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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 84, 1233–1235 (2004) https://doi.org/10.1063/1.1649816
Appl. Phys. Lett. 84, 1236–1238 (2004) https://doi.org/10.1063/1.1649801
Appl. Phys. Lett. 84, 1239–1241 (2004) https://doi.org/10.1063/1.1644913
Appl. Phys. Lett. 84, 1242–1244 (2004) https://doi.org/10.1063/1.1649803
Appl. Phys. Lett. 84, 1245–1247 (2004) https://doi.org/10.1063/1.1649800
Appl. Phys. Lett. 84, 1248–1250 (2004) https://doi.org/10.1063/1.1650550
Appl. Phys. Lett. 84, 1251–1253 (2004) https://doi.org/10.1063/1.1650543
Appl. Phys. Lett. 84, 1254–1256 (2004) https://doi.org/10.1063/1.1649815
Appl. Phys. Lett. 84, 1257–1259 (2004) https://doi.org/10.1063/1.1649799
Appl. Phys. Lett. 84, 1260–1262 (2004) https://doi.org/10.1063/1.1650032
Appl. Phys. Lett. 84, 1263–1265 (2004) https://doi.org/10.1063/1.1650042
Appl. Phys. Lett. 84, 1266–1268 (2004) https://doi.org/10.1063/1.1650905

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 84, 1269–1271 (2004) https://doi.org/10.1063/1.1647272

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 84, 1272–1274 (2004) https://doi.org/10.1063/1.1649797
Appl. Phys. Lett. 84, 1275–1277 (2004) https://doi.org/10.1063/1.1642277
Appl. Phys. Lett. 84, 1278–1280 (2004) https://doi.org/10.1063/1.1650555
Appl. Phys. Lett. 84, 1281–1283 (2004) https://doi.org/10.1063/1.1650545
Appl. Phys. Lett. 84, 1284–1286 (2004) https://doi.org/10.1063/1.1650552
Appl. Phys. Lett. 84, 1287–1289 (2004) https://doi.org/10.1063/1.1650037
Appl. Phys. Lett. 84, 1290–1292 (2004) https://doi.org/10.1063/1.1650548
Appl. Phys. Lett. 84, 1293–1295 (2004) https://doi.org/10.1063/1.1650873
Appl. Phys. Lett. 84, 1296–1298 (2004) https://doi.org/10.1063/1.1650908
Appl. Phys. Lett. 84, 1299–1301 (2004) https://doi.org/10.1063/1.1650045

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 84, 1302–1304 (2004) https://doi.org/10.1063/1.1648136
Appl. Phys. Lett. 84, 1305–1307 (2004) https://doi.org/10.1063/1.1645984
Appl. Phys. Lett. 84, 1308–1310 (2004) https://doi.org/10.1063/1.1649813
Appl. Phys. Lett. 84, 1311–1313 (2004) https://doi.org/10.1063/1.1649822
Appl. Phys. Lett. 84, 1314–1316 (2004) https://doi.org/10.1063/1.1649819
Appl. Phys. Lett. 84, 1317–1319 (2004) https://doi.org/10.1063/1.1650910
Appl. Phys. Lett. 84, 1320–1322 (2004) https://doi.org/10.1063/1.1650553
Appl. Phys. Lett. 84, 1323–1325 (2004) https://doi.org/10.1063/1.1650036
Appl. Phys. Lett. 84, 1326–1328 (2004) https://doi.org/10.1063/1.1650038
Appl. Phys. Lett. 84, 1329–1331 (2004) https://doi.org/10.1063/1.1650544

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 84, 1332–1334 (2004) https://doi.org/10.1063/1.1650041
Appl. Phys. Lett. 84, 1335–1337 (2004) https://doi.org/10.1063/1.1650902
Appl. Phys. Lett. 84, 1338–1340 (2004) https://doi.org/10.1063/1.1650915

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 84, 1341–1343 (2004) https://doi.org/10.1063/1.1649820
Appl. Phys. Lett. 84, 1344–1346 (2004) https://doi.org/10.1063/1.1650039
Appl. Phys. Lett. 84, 1347–1349 (2004) https://doi.org/10.1063/1.1649821
Appl. Phys. Lett. 84, 1350–1352 (2004) https://doi.org/10.1063/1.1650916
Appl. Phys. Lett. 84, 1353–1355 (2004) https://doi.org/10.1063/1.1650547

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 84, 1356–1358 (2004) https://doi.org/10.1063/1.1650556
Appl. Phys. Lett. 84, 1359–1361 (2004) https://doi.org/10.1063/1.1647281
Appl. Phys. Lett. 84, 1362–1364 (2004) https://doi.org/10.1063/1.1647280
Appl. Phys. Lett. 84, 1365–1367 (2004) https://doi.org/10.1063/1.1644921
Appl. Phys. Lett. 84, 1368–1370 (2004) https://doi.org/10.1063/1.1650554
Appl. Phys. Lett. 84, 1371–1373 (2004) https://doi.org/10.1063/1.1649798
Appl. Phys. Lett. 84, 1374–1376 (2004) https://doi.org/10.1063/1.1650546
Appl. Phys. Lett. 84, 1377–1379 (2004) https://doi.org/10.1063/1.1650043
Appl. Phys. Lett. 84, 1380–1382 (2004) https://doi.org/10.1063/1.1650044
Appl. Phys. Lett. 84, 1383–1385 (2004) https://doi.org/10.1063/1.1650872
Appl. Phys. Lett. 84, 1386–1388 (2004) https://doi.org/10.1063/1.1646750
Appl. Phys. Lett. 84, 1389–1391 (2004) https://doi.org/10.1063/1.1650877
Appl. Phys. Lett. 84, 1392–1394 (2004) https://doi.org/10.1063/1.1648139

DEVICE PHYSICS

Appl. Phys. Lett. 84, 1395–1397 (2004) https://doi.org/10.1063/1.1650551
Appl. Phys. Lett. 84, 1398–1400 (2004) https://doi.org/10.1063/1.1650033
Appl. Phys. Lett. 84, 1401–1403 (2004) https://doi.org/10.1063/1.1646730
Appl. Phys. Lett. 84, 1404–1406 (2004) https://doi.org/10.1063/1.1646726
Appl. Phys. Lett. 84, 1407–1409 (2004) https://doi.org/10.1063/1.1650040

APPLIED BIOPHYSICS

Appl. Phys. Lett. 84, 1410–1412 (2004) https://doi.org/10.1063/1.1646757

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 84, 1413–1415 (2004) https://doi.org/10.1063/1.1649814
Appl. Phys. Lett. 84, 1416–1418 (2004) https://doi.org/10.1063/1.1650904
Appl. Phys. Lett. 84, 1419–1421 (2004) https://doi.org/10.1063/1.1650914
Appl. Phys. Lett. 84, 1422–1424 (2004) https://doi.org/10.1063/1.1650034

COMMENTS

Appl. Phys. Lett. 84, 1425–1426 (2004) https://doi.org/10.1063/1.1650903
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