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LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 3343–3345 (2004) https://doi.org/10.1063/1.1807960
Appl. Phys. Lett. 85, 3346–3347 (2004) https://doi.org/10.1063/1.1781355
Appl. Phys. Lett. 85, 3348–3350 (2004) https://doi.org/10.1063/1.1807952
Appl. Phys. Lett. 85, 3351–3353 (2004) https://doi.org/10.1063/1.1808224
Appl. Phys. Lett. 85, 3354–3356 (2004) https://doi.org/10.1063/1.1809282
Appl. Phys. Lett. 85, 3357–3359 (2004) https://doi.org/10.1063/1.1808250
Appl. Phys. Lett. 85, 3360–3362 (2004) https://doi.org/10.1063/1.1808232
Appl. Phys. Lett. 85, 3363–3365 (2004) https://doi.org/10.1063/1.1808235
Appl. Phys. Lett. 85, 3366–3368 (2004) https://doi.org/10.1063/1.1808239
Appl. Phys. Lett. 85, 3369–3371 (2004) https://doi.org/10.1063/1.1808240
Appl. Phys. Lett. 85, 3372–3374 (2004) https://doi.org/10.1063/1.1806280
Appl. Phys. Lett. 85, 3375–3377 (2004) https://doi.org/10.1063/1.1806560
Appl. Phys. Lett. 85, 3378–3380 (2004) https://doi.org/10.1063/1.1806561
Appl. Phys. Lett. 85, 3381–3383 (2004) https://doi.org/10.1063/1.1806562
Appl. Phys. Lett. 85, 3384–3386 (2004) https://doi.org/10.1063/1.1808506
Appl. Phys. Lett. 85, 3387–3389 (2004) https://doi.org/10.1063/1.1808488
Appl. Phys. Lett. 85, 3390–3392 (2004) https://doi.org/10.1063/1.1807025

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 85, 3393–3395 (2004) https://doi.org/10.1063/1.1766075
Appl. Phys. Lett. 85, 3396–3398 (2004) https://doi.org/10.1063/1.1806557

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 3399–3401 (2004) https://doi.org/10.1063/1.1807031
Appl. Phys. Lett. 85, 3402–3404 (2004) https://doi.org/10.1063/1.1807033
Appl. Phys. Lett. 85, 3405–3407 (2004) https://doi.org/10.1063/1.1808873
Appl. Phys. Lett. 85, 3408–3410 (2004) https://doi.org/10.1063/1.1787599
Appl. Phys. Lett. 85, 3411–3413 (2004) https://doi.org/10.1063/1.1807962
Appl. Phys. Lett. 85, 3414–3416 (2004) https://doi.org/10.1063/1.1808880
Appl. Phys. Lett. 85, 3417–3419 (2004) https://doi.org/10.1063/1.1807950
Appl. Phys. Lett. 85, 3420–3422 (2004) https://doi.org/10.1063/1.1793351
Appl. Phys. Lett. 85, 3423–3425 (2004) https://doi.org/10.1063/1.1806251
Appl. Phys. Lett. 85, 3426–3428 (2004) https://doi.org/10.1063/1.1806265
Appl. Phys. Lett. 85, 3429–3431 (2004) https://doi.org/10.1063/1.1808227
Appl. Phys. Lett. 85, 3432–3434 (2004) https://doi.org/10.1063/1.1808234
Appl. Phys. Lett. 85, 3435–3437 (2004) https://doi.org/10.1063/1.1806275
Appl. Phys. Lett. 85, 3438–3440 (2004) https://doi.org/10.1063/1.1808236
Appl. Phys. Lett. 85, 3441–3443 (2004) https://doi.org/10.1063/1.1808237
Appl. Phys. Lett. 85, 3444–3446 (2004) https://doi.org/10.1063/1.1808238
Appl. Phys. Lett. 85, 3447–3449 (2004) https://doi.org/10.1063/1.1808241
Appl. Phys. Lett. 85, 3450–3452 (2004) https://doi.org/10.1063/1.1806559
Appl. Phys. Lett. 85, 3453–3455 (2004) https://doi.org/10.1063/1.1808491
Appl. Phys. Lett. 85, 3456–3458 (2004) https://doi.org/10.1063/1.1777414
Appl. Phys. Lett. 85, 3459–3461 (2004) https://doi.org/10.1063/1.1806563
Appl. Phys. Lett. 85, 3462–3464 (2004) https://doi.org/10.1063/1.1808495
Appl. Phys. Lett. 85, 3465–3467 (2004) https://doi.org/10.1063/1.1808503
Appl. Phys. Lett. 85, 3468–3470 (2004) https://doi.org/10.1063/1.1801674

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 3471–3473 (2004) https://doi.org/10.1063/1.1807013
Appl. Phys. Lett. 85, 3474–3476 (2004) https://doi.org/10.1063/1.1805178
Appl. Phys. Lett. 85, 3477–3479 (2004) https://doi.org/10.1063/1.1807966
Appl. Phys. Lett. 85, 3480–3482 (2004) https://doi.org/10.1063/1.1807949
Appl. Phys. Lett. 85, 3483–3485 (2004) https://doi.org/10.1063/1.1806268
Appl. Phys. Lett. 85, 3486–3488 (2004) https://doi.org/10.1063/1.1808505
Appl. Phys. Lett. 85, 3489–3491 (2004) https://doi.org/10.1063/1.1806545
Appl. Phys. Lett. 85, 3492–3494 (2004) https://doi.org/10.1063/1.1807014
Appl. Phys. Lett. 85, 3495–3497 (2004) https://doi.org/10.1063/1.1804610

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 3498–3500 (2004) https://doi.org/10.1063/1.1807958
Appl. Phys. Lett. 85, 3501–3503 (2004) https://doi.org/10.1063/1.1805698
Appl. Phys. Lett. 85, 3504–3506 (2004) https://doi.org/10.1063/1.1805709
Appl. Phys. Lett. 85, 3507–3509 (2004) https://doi.org/10.1063/1.1806565
Appl. Phys. Lett. 85, 3510–3512 (2004) https://doi.org/10.1063/1.1806566
Appl. Phys. Lett. 85, 3513–3515 (2004) https://doi.org/10.1063/1.1808500

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 3516–3518 (2004) https://doi.org/10.1063/1.1795357
Appl. Phys. Lett. 85, 3519–3521 (2004) https://doi.org/10.1063/1.1807010
Appl. Phys. Lett. 85, 3522–3524 (2004) https://doi.org/10.1063/1.1785861
Appl. Phys. Lett. 85, 3525–3527 (2004) https://doi.org/10.1063/1.1808228
Appl. Phys. Lett. 85, 3528–3530 (2004) https://doi.org/10.1063/1.1808251
Appl. Phys. Lett. 85, 3531–3533 (2004) https://doi.org/10.1063/1.1803939
Appl. Phys. Lett. 85, 3534–3536 (2004) https://doi.org/10.1063/1.1786631
Appl. Phys. Lett. 85, 3537–3539 (2004) https://doi.org/10.1063/1.1797535
Appl. Phys. Lett. 85, 3540–3542 (2004) https://doi.org/10.1063/1.1801682
Appl. Phys. Lett. 85, 3543–3545 (2004) https://doi.org/10.1063/1.1806547

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 3546–3548 (2004) https://doi.org/10.1063/1.1808889
Appl. Phys. Lett. 85, 3549–3551 (2004) https://doi.org/10.1063/1.1808874
Appl. Phys. Lett. 85, 3552–3554 (2004) https://doi.org/10.1063/1.1807964
Appl. Phys. Lett. 85, 3555–3557 (2004) https://doi.org/10.1063/1.1807945
Appl. Phys. Lett. 85, 3558–3560 (2004) https://doi.org/10.1063/1.1809273
Appl. Phys. Lett. 85, 3561–3563 (2004) https://doi.org/10.1063/1.1803619
Appl. Phys. Lett. 85, 3564–3566 (2004) https://doi.org/10.1063/1.1807946
Appl. Phys. Lett. 85, 3567–3569 (2004) https://doi.org/10.1063/1.1807947
Appl. Phys. Lett. 85, 3570–3571 (2004) https://doi.org/10.1063/1.1807953
Appl. Phys. Lett. 85, 3572–3574 (2004) https://doi.org/10.1063/1.1808226
Appl. Phys. Lett. 85, 3575–3577 (2004) https://doi.org/10.1063/1.1803932
Appl. Phys. Lett. 85, 3578–3580 (2004) https://doi.org/10.1063/1.1806277
Appl. Phys. Lett. 85, 3581–3583 (2004) https://doi.org/10.1063/1.1808493
Appl. Phys. Lett. 85, 3584–3586 (2004) https://doi.org/10.1063/1.1808494
Appl. Phys. Lett. 85, 3587–3589 (2004) https://doi.org/10.1063/1.1808507
Appl. Phys. Lett. 85, 3590–3592 (2004) https://doi.org/10.1063/1.1804241
Appl. Phys. Lett. 85, 3593–3595 (2004) https://doi.org/10.1063/1.1808472
Appl. Phys. Lett. 85, 3596–3598 (2004) https://doi.org/10.1063/1.1806546
Appl. Phys. Lett. 85, 3599–3601 (2004) https://doi.org/10.1063/1.1807020

DEVICE PHYSICS

Appl. Phys. Lett. 85, 3602–3604 (2004) https://doi.org/10.1063/1.1807030
Appl. Phys. Lett. 85, 3605–3607 (2004) https://doi.org/10.1063/1.1808890
Appl. Phys. Lett. 85, 3608–3610 (2004) https://doi.org/10.1063/1.1808871
Appl. Phys. Lett. 85, 3611–3613 (2004) https://doi.org/10.1063/1.1807961
Appl. Phys. Lett. 85, 3614–3616 (2004) https://doi.org/10.1063/1.1781732
Appl. Phys. Lett. 85, 3617–3619 (2004) https://doi.org/10.1063/1.1803950
Appl. Phys. Lett. 85, 3620–3622 (2004) https://doi.org/10.1063/1.1797540

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 3623–3625 (2004) https://doi.org/10.1063/1.1807009
Appl. Phys. Lett. 85, 3626–3628 (2004) https://doi.org/10.1063/1.1808885

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 3629–3631 (2004) https://doi.org/10.1063/1.1808872
Appl. Phys. Lett. 85, 3632–3634 (2004) https://doi.org/10.1063/1.1806542
Appl. Phys. Lett. 85, 3635–3637 (2004) https://doi.org/10.1063/1.1807017

ERRATA

Appl. Phys. Lett. 85, 3638 (2004) https://doi.org/10.1063/1.1810533
Appl. Phys. Lett. 85, 3639 (2004) https://doi.org/10.1063/1.1748851

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