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Issues

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 84, 3957–3959 (2004) https://doi.org/10.1063/1.1739272
Appl. Phys. Lett. 84, 3975–3977 (2004) https://doi.org/10.1063/1.1751216
Appl. Phys. Lett. 84, 3987–3989 (2004) https://doi.org/10.1063/1.1753057
Appl. Phys. Lett. 84, 4017–4019 (2004) https://doi.org/10.1063/1.1751211
Appl. Phys. Lett. 84, 4116–4118 (2004) https://doi.org/10.1063/1.1755421
Appl. Phys. Lett. 84, 4119–4121 (2004) https://doi.org/10.1063/1.1755424

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 84, 3960–3962 (2004) https://doi.org/10.1063/1.1739512
Appl. Phys. Lett. 84, 3969–3971 (2004) https://doi.org/10.1063/1.1748848
Appl. Phys. Lett. 84, 3981–3983 (2004) https://doi.org/10.1063/1.1751221
Appl. Phys. Lett. 84, 4014–4016 (2004) https://doi.org/10.1063/1.1748846
Appl. Phys. Lett. 84, 4029–4031 (2004) https://doi.org/10.1063/1.1751219
Appl. Phys. Lett. 84, 4041–4043 (2004) https://doi.org/10.1063/1.1751607
Appl. Phys. Lett. 84, 4050–4052 (2004) https://doi.org/10.1063/1.1751613
Appl. Phys. Lett. 84, 4062–4064 (2004) https://doi.org/10.1063/1.1751618
Appl. Phys. Lett. 84, 4071–4073 (2004) https://doi.org/10.1063/1.1751621
Appl. Phys. Lett. 84, 4101–4103 (2004) https://doi.org/10.1063/1.1753066
Appl. Phys. Lett. 84, 4107–4109 (2004) https://doi.org/10.1063/1.1753650

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 84, 3963–3965 (2004) https://doi.org/10.1063/1.1741033
Appl. Phys. Lett. 84, 3972–3974 (2004) https://doi.org/10.1063/1.1748849
Appl. Phys. Lett. 84, 4005–4007 (2004) https://doi.org/10.1063/1.1748842
Appl. Phys. Lett. 84, 4008–4010 (2004) https://doi.org/10.1063/1.1748844
Appl. Phys. Lett. 84, 4023–4025 (2004) https://doi.org/10.1063/1.1751214
Appl. Phys. Lett. 84, 4035–4037 (2004) https://doi.org/10.1063/1.1751226
Appl. Phys. Lett. 84, 4038–4040 (2004) https://doi.org/10.1063/1.1751228
Appl. Phys. Lett. 84, 4047–4049 (2004) https://doi.org/10.1063/1.1751612
Appl. Phys. Lett. 84, 4056–4058 (2004) https://doi.org/10.1063/1.1751616
Appl. Phys. Lett. 84, 4074–4076 (2004) https://doi.org/10.1063/1.1751622
Appl. Phys. Lett. 84, 4077–4079 (2004) https://doi.org/10.1063/1.1751624
Appl. Phys. Lett. 84, 4086–4088 (2004) https://doi.org/10.1063/1.1753054
Appl. Phys. Lett. 84, 4095–4097 (2004) https://doi.org/10.1063/1.1753059
Appl. Phys. Lett. 84, 4098–4100 (2004) https://doi.org/10.1063/1.1753061
Appl. Phys. Lett. 84, 4113–4115 (2004) https://doi.org/10.1063/1.1753654

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 84, 3966–3968 (2004) https://doi.org/10.1063/1.1745107
Appl. Phys. Lett. 84, 3999–4001 (2004) https://doi.org/10.1063/1.1738939

DEVICE PHYSICS

Appl. Phys. Lett. 84, 3978–3980 (2004) https://doi.org/10.1063/1.1751218
Appl. Phys. Lett. 84, 4032–4034 (2004) https://doi.org/10.1063/1.1751220
Appl. Phys. Lett. 84, 4059–4061 (2004) https://doi.org/10.1063/1.1751617
Appl. Phys. Lett. 84, 4092–4094 (2004) https://doi.org/10.1063/1.1753056

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 84, 3984–3986 (2004) https://doi.org/10.1063/1.1751611
Appl. Phys. Lett. 84, 3990–3992 (2004) https://doi.org/10.1063/1.1753060
Appl. Phys. Lett. 84, 4002–4004 (2004) https://doi.org/10.1063/1.1748841
Appl. Phys. Lett. 84, 4044–4046 (2004) https://doi.org/10.1063/1.1751610
Appl. Phys. Lett. 84, 4068–4070 (2004) https://doi.org/10.1063/1.1751620
Appl. Phys. Lett. 84, 4080–4082 (2004) https://doi.org/10.1063/1.1753051
Appl. Phys. Lett. 84, 4083–4085 (2004) https://doi.org/10.1063/1.1753052
Appl. Phys. Lett. 84, 4104–4106 (2004) https://doi.org/10.1063/1.1753068

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 84, 3993–3995 (2004) https://doi.org/10.1063/1.1753065
Appl. Phys. Lett. 84, 3996–3998 (2004) https://doi.org/10.1063/1.1738175
Appl. Phys. Lett. 84, 4011–4013 (2004) https://doi.org/10.1063/1.1748845
Appl. Phys. Lett. 84, 4026–4028 (2004) https://doi.org/10.1063/1.1751215
Appl. Phys. Lett. 84, 4053–4055 (2004) https://doi.org/10.1063/1.1751615
Appl. Phys. Lett. 84, 4110–4112 (2004) https://doi.org/10.1063/1.1753653

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 84, 4020–4022 (2004) https://doi.org/10.1063/1.1751213
Appl. Phys. Lett. 84, 4065–4067 (2004) https://doi.org/10.1063/1.1751619
Appl. Phys. Lett. 84, 4089–4091 (2004) https://doi.org/10.1063/1.1753055
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