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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 4831–4833 (2004) https://doi.org/10.1063/1.1823592
Appl. Phys. Lett. 85, 4834–4836 (2004) https://doi.org/10.1063/1.1828577
Appl. Phys. Lett. 85, 4837–4839 (2004) https://doi.org/10.1063/1.1826235
Appl. Phys. Lett. 85, 4840–4841 (2004) https://doi.org/10.1063/1.1828228
Appl. Phys. Lett. 85, 4842–4844 (2004) https://doi.org/10.1063/1.1828591
Appl. Phys. Lett. 85, 4845–4847 (2004) https://doi.org/10.1063/1.1823019
Appl. Phys. Lett. 85, 4848–4850 (2004) https://doi.org/10.1063/1.1823031
Appl. Phys. Lett. 85, 4851–4853 (2004) https://doi.org/10.1063/1.1823012
Appl. Phys. Lett. 85, 4854–4856 (2004) https://doi.org/10.1063/1.1819997
Appl. Phys. Lett. 85, 4857–4859 (2004) https://doi.org/10.1063/1.1826225
Appl. Phys. Lett. 85, 4860–4862 (2004) https://doi.org/10.1063/1.1824182
Appl. Phys. Lett. 85, 4863–4865 (2004) https://doi.org/10.1063/1.1818332
Appl. Phys. Lett. 85, 4866–4868 (2004) https://doi.org/10.1063/1.1815066

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 85, 4869–4871 (2004) https://doi.org/10.1063/1.1825061
Appl. Phys. Lett. 85, 4872–4874 (2004) https://doi.org/10.1063/1.1805704
Appl. Phys. Lett. 85, 4875–4877 (2004) https://doi.org/10.1063/1.1827353

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 4878–4880 (2004) https://doi.org/10.1063/1.1825635
Appl. Phys. Lett. 85, 4881–4883 (2004) https://doi.org/10.1063/1.1825617
Appl. Phys. Lett. 85, 4884–4886 (2004) https://doi.org/10.1063/1.1828592
Appl. Phys. Lett. 85, 4887–4889 (2004) https://doi.org/10.1063/1.1827338
Appl. Phys. Lett. 85, 4890–4892 (2004) https://doi.org/10.1063/1.1825619
Appl. Phys. Lett. 85, 4893–4895 (2004) https://doi.org/10.1063/1.1827938
Appl. Phys. Lett. 85, 4896–4898 (2004) https://doi.org/10.1063/1.1826238
Appl. Phys. Lett. 85, 4899–4901 (2004) https://doi.org/10.1063/1.1825611
Appl. Phys. Lett. 85, 4902–4904 (2004) https://doi.org/10.1063/1.1826230
Appl. Phys. Lett. 85, 4905–4907 (2004) https://doi.org/10.1063/1.1823014
Appl. Phys. Lett. 85, 4908–4910 (2004) https://doi.org/10.1063/1.1823602
Appl. Phys. Lett. 85, 4911–4913 (2004) https://doi.org/10.1063/1.1827349
Appl. Phys. Lett. 85, 4914–4916 (2004) https://doi.org/10.1063/1.1825065
Appl. Phys. Lett. 85, 4917–4919 (2004) https://doi.org/10.1063/1.1826233
Appl. Phys. Lett. 85, 4920–4922 (2004) https://doi.org/10.1063/1.1827352
Appl. Phys. Lett. 85, 4923–4925 (2004) https://doi.org/10.1063/1.1825051
Appl. Phys. Lett. 85, 4926–4928 (2004) https://doi.org/10.1063/1.1826229
Appl. Phys. Lett. 85, 4929–4931 (2004) https://doi.org/10.1063/1.1825053
Appl. Phys. Lett. 85, 4932–4934 (2004) https://doi.org/10.1063/1.1814431
Appl. Phys. Lett. 85, 4935–4937 (2004) https://doi.org/10.1063/1.1825616

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 4938–4940 (2004) https://doi.org/10.1063/1.1823598
Appl. Phys. Lett. 85, 4941–4943 (2004) https://doi.org/10.1063/1.1826226
Appl. Phys. Lett. 85, 4944–4946 (2004) https://doi.org/10.1063/1.1824171
Appl. Phys. Lett. 85, 4947–4949 (2004) https://doi.org/10.1063/1.1828224
Appl. Phys. Lett. 85, 4950–4952 (2004) https://doi.org/10.1063/1.1825621
Appl. Phys. Lett. 85, 4953–4955 (2004) https://doi.org/10.1063/1.1827940
Appl. Phys. Lett. 85, 4956–4958 (2004) https://doi.org/10.1063/1.1826223
Appl. Phys. Lett. 85, 4959–4961 (2004) https://doi.org/10.1063/1.1821653
Appl. Phys. Lett. 85, 4962–4964 (2004) https://doi.org/10.1063/1.1825066
Appl. Phys. Lett. 85, 4965–4967 (2004) https://doi.org/10.1063/1.1824179
Appl. Phys. Lett. 85, 4968–4970 (2004) https://doi.org/10.1063/1.1825634

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 4971–4973 (2004) https://doi.org/10.1063/1.1814817
Appl. Phys. Lett. 85, 4974–4976 (2004) https://doi.org/10.1063/1.1827926
Appl. Phys. Lett. 85, 4977–4979 (2004) https://doi.org/10.1063/1.1827933
Appl. Phys. Lett. 85, 4980–4982 (2004) https://doi.org/10.1063/1.1808497
Appl. Phys. Lett. 85, 4983–4985 (2004) https://doi.org/10.1063/1.1825073
Appl. Phys. Lett. 85, 4986–4988 (2004) https://doi.org/10.1063/1.1823588
Appl. Phys. Lett. 85, 4989–4991 (2004) https://doi.org/10.1063/1.1821649
Appl. Phys. Lett. 85, 4992–4994 (2004) https://doi.org/10.1063/1.1825075
Appl. Phys. Lett. 85, 4995–4997 (2004) https://doi.org/10.1063/1.1828232
Appl. Phys. Lett. 85, 4998–5000 (2004) https://doi.org/10.1063/1.1824172

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 5001–5003 (2004) https://doi.org/10.1063/1.1825074
Appl. Phys. Lett. 85, 5004–5006 (2004) https://doi.org/10.1063/1.1826228
Appl. Phys. Lett. 85, 5007–5009 (2004) https://doi.org/10.1063/1.1827927
Appl. Phys. Lett. 85, 5010–5012 (2004) https://doi.org/10.1063/1.1827934
Appl. Phys. Lett. 85, 5013–5015 (2004) https://doi.org/10.1063/1.1827929
Appl. Phys. Lett. 85, 5016–5018 (2004) https://doi.org/10.1063/1.1825057
Appl. Phys. Lett. 85, 5019–5021 (2004) https://doi.org/10.1063/1.1827928
Appl. Phys. Lett. 85, 5022–5024 (2004) https://doi.org/10.1063/1.1823584

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 5025–5027 (2004) https://doi.org/10.1063/1.1823017
Appl. Phys. Lett. 85, 5028–5030 (2004) https://doi.org/10.1063/1.1825624
Appl. Phys. Lett. 85, 5031–5033 (2004) https://doi.org/10.1063/1.1823590
Appl. Phys. Lett. 85, 5034–5036 (2004) https://doi.org/10.1063/1.1818742
Appl. Phys. Lett. 85, 5037–5039 (2004) https://doi.org/10.1063/1.1825623
Appl. Phys. Lett. 85, 5040–5042 (2004) https://doi.org/10.1063/1.1825058
Appl. Phys. Lett. 85, 5043–5045 (2004) https://doi.org/10.1063/1.1827327
Appl. Phys. Lett. 85, 5046–5048 (2004) https://doi.org/10.1063/1.1824174
Appl. Phys. Lett. 85, 5049–5051 (2004) https://doi.org/10.1063/1.1823042
Appl. Phys. Lett. 85, 5052–5054 (2004) https://doi.org/10.1063/1.1821648
Appl. Phys. Lett. 85, 5055–5057 (2004) https://doi.org/10.1063/1.1819986
Appl. Phys. Lett. 85, 5058–5060 (2004) https://doi.org/10.1063/1.1815059
Appl. Phys. Lett. 85, 5061–5063 (2004) https://doi.org/10.1063/1.1818335
Appl. Phys. Lett. 85, 5064–5066 (2004) https://doi.org/10.1063/1.1827334
Appl. Phys. Lett. 85, 5067–5069 (2004) https://doi.org/10.1063/1.1825052

DEVICE PHYSICS

Appl. Phys. Lett. 85, 5070–5072 (2004) https://doi.org/10.1063/1.1826240
Appl. Phys. Lett. 85, 5073–5075 (2004) https://doi.org/10.1063/1.1823597
Appl. Phys. Lett. 85, 5076–5077 (2004) https://doi.org/10.1063/1.1827930
Appl. Phys. Lett. 85, 5078–5080 (2004) https://doi.org/10.1063/1.1826239
Appl. Phys. Lett. 85, 5081–5083 (2004) https://doi.org/10.1063/1.1825070
Appl. Phys. Lett. 85, 5084–5086 (2004) https://doi.org/10.1063/1.1821629
Appl. Phys. Lett. 85, 5087–5089 (2004) https://doi.org/10.1063/1.1823600

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 5090–5092 (2004) https://doi.org/10.1063/1.1825064
Appl. Phys. Lett. 85, 5093–5095 (2004) https://doi.org/10.1063/1.1823015

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 5096–5098 (2004) https://doi.org/10.1063/1.1825063
Appl. Phys. Lett. 85, 5099–5101 (2004) https://doi.org/10.1063/1.1823589
Appl. Phys. Lett. 85, 5102–5103 (2004) https://doi.org/10.1063/1.1826221

ERRATA

Appl. Phys. Lett. 85, 5104 (2004) https://doi.org/10.1063/1.1825625
Appl. Phys. Lett. 85, 5105 (2004) https://doi.org/10.1063/1.1827347
Appl. Phys. Lett. 85, 5106 (2004) https://doi.org/10.1063/1.1829716
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