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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 3959–3961 (2004) https://doi.org/10.1063/1.1810625
Appl. Phys. Lett. 85, 3962–3964 (2004) https://doi.org/10.1063/1.1813627
Appl. Phys. Lett. 85, 3965–3967 (2004) https://doi.org/10.1063/1.1813629
Appl. Phys. Lett. 85, 3968–3970 (2004) https://doi.org/10.1063/1.1814793
Appl. Phys. Lett. 85, 3971–3973 (2004) https://doi.org/10.1063/1.1810631
Appl. Phys. Lett. 85, 3974–3976 (2004) https://doi.org/10.1063/1.1813645
Appl. Phys. Lett. 85, 3977–3979 (2004) https://doi.org/10.1063/1.1812843
Appl. Phys. Lett. 85, 3980–3982 (2004) https://doi.org/10.1063/1.1811802
Appl. Phys. Lett. 85, 3983–3985 (2004) https://doi.org/10.1063/1.1813635
Appl. Phys. Lett. 85, 3986–3988 (2004) https://doi.org/10.1063/1.1810217
Appl. Phys. Lett. 85, 3989–3991 (2004) https://doi.org/10.1063/1.1811379
Appl. Phys. Lett. 85, 3992–3994 (2004) https://doi.org/10.1063/1.1814798
Appl. Phys. Lett. 85, 3995–3997 (2004) https://doi.org/10.1063/1.1815063
Appl. Phys. Lett. 85, 3998–4000 (2004) https://doi.org/10.1063/1.1813634
Appl. Phys. Lett. 85, 4001–4003 (2004) https://doi.org/10.1063/1.1814820

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 85, 4004–4006 (2004) https://doi.org/10.1063/1.1808875
Appl. Phys. Lett. 85, 4007–4009 (2004) https://doi.org/10.1063/1.1815071

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 4010–4012 (2004) https://doi.org/10.1063/1.1811795
Appl. Phys. Lett. 85, 4013–4015 (2004) https://doi.org/10.1063/1.1812371
Appl. Phys. Lett. 85, 4016–4018 (2004) https://doi.org/10.1063/1.1809281
Appl. Phys. Lett. 85, 4019–4021 (2004) https://doi.org/10.1063/1.1810212
Appl. Phys. Lett. 85, 4022–4024 (2004) https://doi.org/10.1063/1.1812594
Appl. Phys. Lett. 85, 4025–4027 (2004) https://doi.org/10.1063/1.1811772
Appl. Phys. Lett. 85, 4028–4030 (2004) https://doi.org/10.1063/1.1811377
Appl. Phys. Lett. 85, 4031–4033 (2004) https://doi.org/10.1063/1.1809276
Appl. Phys. Lett. 85, 4034–4036 (2004) https://doi.org/10.1063/1.1814438
Appl. Phys. Lett. 85, 4037–4039 (2004) https://doi.org/10.1063/1.1815064

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 4040–4042 (2004) https://doi.org/10.1063/1.1811794
Appl. Phys. Lett. 85, 4043–4045 (2004) https://doi.org/10.1063/1.1807023
Appl. Phys. Lett. 85, 4046–4048 (2004) https://doi.org/10.1063/1.1813628
Appl. Phys. Lett. 85, 4049–4051 (2004) https://doi.org/10.1063/1.1812836
Appl. Phys. Lett. 85, 4052–4054 (2004) https://doi.org/10.1063/1.1811394
Appl. Phys. Lett. 85, 4055–4057 (2004) https://doi.org/10.1063/1.1808231
Appl. Phys. Lett. 85, 4058–4060 (2004) https://doi.org/10.1063/1.1814801
Appl. Phys. Lett. 85, 4061–4063 (2004) https://doi.org/10.1063/1.1812833
Appl. Phys. Lett. 85, 4064–4066 (2004) https://doi.org/10.1063/1.1814794
Appl. Phys. Lett. 85, 4067–4069 (2004) https://doi.org/10.1063/1.1812845
Appl. Phys. Lett. 85, 4070–4072 (2004) https://doi.org/10.1063/1.1808229

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 4073–4075 (2004) https://doi.org/10.1063/1.1812580
Appl. Phys. Lett. 85, 4076–4078 (2004) https://doi.org/10.1063/1.1812581
Appl. Phys. Lett. 85, 4079–4081 (2004) https://doi.org/10.1063/1.1813630
Appl. Phys. Lett. 85, 4082–4084 (2004) https://doi.org/10.1063/1.1813626
Appl. Phys. Lett. 85, 4085–4087 (2004) https://doi.org/10.1063/1.1813633
Appl. Phys. Lett. 85, 4088–4090 (2004) https://doi.org/10.1063/1.1809274
Appl. Phys. Lett. 85, 4091–4093 (2004) https://doi.org/10.1063/1.1812813
Appl. Phys. Lett. 85, 4094–4096 (2004) https://doi.org/10.1063/1.1812576
Appl. Phys. Lett. 85, 4097–4099 (2004) https://doi.org/10.1063/1.1814819
Appl. Phys. Lett. 85, 4100–4102 (2004) https://doi.org/10.1063/1.1815070
Appl. Phys. Lett. 85, 4103–4105 (2004) https://doi.org/10.1063/1.1815065

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 4106–4108 (2004) https://doi.org/10.1063/1.1812575
Appl. Phys. Lett. 85, 4109–4111 (2004) https://doi.org/10.1063/1.1812579
Appl. Phys. Lett. 85, 4112–4114 (2004) https://doi.org/10.1063/1.1812832
Appl. Phys. Lett. 85, 4115–4117 (2004) https://doi.org/10.1063/1.1807968
Appl. Phys. Lett. 85, 4118–4120 (2004) https://doi.org/10.1063/1.1812840
Appl. Phys. Lett. 85, 4121–4123 (2004) https://doi.org/10.1063/1.1813636
Appl. Phys. Lett. 85, 4124–4126 (2004) https://doi.org/10.1063/1.1813625
Appl. Phys. Lett. 85, 4127–4129 (2004) https://doi.org/10.1063/1.1812835
Appl. Phys. Lett. 85, 4130–4132 (2004) https://doi.org/10.1063/1.1814818
Appl. Phys. Lett. 85, 4133–4135 (2004) https://doi.org/10.1063/1.1812831
Appl. Phys. Lett. 85, 4136–4138 (2004) https://doi.org/10.1063/1.1809278

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 4139–4141 (2004) https://doi.org/10.1063/1.1812571
Appl. Phys. Lett. 85, 4142–4144 (2004) https://doi.org/10.1063/1.1811774
Appl. Phys. Lett. 85, 4145–4147 (2004) https://doi.org/10.1063/1.1811789
Appl. Phys. Lett. 85, 4148–4150 (2004) https://doi.org/10.1063/1.1811805
Appl. Phys. Lett. 85, 4151–4153 (2004) https://doi.org/10.1063/1.1812578
Appl. Phys. Lett. 85, 4154–4156 (2004) https://doi.org/10.1063/1.1810208
Appl. Phys. Lett. 85, 4157–4159 (2004) https://doi.org/10.1063/1.1813632
Appl. Phys. Lett. 85, 4160–4162 (2004) https://doi.org/10.1063/1.1813642
Appl. Phys. Lett. 85, 4163–4165 (2004) https://doi.org/10.1063/1.1812841
Appl. Phys. Lett. 85, 4166–4168 (2004) https://doi.org/10.1063/1.1811396
Appl. Phys. Lett. 85, 4169–4171 (2004) https://doi.org/10.1063/1.1814795
Appl. Phys. Lett. 85, 4172–4174 (2004) https://doi.org/10.1063/1.1812838
Appl. Phys. Lett. 85, 4175–4177 (2004) https://doi.org/10.1063/1.1812364
Appl. Phys. Lett. 85, 4178–4180 (2004) https://doi.org/10.1063/1.1811792
Appl. Phys. Lett. 85, 4181–4183 (2004) https://doi.org/10.1063/1.1811799
Appl. Phys. Lett. 85, 4184–4186 (2004) https://doi.org/10.1063/1.1813644
Appl. Phys. Lett. 85, 4187–4189 (2004) https://doi.org/10.1063/1.1812811
Appl. Phys. Lett. 85, 4190–4192 (2004) https://doi.org/10.1063/1.1814427
Appl. Phys. Lett. 85, 4193–4195 (2004) https://doi.org/10.1063/1.1814810
Appl. Phys. Lett. 85, 4196–4198 (2004) https://doi.org/10.1063/1.1814797
Appl. Phys. Lett. 85, 4199–4201 (2004) https://doi.org/10.1063/1.1814816
Appl. Phys. Lett. 85, 4202–4204 (2004) https://doi.org/10.1063/1.1815373

DEVICE PHYSICS

Appl. Phys. Lett. 85, 4205–4207 (2004) https://doi.org/10.1063/1.1812577
Appl. Phys. Lett. 85, 4208–4210 (2004) https://doi.org/10.1063/1.1812812
Appl. Phys. Lett. 85, 4211–4213 (2004) https://doi.org/10.1063/1.1810211
Appl. Phys. Lett. 85, 4214–4216 (2004) https://doi.org/10.1063/1.1811793
Appl. Phys. Lett. 85, 4217–4218 (2004) https://doi.org/10.1063/1.1806555
Appl. Phys. Lett. 85, 4219–4221 (2004) https://doi.org/10.1063/1.1812834
Appl. Phys. Lett. 85, 4222–4224 (2004) https://doi.org/10.1063/1.1815375

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 4225–4227 (2004) https://doi.org/10.1063/1.1812842
Appl. Phys. Lett. 85, 4228–4230 (2004) https://doi.org/10.1063/1.1813631
Appl. Phys. Lett. 85, 4231–4233 (2004) https://doi.org/10.1063/1.1812583

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 4234–4236 (2004) https://doi.org/10.1063/1.1812363
Appl. Phys. Lett. 85, 4237–4239 (2004) https://doi.org/10.1063/1.1812830
Appl. Phys. Lett. 85, 4240–4242 (2004) https://doi.org/10.1063/1.1812372
Appl. Phys. Lett. 85, 4243–4245 (2004) https://doi.org/10.1063/1.1812574

ERRATA

Appl. Phys. Lett. 85, 4246 (2004) https://doi.org/10.1063/1.1808489
Appl. Phys. Lett. 85, 4247 (2004) https://doi.org/10.1063/1.1825049
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