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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 84, 3223–3225 (2004) https://doi.org/10.1063/1.1713034
Appl. Phys. Lett. 84, 3226–3228 (2004) https://doi.org/10.1063/1.1723691
Appl. Phys. Lett. 84, 3229–3231 (2004) https://doi.org/10.1063/1.1715155
Appl. Phys. Lett. 84, 3232–3234 (2004) https://doi.org/10.1063/1.1728304
Appl. Phys. Lett. 84, 3235–3237 (2004) https://doi.org/10.1063/1.1728318
Appl. Phys. Lett. 84, 3238–3240 (2004) https://doi.org/10.1063/1.1715144
Appl. Phys. Lett. 84, 3241–3243 (2004) https://doi.org/10.1063/1.1734681
Appl. Phys. Lett. 84, 3244–3246 (2004) https://doi.org/10.1063/1.1719279
Appl. Phys. Lett. 84, 3247–3249 (2004) https://doi.org/10.1063/1.1728321
Appl. Phys. Lett. 84, 3250–3252 (2004) https://doi.org/10.1063/1.1728303
Appl. Phys. Lett. 84, 3253–3255 (2004) https://doi.org/10.1063/1.1715146
Appl. Phys. Lett. 84, 3256–3258 (2004) https://doi.org/10.1063/1.1715149
Appl. Phys. Lett. 84, 3259–3261 (2004) https://doi.org/10.1063/1.1715148
Appl. Phys. Lett. 84, 3262–3264 (2004) https://doi.org/10.1063/1.1712029
Appl. Phys. Lett. 84, 3265–3267 (2004) https://doi.org/10.1063/1.1719278
Appl. Phys. Lett. 84, 3268–3270 (2004) https://doi.org/10.1063/1.1719277
Appl. Phys. Lett. 84, 3271–3273 (2004) https://doi.org/10.1063/1.1719271
Appl. Phys. Lett. 84, 3274–3276 (2004) https://doi.org/10.1063/1.1734686
Appl. Phys. Lett. 84, 3277–3279 (2004) https://doi.org/10.1063/1.1719259
Appl. Phys. Lett. 84, 3280–3282 (2004) https://doi.org/10.1063/1.1723692

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 84, 3283–3285 (2004) https://doi.org/10.1063/1.1715140

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 84, 3286–3288 (2004) https://doi.org/10.1063/1.1723699
Appl. Phys. Lett. 84, 3289–3291 (2004) https://doi.org/10.1063/1.1715154
Appl. Phys. Lett. 84, 3292–3294 (2004) https://doi.org/10.1063/1.1728299
Appl. Phys. Lett. 84, 3295–3297 (2004) https://doi.org/10.1063/1.1715150
Appl. Phys. Lett. 84, 3298–3300 (2004) https://doi.org/10.1063/1.1728300

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 84, 3301–3303 (2004) https://doi.org/10.1063/1.1723695
Appl. Phys. Lett. 84, 3304–3306 (2004) https://doi.org/10.1063/1.1719274
Appl. Phys. Lett. 84, 3307–3309 (2004) https://doi.org/10.1063/1.1728302
Appl. Phys. Lett. 84, 3310–3312 (2004) https://doi.org/10.1063/1.1728322
Appl. Phys. Lett. 84, 3313–3315 (2004) https://doi.org/10.1063/1.1736316
Appl. Phys. Lett. 84, 3316–3318 (2004) https://doi.org/10.1063/1.1734688
Appl. Phys. Lett. 84, 3319–3321 (2004) https://doi.org/10.1063/1.1719275
Appl. Phys. Lett. 84, 3322–3324 (2004) https://doi.org/10.1063/1.1719281
Appl. Phys. Lett. 84, 3325–3327 (2004) https://doi.org/10.1063/1.1711179

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 84, 3328–3330 (2004) https://doi.org/10.1063/1.1723698
Appl. Phys. Lett. 84, 3331–3333 (2004) https://doi.org/10.1063/1.1715142
Appl. Phys. Lett. 84, 3334–3336 (2004) https://doi.org/10.1063/1.1719273
Appl. Phys. Lett. 84, 3337–3339 (2004) https://doi.org/10.1063/1.1723694
Appl. Phys. Lett. 84, 3340–3342 (2004) https://doi.org/10.1063/1.1703842
Appl. Phys. Lett. 84, 3343–3345 (2004) https://doi.org/10.1063/1.1737060

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 84, 3346–3348 (2004) https://doi.org/10.1063/1.1702129
Appl. Phys. Lett. 84, 3349–3351 (2004) https://doi.org/10.1063/1.1715151
Appl. Phys. Lett. 84, 3352–3354 (2004) https://doi.org/10.1063/1.1734685

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 84, 3355–3357 (2004) https://doi.org/10.1063/1.1713049
Appl. Phys. Lett. 84, 3358–3360 (2004) https://doi.org/10.1063/1.1723696
Appl. Phys. Lett. 84, 3361–3363 (2004) https://doi.org/10.1063/1.1723687
Appl. Phys. Lett. 84, 3364–3366 (2004) https://doi.org/10.1063/1.1723688
Appl. Phys. Lett. 84, 3367–3369 (2004) https://doi.org/10.1063/1.1702134
Appl. Phys. Lett. 84, 3370–3372 (2004) https://doi.org/10.1063/1.1734687
Appl. Phys. Lett. 84, 3373–3375 (2004) https://doi.org/10.1063/1.1728320
Appl. Phys. Lett. 84, 3376–3378 (2004) https://doi.org/10.1063/1.1728298
Appl. Phys. Lett. 84, 3379–3381 (2004) https://doi.org/10.1063/1.1710731
Appl. Phys. Lett. 84, 3382–3384 (2004) https://doi.org/10.1063/1.1715141
Appl. Phys. Lett. 84, 3385–3387 (2004) https://doi.org/10.1063/1.1715147
Appl. Phys. Lett. 84, 3388–3390 (2004) https://doi.org/10.1063/1.1705724
Appl. Phys. Lett. 84, 3391–3393 (2004) https://doi.org/10.1063/1.1736317

DEVICE PHYSICS

Appl. Phys. Lett. 84, 3394–3396 (2004) https://doi.org/10.1063/1.1728307
Appl. Phys. Lett. 84, 3397–3399 (2004) https://doi.org/10.1063/1.1723685
Appl. Phys. Lett. 84, 3400–3402 (2004) https://doi.org/10.1063/1.1710716
Appl. Phys. Lett. 84, 3403–3405 (2004) https://doi.org/10.1063/1.1734682
Appl. Phys. Lett. 84, 3406–3408 (2004) https://doi.org/10.1063/1.1723693
Appl. Phys. Lett. 84, 3409–3411 (2004) https://doi.org/10.1063/1.1737069

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 84, 3412–3414 (2004) https://doi.org/10.1063/1.1686890
Appl. Phys. Lett. 84, 3415–3417 (2004) https://doi.org/10.1063/1.1695202
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