lett. 85, 5206–5208 (2004) https://doi.org/10.1063/1.1828212
Appl. Phys. Lett. 85, 5209–5211 (2004) https://doi.org/10.1063/1.1825072
Appl. Phys. Lett. 85, 5212–5214 (2004) https://doi.org/10.1063/1.1829155
Appl. Phys. Lett. 85, 5215–5217 (2004) https://doi.org/10.1063/1.1829386
Appl. Phys. Lett. 85, 5218–5220 (2004) https://doi.org/10.1063/1.1829136
Appl. Phys. Lett. 85, 5221–5223 (2004) https://doi.org/10.1063/1.1829796
Appl. Phys. Lett. 85, 5224–5226 (2004) https://doi.org/10.1063/1.1830077
Appl. Phys. Lett. 85, 5227–5229 (2004) https://doi.org/10.1063/1.1823587
Appl. Phys. Lett. 85, 5230–5232 (2004) https://doi.org/10.1063/1.1829168
Appl. Phys. Lett. 85, 5233–5235 (2004) https://doi.org/10.1063/1.1829393
Appl. Phys. Lett. 85, 5236–5238 (2004) https://doi.org/10.1063/1.1829383
Appl. Phys. Lett. 85, 5239–5241 (2004) https://doi.org/10.1063/1.1829799

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 5242–5244 (2004) https://doi.org/10.1063/1.1825618
Appl. Phys. Lett. 85, 5245–5247 (2004) https://doi.org/10.1063/1.1825622
Appl. Phys. Lett. 85, 5248–5250 (2004) https://doi.org/10.1063/1.1828231
Appl. Phys. Lett. 85, 5251–5253 (2004) https://doi.org/10.1063/1.1828227
Appl. Phys. Lett. 85, 5254–5256 (2004) https://doi.org/10.1063/1.1828237
Appl. Phys. Lett. 85, 5257–5259 (2004) https://doi.org/10.1063/1.1831555
Appl. Phys. Lett. 85, 5260–5262 (2004) https://doi.org/10.1063/1.1830079
Appl. Phys. Lett. 85, 5263–5265 (2004) https://doi.org/10.1063/1.1830080
Appl. Phys. Lett. 85, 5266–5268 (2004) https://doi.org/10.1063/1.1829389
Appl. Phys. Lett. 85, 5269–5271 (2004) https://doi.org/10.1063/1.1825615
Appl. Phys. Lett. 85, 5272–5274 (2004) https://doi.org/10.1063/1.1830082
Appl. Phys. Lett. 85, 5275–5277 (2004) https://doi.org/10.1063/1.1828230
Appl. Phys. Lett. 85, 5278–5280 (2004) https://doi.org/10.1063/1.1827939

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 5281–5283 (2004) https://doi.org/10.1063/1.1827335
Appl. Phys. Lett. 85, 5284–5286 (2004) https://doi.org/10.1063/1.1827931
Appl. Phys. Lett. 85, 5287–5289 (2004) https://doi.org/10.1063/1.1827329
Appl. Phys. Lett. 85, 5290–5292 (2004) https://doi.org/10.1063/1.1828582
Appl. Phys. Lett. 85, 5293–5295 (2004) https://doi.org/10.1063/1.1828225
Appl. Phys. Lett. 85, 5296–5298 (2004) https://doi.org/10.1063/1.1826236
Appl. Phys. Lett. 85, 5299–5301 (2004) https://doi.org/10.1063/1.1829157
Appl. Phys. Lett. 85, 5302–5304 (2004) https://doi.org/10.1063/1.1829382
Appl. Phys. Lett. 85, 5305–5306 (2004) https://doi.org/10.1063/1.1829159
Appl. Phys. Lett. 85, 5307–5309 (2004) https://doi.org/10.1063/1.1818341

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 5310–5312 (2004) https://doi.org/10.1063/1.1825062
Appl. Phys. Lett. 85, 5313–5315 (2004) https://doi.org/10.1063/1.1828583
Appl. Phys. Lett. 85, 5316–5318 (2004) https://doi.org/10.1063/1.1828600
Appl. Phys. Lett. 85, 5319–5321 (2004) https://doi.org/10.1063/1.1829794
Appl. Phys. Lett. 85, 5322–5324 (2004) https://doi.org/10.1063/1.1828584
Appl. Phys. Lett. 85, 5325–5327 (2004) https://doi.org/10.1063/1.1829380
Appl. Phys. Lett. 85, 5328–5330 (2004) https://doi.org/10.1063/1.1828576

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 5331–5333 (2004) https://doi.org/10.1063/1.1825620
Appl. Phys. Lett. 85, 5334–5336 (2004) https://doi.org/10.1063/1.1828238
Appl. Phys. Lett. 85, 5337–5339 (2004) https://doi.org/10.1063/1.1826237
Appl. Phys. Lett. 85, 5340–5342 (2004) https://doi.org/10.1063/1.1827925
Appl. Phys. Lett. 85, 5343–5345 (2004) https://doi.org/10.1063/1.1827348
Appl. Phys. Lett. 85, 5346–5348 (2004) https://doi.org/10.1063/1.1828239
Appl. Phys. Lett. 85, 5349–5351 (2004) https://doi.org/10.1063/1.1827333
Appl. Phys. Lett. 85, 5352–5354 (2004) https://doi.org/10.1063/1.1827351
Appl. Phys. Lett. 85, 5355–5357 (2004) https://doi.org/10.1063/1.1814429
Appl. Phys. Lett. 85, 5358–5360 (2004) https://doi.org/10.1063/1.1828222
Appl. Phys. Lett. 85, 5361–5363 (2004) https://doi.org/10.1063/1.1823040
Appl. Phys. Lett. 85, 5364–5366 (2004) https://doi.org/10.1063/1.1830686
Appl. Phys. Lett. 85, 5367–5369 (2004) https://doi.org/10.1063/1.1829771
Appl. Phys. Lett. 85, 5370–5372 (2004) https://doi.org/10.1063/1.1819990
Appl. Phys. Lett. 85, 5373–5375 (2004) https://doi.org/10.1063/1.1830081
Appl. Phys. Lett. 85, 5376–5378 (2004) https://doi.org/10.1063/1.1829381
Appl. Phys. Lett. 85, 5379–5381 (2004) https://doi.org/10.1063/1.1829163
Appl. Phys. Lett. 85, 5382–5384 (2004) https://doi.org/10.1063/1.1829772
Appl. Phys. Lett. 85, 5385–5387 (2004) https://doi.org/10.1063/1.1829170
Appl. Phys. Lett. 85, 5388–5390 (2004) https://doi.org/10.1063/1.1828601

DEVICE PHYSICS

Appl. Phys. Lett. 85, 5391–5393 (2004) https://doi.org/10.1063/1.1826222
Appl. Phys. Lett. 85, 5394–5396 (2004) https://doi.org/10.1063/1.1824176
Appl. Phys. Lett. 85, 5397–5399 (2004) https://doi.org/10.1063/1.1828581
Appl. Phys. Lett. 85, 5400–5402 (2004) https://doi.org/10.1063/1.1828580
Appl. Phys. Lett. 85, 5403–5405 (2004) https://doi.org/10.1063/1.1827326
Appl. Phys. Lett. 85, 5406–5408 (2004) https://doi.org/10.1063/1.1823601
Appl. Phys. Lett. 85, 5409–5411 (2004) https://doi.org/10.1063/1.1828236
Appl. Phys. Lett. 85, 5412–5414 (2004) https://doi.org/10.1063/1.1828226
Appl. Phys. Lett. 85, 5415–5417 (2004) https://doi.org/10.1063/1.1825056
Appl. Phys. Lett. 85, 5418–5420 (2004) https://doi.org/10.1063/1.1829775
Appl. Phys. Lett. 85, 5421–5423 (2004) https://doi.org/10.1063/1.1830078
Appl. Phys. Lett. 85, 5424–5426 (2004) https://doi.org/10.1063/1.1825054
Appl. Phys. Lett. 85, 5427–5429 (2004) https://doi.org/10.1063/1.1829777
Appl. Phys. Lett. 85, 5430–5432 (2004) https://doi.org/10.1063/1.1828599
Appl. Phys. Lett. 85, 5433–5435 (2004) https://doi.org/10.1063/1.1823585
Appl. Phys. Lett. 85, 5436–5438 (2004) https://doi.org/10.1063/1.1828229
Appl. Phys. Lett. 85, 5439–5441 (2004) https://doi.org/10.1063/1.1825069
Appl. Phys. Lett. 85, 5442–5444 (2004) https://doi.org/10.1063/1.1829384

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 5445–5447 (2004) https://doi.org/10.1063/1.1828590

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 5448–5450 (2004) https://doi.org/10.1063/1.1827936
Appl. Phys. Lett. 85, 5451–5453 (2004) https://doi.org/10.1063/1.1815391
Appl. Phys. Lett. 85, 5454–5456 (2004) https://doi.org/10.1063/1.1827935
Appl. Phys. Lett. 85, 5457–5459 (2004) https://doi.org/10.1063/1.1829138
Appl. Phys. Lett. 85, 5460–5462 (2004) https://doi.org/10.1063/1.1829137
Appl. Phys. Lett. 85, 5463–5465 (2004) https://doi.org/10.1063/1.1829169
Appl. Phys. Lett. 85, 5466–5468 (2004) https://doi.org/10.1063/1.1827350

COMMENTS

Appl. Phys. Lett. 85, 5469 (2004) https://doi.org/10.1063/1.1828574

ERRATA

Appl. Phys. Lett. 85, 5470 (2004) https://doi.org/10.1063/1.1821650
Appl. Phys. Lett. 85, 5471 (2004) https://doi.org/10.1063/1.1831540
Appl. Phys. Lett. 85, 5472 (2004) https://doi.org/10.1063/1.1839598
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