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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 2679–2681 (2004) https://doi.org/10.1063/1.1795359
Appl. Phys. Lett. 85, 2682–2684 (2004) https://doi.org/10.1063/1.1795370
Appl. Phys. Lett. 85, 2685–2687 (2004) https://doi.org/10.1063/1.1799243
Appl. Phys. Lett. 85, 2688–2690 (2004) https://doi.org/10.1063/1.1803617
Appl. Phys. Lett. 85, 2691–2693 (2004) https://doi.org/10.1063/1.1781363
Appl. Phys. Lett. 85, 2694–2696 (2004) https://doi.org/10.1063/1.1796532
Appl. Phys. Lett. 85, 2697–2699 (2004) https://doi.org/10.1063/1.1801166
Appl. Phys. Lett. 85, 2700–2702 (2004) https://doi.org/10.1063/1.1803937
Appl. Phys. Lett. 85, 2703–2705 (2004) https://doi.org/10.1063/1.1804252
Appl. Phys. Lett. 85, 2706–2708 (2004) https://doi.org/10.1063/1.1801175
Appl. Phys. Lett. 85, 2709–2711 (2004) https://doi.org/10.1063/1.1791735
Appl. Phys. Lett. 85, 2712–2714 (2004) https://doi.org/10.1063/1.1801686
Appl. Phys. Lett. 85, 2715–2717 (2004) https://doi.org/10.1063/1.1797554
Appl. Phys. Lett. 85, 2718–2720 (2004) https://doi.org/10.1063/1.1801672
Appl. Phys. Lett. 85, 2721–2723 (2004) https://doi.org/10.1063/1.1798394
Appl. Phys. Lett. 85, 2724–2726 (2004) https://doi.org/10.1063/1.1795363
Appl. Phys. Lett. 85, 2727–2729 (2004) https://doi.org/10.1063/1.1803623
Appl. Phys. Lett. 85, 2730–2732 (2004) https://doi.org/10.1063/1.1801681
Appl. Phys. Lett. 85, 2733–2735 (2004) https://doi.org/10.1063/1.1758778

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 85, 2736–2738 (2004) https://doi.org/10.1063/1.1803915
Appl. Phys. Lett. 85, 2739–2740 (2004) https://doi.org/10.1063/1.1801171

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 2741–2743 (2004) https://doi.org/10.1063/1.1799229
Appl. Phys. Lett. 85, 2744–2746 (2004) https://doi.org/10.1063/1.1802385
Appl. Phys. Lett. 85, 2747–2749 (2004) https://doi.org/10.1063/1.1802390
Appl. Phys. Lett. 85, 2750–2752 (2004) https://doi.org/10.1063/1.1799238
Appl. Phys. Lett. 85, 2753–2755 (2004) https://doi.org/10.1063/1.1802376
Appl. Phys. Lett. 85, 2756–2758 (2004) https://doi.org/10.1063/1.1799247
Appl. Phys. Lett. 85, 2759–2761 (2004) https://doi.org/10.1063/1.1803618
Appl. Phys. Lett. 85, 2762–2764 (2004) https://doi.org/10.1063/1.1800275
Appl. Phys. Lett. 85, 2765–2767 (2004) https://doi.org/10.1063/1.1800277
Appl. Phys. Lett. 85, 2768–2770 (2004) https://doi.org/10.1063/1.1800289
Appl. Phys. Lett. 85, 2771–2773 (2004) https://doi.org/10.1063/1.1801172
Appl. Phys. Lett. 85, 2774–2776 (2004) https://doi.org/10.1063/1.1803940
Appl. Phys. Lett. 85, 2777–2779 (2004) https://doi.org/10.1063/1.1786655
Appl. Phys. Lett. 85, 2780–2781 (2004) https://doi.org/10.1063/1.1804254
Appl. Phys. Lett. 85, 2782–2784 (2004) https://doi.org/10.1063/1.1801684
Appl. Phys. Lett. 85, 2785–2787 (2004) https://doi.org/10.1063/1.1797534
Appl. Phys. Lett. 85, 2788–2790 (2004) https://doi.org/10.1063/1.1801677
Appl. Phys. Lett. 85, 2791–2793 (2004) https://doi.org/10.1063/1.1801678
Appl. Phys. Lett. 85, 2794–2796 (2004) https://doi.org/10.1063/1.1804611
Appl. Phys. Lett. 85, 2797–2799 (2004) https://doi.org/10.1063/1.1805199
Appl. Phys. Lett. 85, 2800–2802 (2004) https://doi.org/10.1063/1.1789579
Appl. Phys. Lett. 85, 2803–2805 (2004) https://doi.org/10.1063/1.1792384

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 2806–2808 (2004) https://doi.org/10.1063/1.1799232
Appl. Phys. Lett. 85, 2809–2811 (2004) https://doi.org/10.1063/1.1799235
Appl. Phys. Lett. 85, 2812–2814 (2004) https://doi.org/10.1063/1.1783018
Appl. Phys. Lett. 85, 2815–2817 (2004) https://doi.org/10.1063/1.1802381
Appl. Phys. Lett. 85, 2818–2820 (2004) https://doi.org/10.1063/1.1799248
Appl. Phys. Lett. 85, 2821–2823 (2004) https://doi.org/10.1063/1.1800276
Appl. Phys. Lett. 85, 2824–2826 (2004) https://doi.org/10.1063/1.1781731
Appl. Phys. Lett. 85, 2827–2829 (2004) https://doi.org/10.1063/1.1803918
Appl. Phys. Lett. 85, 2830–2832 (2004) https://doi.org/10.1063/1.1800286
Appl. Phys. Lett. 85, 2833–2835 (2004) https://doi.org/10.1063/1.1801685
Appl. Phys. Lett. 85, 2836–2838 (2004) https://doi.org/10.1063/1.1804251
Appl. Phys. Lett. 85, 2839–2841 (2004) https://doi.org/10.1063/1.1801676

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 2842–2844 (2004) https://doi.org/10.1063/1.1805195
Appl. Phys. Lett. 85, 2845–2847 (2004) https://doi.org/10.1063/1.1799250
Appl. Phys. Lett. 85, 2848–2850 (2004) https://doi.org/10.1063/1.1802388
Appl. Phys. Lett. 85, 2851–2853 (2004) https://doi.org/10.1063/1.1802389
Appl. Phys. Lett. 85, 2854–2856 (2004) https://doi.org/10.1063/1.1802378
Appl. Phys. Lett. 85, 2857–2859 (2004) https://doi.org/10.1063/1.1799244
Appl. Phys. Lett. 85, 2860–2862 (2004) https://doi.org/10.1063/1.1799245
Appl. Phys. Lett. 85, 2863–2865 (2004) https://doi.org/10.1063/1.1803620
Appl. Phys. Lett. 85, 2866–2868 (2004) https://doi.org/10.1063/1.1803621
Appl. Phys. Lett. 85, 2869–2871 (2004) https://doi.org/10.1063/1.1800279
Appl. Phys. Lett. 85, 2872–2874 (2004) https://doi.org/10.1063/1.1800281
Appl. Phys. Lett. 85, 2875–2877 (2004) https://doi.org/10.1063/1.1800284
Appl. Phys. Lett. 85, 2878–2880 (2004) https://doi.org/10.1063/1.1801165
Appl. Phys. Lett. 85, 2881–2883 (2004) https://doi.org/10.1063/1.1801174
Appl. Phys. Lett. 85, 2884–2886 (2004) https://doi.org/10.1063/1.1797553
Appl. Phys. Lett. 85, 2887–2889 (2004) https://doi.org/10.1063/1.1794848

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 2890–2892 (2004) https://doi.org/10.1063/1.1799231
Appl. Phys. Lett. 85, 2893–2895 (2004) https://doi.org/10.1063/1.1795369
Appl. Phys. Lett. 85, 2896–2898 (2004) https://doi.org/10.1063/1.1799241
Appl. Phys. Lett. 85, 2899–2901 (2004) https://doi.org/10.1063/1.1799246
Appl. Phys. Lett. 85, 2902–2904 (2004) https://doi.org/10.1063/1.1797564
Appl. Phys. Lett. 85, 2905–2907 (2004) https://doi.org/10.1063/1.1804609

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 2908–2910 (2004) https://doi.org/10.1063/1.1802377
Appl. Phys. Lett. 85, 2911–2913 (2004) https://doi.org/10.1063/1.1805701
Appl. Phys. Lett. 85, 2914–2916 (2004) https://doi.org/10.1063/1.1795973
Appl. Phys. Lett. 85, 2917–2919 (2004) https://doi.org/10.1063/1.1800274
Appl. Phys. Lett. 85, 2920–2922 (2004) https://doi.org/10.1063/1.1800278
Appl. Phys. Lett. 85, 2923–2925 (2004) https://doi.org/10.1063/1.1800280
Appl. Phys. Lett. 85, 2926–2928 (2004) https://doi.org/10.1063/1.1800287
Appl. Phys. Lett. 85, 2929–2931 (2004) https://doi.org/10.1063/1.1800288
Appl. Phys. Lett. 85, 2932–2934 (2004) https://doi.org/10.1063/1.1801168
Appl. Phys. Lett. 85, 2935–2937 (2004) https://doi.org/10.1063/1.1801170
Appl. Phys. Lett. 85, 2938–2940 (2004) https://doi.org/10.1063/1.1797537
Appl. Phys. Lett. 85, 2941–2943 (2004) https://doi.org/10.1063/1.1801675

DEVICE PHYSICS

Appl. Phys. Lett. 85, 2944–2946 (2004) https://doi.org/10.1063/1.1802386
Appl. Phys. Lett. 85, 2947–2949 (2004) https://doi.org/10.1063/1.1799237
Appl. Phys. Lett. 85, 2950–2952 (2004) https://doi.org/10.1063/1.1803616
Appl. Phys. Lett. 85, 2953–2955 (2004) https://doi.org/10.1063/1.1787939
Appl. Phys. Lett. 85, 2956–2958 (2004) https://doi.org/10.1063/1.1790598
Appl. Phys. Lett. 85, 2959–2961 (2004) https://doi.org/10.1063/1.1796522
Appl. Phys. Lett. 85, 2962–2964 (2004) https://doi.org/10.1063/1.1800282
Appl. Phys. Lett. 85, 2965–2967 (2004) https://doi.org/10.1063/1.1801680

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 2968–2970 (2004) https://doi.org/10.1063/1.1802383
Appl. Phys. Lett. 85, 2971–2973 (2004) https://doi.org/10.1063/1.1801687

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 2974–2976 (2004) https://doi.org/10.1063/1.1802387
Appl. Phys. Lett. 85, 2977–2979 (2004) https://doi.org/10.1063/1.1800290
Appl. Phys. Lett. 85, 2980–2982 (2004) https://doi.org/10.1063/1.1804601

ERRATA

Appl. Phys. Lett. 85, 2983 (2004) https://doi.org/10.1063/1.1807416
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