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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 85, 2157–2159 (2004) https://doi.org/10.1063/1.1792796
Appl. Phys. Lett. 85, 2160–2162 (2004) https://doi.org/10.1063/1.1793336
Appl. Phys. Lett. 85, 2163–2165 (2004) https://doi.org/10.1063/1.1795351
Appl. Phys. Lett. 85, 2166–2168 (2004) https://doi.org/10.1063/1.1793340
Appl. Phys. Lett. 85, 2169–2171 (2004) https://doi.org/10.1063/1.1795982
Appl. Phys. Lett. 85, 2172–2174 (2004) https://doi.org/10.1063/1.1793356
Appl. Phys. Lett. 85, 2175–2177 (2004) https://doi.org/10.1063/1.1796525
Appl. Phys. Lett. 85, 2178–2180 (2004) https://doi.org/10.1063/1.1791341
Appl. Phys. Lett. 85, 2181–2183 (2004) https://doi.org/10.1063/1.1796533
Appl. Phys. Lett. 85, 2184–2186 (2004) https://doi.org/10.1063/1.1794382
Appl. Phys. Lett. 85, 2187–2189 (2004) https://doi.org/10.1063/1.1791330
Appl. Phys. Lett. 85, 2190–2192 (2004) https://doi.org/10.1063/1.1797562
Appl. Phys. Lett. 85, 2193–2195 (2004) https://doi.org/10.1063/1.1794854
Appl. Phys. Lett. 85, 2196–2198 (2004) https://doi.org/10.1063/1.1794862

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 85, 2199–2201 (2004) https://doi.org/10.1063/1.1785280
Appl. Phys. Lett. 85, 2202–2204 (2004) https://doi.org/10.1063/1.1792795

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 85, 2205–2207 (2004) https://doi.org/10.1063/1.1790028
Appl. Phys. Lett. 85, 2208–2210 (2004) https://doi.org/10.1063/1.1792797
Appl. Phys. Lett. 85, 2211–2213 (2004) https://doi.org/10.1063/1.1790030
Appl. Phys. Lett. 85, 2214–2216 (2004) https://doi.org/10.1063/1.1790037
Appl. Phys. Lett. 85, 2217–2219 (2004) https://doi.org/10.1063/1.1793338
Appl. Phys. Lett. 85, 2220–2222 (2004) https://doi.org/10.1063/1.1793339
Appl. Phys. Lett. 85, 2223–2225 (2004) https://doi.org/10.1063/1.1790600
Appl. Phys. Lett. 85, 2226–2228 (2004) https://doi.org/10.1063/1.1796524
Appl. Phys. Lett. 85, 2229–2231 (2004) https://doi.org/10.1063/1.1794370
Appl. Phys. Lett. 85, 2232–2234 (2004) https://doi.org/10.1063/1.1794373
Appl. Phys. Lett. 85, 2235–2237 (2004) https://doi.org/10.1063/1.1791324
Appl. Phys. Lett. 85, 2238–2240 (2004) https://doi.org/10.1063/1.1791332
Appl. Phys. Lett. 85, 2241–2243 (2004) https://doi.org/10.1063/1.1786661
Appl. Phys. Lett. 85, 2244–2246 (2004) https://doi.org/10.1063/1.1797563
Appl. Phys. Lett. 85, 2247–2249 (2004) https://doi.org/10.1063/1.1794868
Appl. Phys. Lett. 85, 2250–2252 (2004) https://doi.org/10.1063/1.1791739
Appl. Phys. Lett. 85, 2253–2255 (2004) https://doi.org/10.1063/1.1791741

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 85, 2256–2258 (2004) https://doi.org/10.1063/1.1793337
Appl. Phys. Lett. 85, 2259–2261 (2004) https://doi.org/10.1063/1.1790592
Appl. Phys. Lett. 85, 2262–2264 (2004) https://doi.org/10.1063/1.1795974
Appl. Phys. Lett. 85, 2265–2267 (2004) https://doi.org/10.1063/1.1793347
Appl. Phys. Lett. 85, 2268–2270 (2004) https://doi.org/10.1063/1.1793352
Appl. Phys. Lett. 85, 2271–2273 (2004) https://doi.org/10.1063/1.1796521
Appl. Phys. Lett. 85, 2274–2276 (2004) https://doi.org/10.1063/1.1794351
Appl. Phys. Lett. 85, 2277–2279 (2004) https://doi.org/10.1063/1.1781750
Appl. Phys. Lett. 85, 2280–2282 (2004) https://doi.org/10.1063/1.1794853
Appl. Phys. Lett. 85, 2283–2285 (2004) https://doi.org/10.1063/1.1794857

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 85, 2286–2288 (2004) https://doi.org/10.1063/1.1792791
Appl. Phys. Lett. 85, 2289–2291 (2004) https://doi.org/10.1063/1.1792798
Appl. Phys. Lett. 85, 2292–2294 (2004) https://doi.org/10.1063/1.1792799
Appl. Phys. Lett. 85, 2295–2297 (2004) https://doi.org/10.1063/1.1793334
Appl. Phys. Lett. 85, 2298–2300 (2004) https://doi.org/10.1063/1.1793345
Appl. Phys. Lett. 85, 2301–2303 (2004) https://doi.org/10.1063/1.1794376
Appl. Phys. Lett. 85, 2304–2306 (2004) https://doi.org/10.1063/1.1794380
Appl. Phys. Lett. 85, 2307–2309 (2004) https://doi.org/10.1063/1.1791732
Appl. Phys. Lett. 85, 2310–2312 (2004) https://doi.org/10.1063/1.1794851

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 85, 2313–2315 (2004) https://doi.org/10.1063/1.1793353
Appl. Phys. Lett. 85, 2316–2318 (2004) https://doi.org/10.1063/1.1790604
Appl. Phys. Lett. 85, 2319–2321 (2004) https://doi.org/10.1063/1.1794352
Appl. Phys. Lett. 85, 2322–2324 (2004) https://doi.org/10.1063/1.1794354
Appl. Phys. Lett. 85, 2325–2327 (2004) https://doi.org/10.1063/1.1794355
Appl. Phys. Lett. 85, 2328–2330 (2004) https://doi.org/10.1063/1.1794865
Appl. Phys. Lett. 85, 2331–2333 (2004) https://doi.org/10.1063/1.1794867
Appl. Phys. Lett. 85, 2334–2336 (2004) https://doi.org/10.1063/1.1794849

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 85, 2337–2339 (2004) https://doi.org/10.1063/1.1792792
Appl. Phys. Lett. 85, 2340–2342 (2004) https://doi.org/10.1063/1.1792793
Appl. Phys. Lett. 85, 2343–2345 (2004) https://doi.org/10.1063/1.1790039
Appl. Phys. Lett. 85, 2346–2348 (2004) https://doi.org/10.1063/1.1793343
Appl. Phys. Lett. 85, 2349–2351 (2004) https://doi.org/10.1063/1.1793348
Appl. Phys. Lett. 85, 2352–2354 (2004) https://doi.org/10.1063/1.1794369
Appl. Phys. Lett. 85, 2355–2357 (2004) https://doi.org/10.1063/1.1791340
Appl. Phys. Lett. 85, 2358–2360 (2004) https://doi.org/10.1063/1.1791322
Appl. Phys. Lett. 85, 2361–2363 (2004) https://doi.org/10.1063/1.1791326
Appl. Phys. Lett. 85, 2364–2366 (2004) https://doi.org/10.1063/1.1794356
Appl. Phys. Lett. 85, 2367–2369 (2004) https://doi.org/10.1063/1.1794850
Appl. Phys. Lett. 85, 2370–2372 (2004) https://doi.org/10.1063/1.1794855
Appl. Phys. Lett. 85, 2373–2375 (2004) https://doi.org/10.1063/1.1794856
Appl. Phys. Lett. 85, 2376–2378 (2004) https://doi.org/10.1063/1.1792374
Appl. Phys. Lett. 85, 2379–2381 (2004) https://doi.org/10.1063/1.1784872

DEVICE PHYSICS

Appl. Phys. Lett. 85, 2382–2384 (2004) https://doi.org/10.1063/1.1795367
Appl. Phys. Lett. 85, 2385–2387 (2004) https://doi.org/10.1063/1.1793344
Appl. Phys. Lett. 85, 2388–2389 (2004) https://doi.org/10.1063/1.1793349
Appl. Phys. Lett. 85, 2390–2392 (2004) https://doi.org/10.1063/1.1796520
Appl. Phys. Lett. 85, 2393–2395 (2004) https://doi.org/10.1063/1.1794374
Appl. Phys. Lett. 85, 2396–2398 (2004) https://doi.org/10.1063/1.1796530
Appl. Phys. Lett. 85, 2399–2401 (2004) https://doi.org/10.1063/1.1796534
Appl. Phys. Lett. 85, 2402–2404 (2004) https://doi.org/10.1063/1.1788888
Appl. Phys. Lett. 85, 2405–2407 (2004) https://doi.org/10.1063/1.1792372

APPLIED BIOPHYSICS

Appl. Phys. Lett. 85, 2408–2410 (2004) https://doi.org/10.1063/1.1790075
Appl. Phys. Lett. 85, 2411–2413 (2004) https://doi.org/10.1063/1.1794372
Appl. Phys. Lett. 85, 2414–2416 (2004) https://doi.org/10.1063/1.1791325
Appl. Phys. Lett. 85, 2417–2419 (2004) https://doi.org/10.1063/1.1794381
Appl. Phys. Lett. 85, 2420–2422 (2004) https://doi.org/10.1063/1.1791329
Appl. Phys. Lett. 85, 2423–2425 (2004) https://doi.org/10.1063/1.1791731

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 85, 2426–2428 (2004) https://doi.org/10.1063/1.1793342
Appl. Phys. Lett. 85, 2429–2431 (2004) https://doi.org/10.1063/1.1793350
Appl. Phys. Lett. 85, 2432–2434 (2004) https://doi.org/10.1063/1.1791328
Appl. Phys. Lett. 85, 2435–2437 (2004) https://doi.org/10.1063/1.1791331
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