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STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 84, 4599–4601 (2004) https://doi.org/10.1063/1.1734683
Appl. Phys. Lett. 84, 4653–4655 (2004) https://doi.org/10.1063/1.1759768
Appl. Phys. Lett. 84, 4661–4662 (2004) https://doi.org/10.1063/1.1759773
Appl. Phys. Lett. 84, 4738–4740 (2004) https://doi.org/10.1063/1.1759772
Appl. Phys. Lett. 84, 4747–4749 (2004) https://doi.org/10.1063/1.1760214
Appl. Phys. Lett. 84, 4756–4758 (2004) https://doi.org/10.1063/1.1751224
Appl. Phys. Lett. 84, 4759–4761 (2004) https://doi.org/10.1063/1.1755837
Appl. Phys. Lett. 84, 4768–4770 (2004) https://doi.org/10.1063/1.1758301
Appl. Phys. Lett. 84, 4783–4785 (2004) https://doi.org/10.1063/1.1760223
Appl. Phys. Lett. 84, 4795–4797 (2004) https://doi.org/10.1063/1.1760598
Appl. Phys. Lett. 84, 4807–4809 (2004) https://doi.org/10.1063/1.1762704
Appl. Phys. Lett. 84, 4810–4812 (2004) https://doi.org/10.1063/1.1759385

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 84, 4602–4604 (2004) https://doi.org/10.1063/1.1748840
Appl. Phys. Lett. 84, 4617–4619 (2004) https://doi.org/10.1063/1.1757023
Appl. Phys. Lett. 84, 4626–4628 (2004) https://doi.org/10.1063/1.1759061
Appl. Phys. Lett. 84, 4632–4634 (2004) https://doi.org/10.1063/1.1759371
Appl. Phys. Lett. 84, 4669–4671 (2004) https://doi.org/10.1063/1.1759781
Appl. Phys. Lett. 84, 4681–4683 (2004) https://doi.org/10.1063/1.1760219
Appl. Phys. Lett. 84, 4708–4710 (2004) https://doi.org/10.1063/1.1762702
Appl. Phys. Lett. 84, 4714–4716 (2004) https://doi.org/10.1063/1.1755416
Appl. Phys. Lett. 84, 4723–4725 (2004) https://doi.org/10.1063/1.1759374
Appl. Phys. Lett. 84, 4732–4734 (2004) https://doi.org/10.1063/1.1759386
Appl. Phys. Lett. 84, 4735–4737 (2004) https://doi.org/10.1063/1.1759387
Appl. Phys. Lett. 84, 4774–4776 (2004) https://doi.org/10.1063/1.1759378

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 84, 4605–4607 (2004) https://doi.org/10.1063/1.1751212
Appl. Phys. Lett. 84, 4675–4677 (2004) https://doi.org/10.1063/1.1760211
Appl. Phys. Lett. 84, 4678–4680 (2004) https://doi.org/10.1063/1.1760215
Appl. Phys. Lett. 84, 4684–4686 (2004) https://doi.org/10.1063/1.1760220
Appl. Phys. Lett. 84, 4687–4689 (2004) https://doi.org/10.1063/1.1760222
Appl. Phys. Lett. 84, 4690–4692 (2004) https://doi.org/10.1063/1.1760224
Appl. Phys. Lett. 84, 4693–4695 (2004) https://doi.org/10.1063/1.1760227
Appl. Phys. Lett. 84, 4696–4698 (2004) https://doi.org/10.1063/1.1760592
Appl. Phys. Lett. 84, 4699–4701 (2004) https://doi.org/10.1063/1.1760596
Appl. Phys. Lett. 84, 4726–4728 (2004) https://doi.org/10.1063/1.1759375
Appl. Phys. Lett. 84, 4744–4746 (2004) https://doi.org/10.1063/1.1759779
Appl. Phys. Lett. 84, 4750–4752 (2004) https://doi.org/10.1063/1.1760216
Appl. Phys. Lett. 84, 4753–4755 (2004) https://doi.org/10.1063/1.1760882
Appl. Phys. Lett. 84, 4762–4764 (2004) https://doi.org/10.1063/1.1756202
Appl. Phys. Lett. 84, 4765–4767 (2004) https://doi.org/10.1063/1.1757024
Appl. Phys. Lett. 84, 4780–4782 (2004) https://doi.org/10.1063/1.1760221
Appl. Phys. Lett. 84, 4789–4791 (2004) https://doi.org/10.1063/1.1760226

DEVICE PHYSICS

Appl. Phys. Lett. 84, 4608–4610 (2004) https://doi.org/10.1063/1.1751222
Appl. Phys. Lett. 84, 4611–4613 (2004) https://doi.org/10.1063/1.1755843
Appl. Phys. Lett. 84, 4614–4616 (2004) https://doi.org/10.1063/1.1756674
Appl. Phys. Lett. 84, 4620–4622 (2004) https://doi.org/10.1063/1.1757637
Appl. Phys. Lett. 84, 4641–4643 (2004) https://doi.org/10.1063/1.1759383
Appl. Phys. Lett. 84, 4666–4668 (2004) https://doi.org/10.1063/1.1759780
Appl. Phys. Lett. 84, 4705–4707 (2004) https://doi.org/10.1063/1.1762692
Appl. Phys. Lett. 84, 4786–4788 (2004) https://doi.org/10.1063/1.1760225
Appl. Phys. Lett. 84, 4792–4794 (2004) https://doi.org/10.1063/1.1760595

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 84, 4623–4625 (2004) https://doi.org/10.1063/1.1758296

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 84, 4629–4631 (2004) https://doi.org/10.1063/1.1759065
Appl. Phys. Lett. 84, 4650–4652 (2004) https://doi.org/10.1063/1.1759390
Appl. Phys. Lett. 84, 4711–4713 (2004) https://doi.org/10.1063/1.1762982
Appl. Phys. Lett. 84, 4798–4800 (2004) https://doi.org/10.1063/1.1760889

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 84, 4635–4637 (2004) https://doi.org/10.1063/1.1759372
Appl. Phys. Lett. 84, 4644–4646 (2004) https://doi.org/10.1063/1.1759388
Appl. Phys. Lett. 84, 4663–4665 (2004) https://doi.org/10.1063/1.1759774
Appl. Phys. Lett. 84, 4717–4719 (2004) https://doi.org/10.1063/1.1758300
Appl. Phys. Lett. 84, 4720–4722 (2004) https://doi.org/10.1063/1.1758773
Appl. Phys. Lett. 84, 4771–4773 (2004) https://doi.org/10.1063/1.1758302
Appl. Phys. Lett. 84, 4777–4779 (2004) https://doi.org/10.1063/1.1759777

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 84, 4638–4640 (2004) https://doi.org/10.1063/1.1759379
Appl. Phys. Lett. 84, 4647–4649 (2004) https://doi.org/10.1063/1.1759389
Appl. Phys. Lett. 84, 4656–4657 (2004) https://doi.org/10.1063/1.1759770
Appl. Phys. Lett. 84, 4702–4704 (2004) https://doi.org/10.1063/1.1760597

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 84, 4658–4660 (2004) https://doi.org/10.1063/1.1759771
Appl. Phys. Lett. 84, 4672–4674 (2004) https://doi.org/10.1063/1.1759782
Appl. Phys. Lett. 84, 4729–4731 (2004) https://doi.org/10.1063/1.1759380
Appl. Phys. Lett. 84, 4741–4743 (2004) https://doi.org/10.1063/1.1759775
Appl. Phys. Lett. 84, 4801–4803 (2004) https://doi.org/10.1063/1.1760891
Appl. Phys. Lett. 84, 4804–4806 (2004) https://doi.org/10.1063/1.1762703

COMMENTS

Appl. Phys. Lett. 84, 4813 (2004) https://doi.org/10.1063/1.1762971
Appl. Phys. Lett. 84, 4814 (2004) https://doi.org/10.1063/1.1762972
Appl. Phys. Lett. 84, 4815 (2004) https://doi.org/10.1063/1.1761633

ERRATA

Appl. Phys. Lett. 84, 4816 (2004) https://doi.org/10.1063/1.1763232
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