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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 3657–3659 (2004) https://doi.org/10.1063/1.1808888
Appl. Phys. Lett. 85, 3660–3662 (2004) https://doi.org/10.1063/1.1808878
Appl. Phys. Lett. 85, 3663–3665 (2004) https://doi.org/10.1063/1.1808881
Appl. Phys. Lett. 85, 3666–3668 (2004) https://doi.org/10.1063/1.1807967
Appl. Phys. Lett. 85, 3669–3671 (2004) https://doi.org/10.1063/1.1807970
Appl. Phys. Lett. 85, 3672–3674 (2004) https://doi.org/10.1063/1.1807948
Appl. Phys. Lett. 85, 3675–3677 (2004) https://doi.org/10.1063/1.1812365
Appl. Phys. Lett. 85, 3678–3680 (2004) https://doi.org/10.1063/1.1808225
Appl. Phys. Lett. 85, 3681–3683 (2004) https://doi.org/10.1063/1.1812375
Appl. Phys. Lett. 85, 3684–3686 (2004) https://doi.org/10.1063/1.1812595
Appl. Phys. Lett. 85, 3687–3689 (2004) https://doi.org/10.1063/1.1810626
Appl. Phys. Lett. 85, 3690–3692 (2004) https://doi.org/10.1063/1.1806278
Appl. Phys. Lett. 85, 3693–3695 (2004) https://doi.org/10.1063/1.1811378
Appl. Phys. Lett. 85, 3696–3698 (2004) https://doi.org/10.1063/1.1808501
Appl. Phys. Lett. 85, 3699–3701 (2004) https://doi.org/10.1063/1.1811382
Appl. Phys. Lett. 85, 3702–3704 (2004) https://doi.org/10.1063/1.1811383
Appl. Phys. Lett. 85, 3705–3707 (2004) https://doi.org/10.1063/1.1811384
Appl. Phys. Lett. 85, 3708–3710 (2004) https://doi.org/10.1063/1.1807019
Appl. Phys. Lett. 85, 3711–3713 (2004) https://doi.org/10.1063/1.1810215

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 3714–3716 (2004) https://doi.org/10.1063/1.1807032
Appl. Phys. Lett. 85, 3717–3719 (2004) https://doi.org/10.1063/1.1811796
Appl. Phys. Lett. 85, 3720–3722 (2004) https://doi.org/10.1063/1.1808876
Appl. Phys. Lett. 85, 3723–3725 (2004) https://doi.org/10.1063/1.1808882
Appl. Phys. Lett. 85, 3726–3728 (2004) https://doi.org/10.1063/1.1812380
Appl. Phys. Lett. 85, 3729–3730 (2004) https://doi.org/10.1063/1.1812381
Appl. Phys. Lett. 85, 3731–3733 (2004) https://doi.org/10.1063/1.1809279
Appl. Phys. Lett. 85, 3734–3736 (2004) https://doi.org/10.1063/1.1812369
Appl. Phys. Lett. 85, 3737–3739 (2004) https://doi.org/10.1063/1.1810214
Appl. Phys. Lett. 85, 3740–3742 (2004) https://doi.org/10.1063/1.1810624
Appl. Phys. Lett. 85, 3743–3745 (2004) https://doi.org/10.1063/1.1810643
Appl. Phys. Lett. 85, 3746–3748 (2004) https://doi.org/10.1063/1.1812591
Appl. Phys. Lett. 85, 3749–3751 (2004) https://doi.org/10.1063/1.1810629
Appl. Phys. Lett. 85, 3752–3754 (2004) https://doi.org/10.1063/1.1811395
Appl. Phys. Lett. 85, 3755–3757 (2004) https://doi.org/10.1063/1.1812582
Appl. Phys. Lett. 85, 3758–3759 (2004) https://doi.org/10.1063/1.1808502
Appl. Phys. Lett. 85, 3760–3762 (2004) https://doi.org/10.1063/1.1808471

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 3763–3765 (2004) https://doi.org/10.1063/1.1811790
Appl. Phys. Lett. 85, 3766–3768 (2004) https://doi.org/10.1063/1.1808883
Appl. Phys. Lett. 85, 3769–3771 (2004) https://doi.org/10.1063/1.1809272
Appl. Phys. Lett. 85, 3772–3774 (2004) https://doi.org/10.1063/1.1812382
Appl. Phys. Lett. 85, 3775–3776 (2004) https://doi.org/10.1063/1.1810210
Appl. Phys. Lett. 85, 3777–3779 (2004) https://doi.org/10.1063/1.1812590
Appl. Phys. Lett. 85, 3780–3782 (2004) https://doi.org/10.1063/1.1810627
Appl. Phys. Lett. 85, 3783–3785 (2004) https://doi.org/10.1063/1.1804255
Appl. Phys. Lett. 85, 3786–3788 (2004) https://doi.org/10.1063/1.1808496
Appl. Phys. Lett. 85, 3789–3791 (2004) https://doi.org/10.1063/1.1808498
Appl. Phys. Lett. 85, 3792–3794 (2004) https://doi.org/10.1063/1.1787152

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 3795–3796 (2004) https://doi.org/10.1063/1.1811801
Appl. Phys. Lett. 85, 3797–3799 (2004) https://doi.org/10.1063/1.1807963
Appl. Phys. Lett. 85, 3800–3802 (2004) https://doi.org/10.1063/1.1807969
Appl. Phys. Lett. 85, 3803–3805 (2004) https://doi.org/10.1063/1.1812383
Appl. Phys. Lett. 85, 3806–3808 (2004) https://doi.org/10.1063/1.1809280
Appl. Phys. Lett. 85, 3809–3811 (2004) https://doi.org/10.1063/1.1810216
Appl. Phys. Lett. 85, 3812–3814 (2004) https://doi.org/10.1063/1.1812597
Appl. Phys. Lett. 85, 3815–3817 (2004) https://doi.org/10.1063/1.1812844

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 3818–3820 (2004) https://doi.org/10.1063/1.1807965
Appl. Phys. Lett. 85, 3821–3823 (2004) https://doi.org/10.1063/1.1808233
Appl. Phys. Lett. 85, 3824–3826 (2004) https://doi.org/10.1063/1.1810642
Appl. Phys. Lett. 85, 3827–3829 (2004) https://doi.org/10.1063/1.1806541
Appl. Phys. Lett. 85, 3830–3832 (2004) https://doi.org/10.1063/1.1807024

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 3833–3835 (2004) https://doi.org/10.1063/1.1811797
Appl. Phys. Lett. 85, 3836–3838 (2004) https://doi.org/10.1063/1.1807012
Appl. Phys. Lett. 85, 3839–3841 (2004) https://doi.org/10.1063/1.1807959
Appl. Phys. Lett. 85, 3842–3844 (2004) https://doi.org/10.1063/1.1811804
Appl. Phys. Lett. 85, 3845–3847 (2004) https://doi.org/10.1063/1.1811771
Appl. Phys. Lett. 85, 3848–3850 (2004) https://doi.org/10.1063/1.1808884
Appl. Phys. Lett. 85, 3851–3853 (2004) https://doi.org/10.1063/1.1808886
Appl. Phys. Lett. 85, 3854–3856 (2004) https://doi.org/10.1063/1.1809271
Appl. Phys. Lett. 85, 3857–3859 (2004) https://doi.org/10.1063/1.1809277
Appl. Phys. Lett. 85, 3860–3862 (2004) https://doi.org/10.1063/1.1812373
Appl. Phys. Lett. 85, 3863–3865 (2004) https://doi.org/10.1063/1.1812592
Appl. Phys. Lett. 85, 3866–3868 (2004) https://doi.org/10.1063/1.1812593
Appl. Phys. Lett. 85, 3869–3871 (2004) https://doi.org/10.1063/1.1812596
Appl. Phys. Lett. 85, 3872–3874 (2004) https://doi.org/10.1063/1.1808492
Appl. Phys. Lett. 85, 3875–3877 (2004) https://doi.org/10.1063/1.1804256
Appl. Phys. Lett. 85, 3878–3880 (2004) https://doi.org/10.1063/1.1811380
Appl. Phys. Lett. 85, 3881–3883 (2004) https://doi.org/10.1063/1.1808504

DEVICE PHYSICS

Appl. Phys. Lett. 85, 3884–3886 (2004) https://doi.org/10.1063/1.1808891
Appl. Phys. Lett. 85, 3887–3889 (2004) https://doi.org/10.1063/1.1811798
Appl. Phys. Lett. 85, 3890–3892 (2004) https://doi.org/10.1063/1.1805175
Appl. Phys. Lett. 85, 3893–3895 (2004) https://doi.org/10.1063/1.1811803
Appl. Phys. Lett. 85, 3896–3898 (2004) https://doi.org/10.1063/1.1809275
Appl. Phys. Lett. 85, 3899–3901 (2004) https://doi.org/10.1063/1.1812368
Appl. Phys. Lett. 85, 3902–3904 (2004) https://doi.org/10.1063/1.1812374
Appl. Phys. Lett. 85, 3905–3907 (2004) https://doi.org/10.1063/1.1810213
Appl. Phys. Lett. 85, 3908–3910 (2004) https://doi.org/10.1063/1.1812376
Appl. Phys. Lett. 85, 3911–3913 (2004) https://doi.org/10.1063/1.1812378

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 3914–3916 (2004) https://doi.org/10.1063/1.1812366

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 3917–3919 (2004) https://doi.org/10.1063/1.1802374
Appl. Phys. Lett. 85, 3920–3922 (2004) https://doi.org/10.1063/1.1811773
Appl. Phys. Lett. 85, 3923–3925 (2004) https://doi.org/10.1063/1.1807951
Appl. Phys. Lett. 85, 3926–3928 (2004) https://doi.org/10.1063/1.1810209
Appl. Phys. Lett. 85, 3929–3931 (2004) https://doi.org/10.1063/1.1812377
Appl. Phys. Lett. 85, 3932–3934 (2004) https://doi.org/10.1063/1.1810630
Appl. Phys. Lett. 85, 3935–3937 (2004) https://doi.org/10.1063/1.1808499

ERRATA

Appl. Phys. Lett. 85, 3938 (2004) https://doi.org/10.1063/1.1808490
Appl. Phys. Lett. 85, 3939 (2004) https://doi.org/10.1063/1.1810534
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