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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 84, 837–839 (2004) https://doi.org/10.1063/1.1645660
Appl. Phys. Lett. 84, 840–842 (2004) https://doi.org/10.1063/1.1645662
Appl. Phys. Lett. 84, 843–845 (2004) https://doi.org/10.1063/1.1645663
Appl. Phys. Lett. 84, 846–848 (2004) https://doi.org/10.1063/1.1645675
Appl. Phys. Lett. 84, 849–851 (2004) https://doi.org/10.1063/1.1645661
Appl. Phys. Lett. 84, 852–854 (2004) https://doi.org/10.1063/1.1645990
Appl. Phys. Lett. 84, 855–857 (2004) https://doi.org/10.1063/1.1645992
Appl. Phys. Lett. 84, 858–860 (2004) https://doi.org/10.1063/1.1645995
Appl. Phys. Lett. 84, 861–863 (2004) https://doi.org/10.1063/1.1646459

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 84, 864–866 (2004) https://doi.org/10.1063/1.1646458

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 84, 867–869 (2004) https://doi.org/10.1063/1.1645667
Appl. Phys. Lett. 84, 870–872 (2004) https://doi.org/10.1063/1.1644639
Appl. Phys. Lett. 84, 873–875 (2004) https://doi.org/10.1063/1.1645666
Appl. Phys. Lett. 84, 876–878 (2004) https://doi.org/10.1063/1.1644623
Appl. Phys. Lett. 84, 879–881 (2004) https://doi.org/10.1063/1.1646221
Appl. Phys. Lett. 84, 882–884 (2004) https://doi.org/10.1063/1.1645987
Appl. Phys. Lett. 84, 885–887 (2004) https://doi.org/10.1063/1.1644627
Appl. Phys. Lett. 84, 888–890 (2004) https://doi.org/10.1063/1.1645324
Appl. Phys. Lett. 84, 891–893 (2004) https://doi.org/10.1063/1.1644046
Appl. Phys. Lett. 84, 894–896 (2004) https://doi.org/10.1063/1.1645981
Appl. Phys. Lett. 84, 897–899 (2004) https://doi.org/10.1063/1.1645668
Appl. Phys. Lett. 84, 900–902 (2004) https://doi.org/10.1063/1.1645991
Appl. Phys. Lett. 84, 903–905 (2004) https://doi.org/10.1063/1.1646215
Appl. Phys. Lett. 84, 906–908 (2004) https://doi.org/10.1063/1.1645677
Appl. Phys. Lett. 84, 909–911 (2004) https://doi.org/10.1063/1.1646460
Appl. Phys. Lett. 84, 912–914 (2004) https://doi.org/10.1063/1.1646222
Appl. Phys. Lett. 84, 915–917 (2004) https://doi.org/10.1063/1.1646765
Appl. Phys. Lett. 84, 918–920 (2004) https://doi.org/10.1063/1.1646728

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 84, 921–923 (2004) https://doi.org/10.1063/1.1645982
Appl. Phys. Lett. 84, 924–926 (2004) https://doi.org/10.1063/1.1646457
Appl. Phys. Lett. 84, 927–929 (2004) https://doi.org/10.1063/1.1645986
Appl. Phys. Lett. 84, 930–932 (2004) https://doi.org/10.1063/1.1639513
Appl. Phys. Lett. 84, 933–935 (2004) https://doi.org/10.1063/1.1646466

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 84, 936–938 (2004) https://doi.org/10.1063/1.1645330
Appl. Phys. Lett. 84, 939–941 (2004) https://doi.org/10.1063/1.1646223
Appl. Phys. Lett. 84, 942–944 (2004) https://doi.org/10.1063/1.1646212
Appl. Phys. Lett. 84, 945–947 (2004) https://doi.org/10.1063/1.1646211
Appl. Phys. Lett. 84, 948–950 (2004) https://doi.org/10.1063/1.1644613
Appl. Phys. Lett. 84, 951–953 (2004) https://doi.org/10.1063/1.1640451

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 84, 954–956 (2004) https://doi.org/10.1063/1.1644056
Appl. Phys. Lett. 84, 957–959 (2004) https://doi.org/10.1063/1.1646216

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 84, 960–962 (2004) https://doi.org/10.1063/1.1645664
Appl. Phys. Lett. 84, 963–965 (2004) https://doi.org/10.1063/1.1644624
Appl. Phys. Lett. 84, 966–968 (2004) https://doi.org/10.1063/1.1644619
Appl. Phys. Lett. 84, 969–971 (2004) https://doi.org/10.1063/1.1646456
Appl. Phys. Lett. 84, 972–974 (2004) https://doi.org/10.1063/1.1646213
Appl. Phys. Lett. 84, 975–977 (2004) https://doi.org/10.1063/1.1646453
Appl. Phys. Lett. 84, 978–980 (2004) https://doi.org/10.1063/1.1646455
Appl. Phys. Lett. 84, 981–983 (2004) https://doi.org/10.1063/1.1646462
Appl. Phys. Lett. 84, 984–986 (2004) https://doi.org/10.1063/1.1645985
Appl. Phys. Lett. 84, 987–989 (2004) https://doi.org/10.1063/1.1646756
Appl. Phys. Lett. 84, 990–992 (2004) https://doi.org/10.1063/1.1646465
Appl. Phys. Lett. 84, 993–995 (2004) https://doi.org/10.1063/1.1646761

DEVICE PHYSICS

Appl. Phys. Lett. 84, 996–998 (2004) https://doi.org/10.1063/1.1644914
Appl. Phys. Lett. 84, 999–1001 (2004) https://doi.org/10.1063/1.1644611
Appl. Phys. Lett. 84, 1002–1003 (2004) https://doi.org/10.1063/1.1646454
Appl. Phys. Lett. 84, 1004–1006 (2004) https://doi.org/10.1063/1.1645993

APPLIED BIOPHYSICS

Appl. Phys. Lett. 84, 1007–1009 (2004) https://doi.org/10.1063/1.1644909
Appl. Phys. Lett. 84, 1010–1012 (2004) https://doi.org/10.1063/1.1646224

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 84, 1013–1015 (2004) https://doi.org/10.1063/1.1644916
Appl. Phys. Lett. 84, 1016–1018 (2004) https://doi.org/10.1063/1.1646225
Appl. Phys. Lett. 84, 1019–1021 (2004) https://doi.org/10.1063/1.1646219
Appl. Phys. Lett. 84, 1022–1024 (2004) https://doi.org/10.1063/1.1645315
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