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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 4561–4563 (2004) https://doi.org/10.1063/1.1826224
Appl. Phys. Lett. 85, 4564–4566 (2004) https://doi.org/10.1063/1.1823595
Appl. Phys. Lett. 85, 4567–4569 (2004) https://doi.org/10.1063/1.1823037
Appl. Phys. Lett. 85, 4570–4572 (2004) https://doi.org/10.1063/1.1815371
Appl. Phys. Lett. 85, 4573–4575 (2004) https://doi.org/10.1063/1.1819518
Appl. Phys. Lett. 85, 4576–4578 (2004) https://doi.org/10.1063/1.1813643
Appl. Phys. Lett. 85, 4579–4581 (2004) https://doi.org/10.1063/1.1823594
Appl. Phys. Lett. 85, 4582–4584 (2004) https://doi.org/10.1063/1.1823013
Appl. Phys. Lett. 85, 4585–4587 (2004) https://doi.org/10.1063/1.1823036
Appl. Phys. Lett. 85, 4588–4590 (2004) https://doi.org/10.1063/1.1821630
Appl. Phys. Lett. 85, 4591–4593 (2004) https://doi.org/10.1063/1.1823035
Appl. Phys. Lett. 85, 4594–4596 (2004) https://doi.org/10.1063/1.1824180
Appl. Phys. Lett. 85, 4597–4599 (2004) https://doi.org/10.1063/1.1814815
Appl. Phys. Lett. 85, 4600–4602 (2004) https://doi.org/10.1063/1.1818740
Appl. Phys. Lett. 85, 4603–4605 (2004) https://doi.org/10.1063/1.1819527
Appl. Phys. Lett. 85, 4606–4608 (2004) https://doi.org/10.1063/1.1823599
Appl. Phys. Lett. 85, 4609–4611 (2004) https://doi.org/10.1063/1.1824178
Appl. Phys. Lett. 85, 4612–4614 (2004) https://doi.org/10.1063/1.1819508
Appl. Phys. Lett. 85, 4615–4617 (2004) https://doi.org/10.1063/1.1819515

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 85, 4618–4620 (2004) https://doi.org/10.1063/1.1812367

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 4621–4623 (2004) https://doi.org/10.1063/1.1819519
Appl. Phys. Lett. 85, 4624–4626 (2004) https://doi.org/10.1063/1.1818730
Appl. Phys. Lett. 85, 4627–4629 (2004) https://doi.org/10.1063/1.1814804
Appl. Phys. Lett. 85, 4630–4632 (2004) https://doi.org/10.1063/1.1818736
Appl. Phys. Lett. 85, 4633–4635 (2004) https://doi.org/10.1063/1.1814425
Appl. Phys. Lett. 85, 4636–4638 (2004) https://doi.org/10.1063/1.1821658
Appl. Phys. Lett. 85, 4639–4641 (2004) https://doi.org/10.1063/1.1821631
Appl. Phys. Lett. 85, 4642–4644 (2004) https://doi.org/10.1063/1.1821655
Appl. Phys. Lett. 85, 4645–4647 (2004) https://doi.org/10.1063/1.1823039
Appl. Phys. Lett. 85, 4648–4650 (2004) https://doi.org/10.1063/1.1823593
Appl. Phys. Lett. 85, 4651–4653 (2004) https://doi.org/10.1063/1.1815376
Appl. Phys. Lett. 85, 4654–4656 (2004) https://doi.org/10.1063/1.1823043
Appl. Phys. Lett. 85, 4657–4659 (2004) https://doi.org/10.1063/1.1800273

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 4660–4662 (2004) https://doi.org/10.1063/1.1818338
Appl. Phys. Lett. 85, 4663–4665 (2004) https://doi.org/10.1063/1.1814443
Appl. Phys. Lett. 85, 4666–4668 (2004) https://doi.org/10.1063/1.1819991
Appl. Phys. Lett. 85, 4669–4671 (2004) https://doi.org/10.1063/1.1825055
Appl. Phys. Lett. 85, 4672–4674 (2004) https://doi.org/10.1063/1.1824181

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 4675–4677 (2004) https://doi.org/10.1063/1.1818725
Appl. Phys. Lett. 85, 4678–4680 (2004) https://doi.org/10.1063/1.1819522
Appl. Phys. Lett. 85, 4681–4683 (2004) https://doi.org/10.1063/1.1819516
Appl. Phys. Lett. 85, 4684–4686 (2004) https://doi.org/10.1063/1.1821654
Appl. Phys. Lett. 85, 4687–4689 (2004) https://doi.org/10.1063/1.1819995
Appl. Phys. Lett. 85, 4690–4692 (2004) https://doi.org/10.1063/1.1827330
Appl. Phys. Lett. 85, 4693–4695 (2004) https://doi.org/10.1063/1.1827328

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 4696–4698 (2004) https://doi.org/10.1063/1.1823038
Appl. Phys. Lett. 85, 4699–4701 (2004) https://doi.org/10.1063/1.1814799
Appl. Phys. Lett. 85, 4702–4704 (2004) https://doi.org/10.1063/1.1812573
Appl. Phys. Lett. 85, 4705–4707 (2004) https://doi.org/10.1063/1.1821656
Appl. Phys. Lett. 85, 4708–4710 (2004) https://doi.org/10.1063/1.1824173
Appl. Phys. Lett. 85, 4711–4713 (2004) https://doi.org/10.1063/1.1823033
Appl. Phys. Lett. 85, 4714–4716 (2004) https://doi.org/10.1063/1.1819507
Appl. Phys. Lett. 85, 4717–4719 (2004) https://doi.org/10.1063/1.1823583
Appl. Phys. Lett. 85, 4720–4722 (2004) https://doi.org/10.1063/1.1823591
Appl. Phys. Lett. 85, 4723–4725 (2004) https://doi.org/10.1063/1.1819994
Appl. Phys. Lett. 85, 4726–4728 (2004) https://doi.org/10.1063/1.1814440

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 4729–4731 (2004) https://doi.org/10.1063/1.1818345
Appl. Phys. Lett. 85, 4732–4734 (2004) https://doi.org/10.1063/1.1815062
Appl. Phys. Lett. 85, 4735–4737 (2004) https://doi.org/10.1063/1.1819989
Appl. Phys. Lett. 85, 4738–4740 (2004) https://doi.org/10.1063/1.1812839
Appl. Phys. Lett. 85, 4741–4743 (2004) https://doi.org/10.1063/1.1819992
Appl. Phys. Lett. 85, 4744–4746 (2004) https://doi.org/10.1063/1.1818739
Appl. Phys. Lett. 85, 4747–4749 (2004) https://doi.org/10.1063/1.1821652
Appl. Phys. Lett. 85, 4750–4752 (2004) https://doi.org/10.1063/1.1819987
Appl. Phys. Lett. 85, 4753–4755 (2004) https://doi.org/10.1063/1.1824177
Appl. Phys. Lett. 85, 4756–4758 (2004) https://doi.org/10.1063/1.1821657
Appl. Phys. Lett. 85, 4759–4761 (2004) https://doi.org/10.1063/1.1808877

DEVICE PHYSICS

Appl. Phys. Lett. 85, 4762–4764 (2004) https://doi.org/10.1063/1.1823041
Appl. Phys. Lett. 85, 4765–4767 (2004) https://doi.org/10.1063/1.1818336
Appl. Phys. Lett. 85, 4768–4770 (2004) https://doi.org/10.1063/1.1818331
Appl. Phys. Lett. 85, 4771–4773 (2004) https://doi.org/10.1063/1.1815372
Appl. Phys. Lett. 85, 4774–4776 (2004) https://doi.org/10.1063/1.1819984
Appl. Phys. Lett. 85, 4777–4779 (2004) https://doi.org/10.1063/1.1819506
Appl. Phys. Lett. 85, 4780–4782 (2004) https://doi.org/10.1063/1.1823018
Appl. Phys. Lett. 85, 4783–4785 (2004) https://doi.org/10.1063/1.1825059
Appl. Phys. Lett. 85, 4786–4788 (2004) https://doi.org/10.1063/1.1818727

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 4789–4791 (2004) https://doi.org/10.1063/1.1821647
Appl. Phys. Lett. 85, 4792–4794 (2004) https://doi.org/10.1063/1.1819982

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 4795–4797 (2004) https://doi.org/10.1063/1.1823034
Appl. Phys. Lett. 85, 4798–4800 (2004) https://doi.org/10.1063/1.1823586
Appl. Phys. Lett. 85, 4801–4803 (2004) https://doi.org/10.1063/1.1818343
Appl. Phys. Lett. 85, 4804–4806 (2004) https://doi.org/10.1063/1.1814434

ERRATA

Appl. Phys. Lett. 85, 4807 (2004) https://doi.org/10.1063/1.1822924
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