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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 84, 2013–2015 (2004) https://doi.org/10.1063/1.1682678
Appl. Phys. Lett. 84, 2016–2018 (2004) https://doi.org/10.1063/1.1687981
Appl. Phys. Lett. 84, 2019–2021 (2004) https://doi.org/10.1063/1.1669062
Appl. Phys. Lett. 84, 2022–2024 (2004) https://doi.org/10.1063/1.1688450
Appl. Phys. Lett. 84, 2025–2027 (2004) https://doi.org/10.1063/1.1689395
Appl. Phys. Lett. 84, 2028–2030 (2004) https://doi.org/10.1063/1.1688456
Appl. Phys. Lett. 84, 2031–2033 (2004) https://doi.org/10.1063/1.1688981
Appl. Phys. Lett. 84, 2034–2036 (2004) https://doi.org/10.1063/1.1688983
Appl. Phys. Lett. 84, 2037–2039 (2004) https://doi.org/10.1063/1.1686894
Appl. Phys. Lett. 84, 2040–2042 (2004) https://doi.org/10.1063/1.1688001
Appl. Phys. Lett. 84, 2043–2045 (2004) https://doi.org/10.1063/1.1688976
Appl. Phys. Lett. 84, 2046–2048 (2004) https://doi.org/10.1063/1.1688004
Appl. Phys. Lett. 84, 2049–2051 (2004) https://doi.org/10.1063/1.1688977

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 84, 2052–2054 (2004) https://doi.org/10.1063/1.1666997
Appl. Phys. Lett. 84, 2055–2057 (2004) https://doi.org/10.1063/1.1682697
Appl. Phys. Lett. 84, 2058–2060 (2004) https://doi.org/10.1063/1.1669067
Appl. Phys. Lett. 84, 2061–2063 (2004) https://doi.org/10.1063/1.1667260
Appl. Phys. Lett. 84, 2064–2066 (2004) https://doi.org/10.1063/1.1667621
Appl. Phys. Lett. 84, 2067–2069 (2004) https://doi.org/10.1063/1.1669060
Appl. Phys. Lett. 84, 2070–2072 (2004) https://doi.org/10.1063/1.1650031
Appl. Phys. Lett. 84, 2073–2075 (2004) https://doi.org/10.1063/1.1669081
Appl. Phys. Lett. 84, 2076–2078 (2004) https://doi.org/10.1063/1.1688984
Appl. Phys. Lett. 84, 2079–2081 (2004) https://doi.org/10.1063/1.1687456
Appl. Phys. Lett. 84, 2082–2084 (2004) https://doi.org/10.1063/1.1689749

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 84, 2085–2087 (2004) https://doi.org/10.1063/1.1666994
Appl. Phys. Lett. 84, 2088–2090 (2004) https://doi.org/10.1063/1.1682680
Appl. Phys. Lett. 84, 2091–2093 (2004) https://doi.org/10.1063/1.1688454
Appl. Phys. Lett. 84, 2094–2096 (2004) https://doi.org/10.1063/1.1675924
Appl. Phys. Lett. 84, 2097–2099 (2004) https://doi.org/10.1063/1.1687984
Appl. Phys. Lett. 84, 2100–2102 (2004) https://doi.org/10.1063/1.1688997
Appl. Phys. Lett. 84, 2103–2105 (2004) https://doi.org/10.1063/1.1689400
Appl. Phys. Lett. 84, 2106–2108 (2004) https://doi.org/10.1063/1.1689402
Appl. Phys. Lett. 84, 2109–2111 (2004) https://doi.org/10.1063/1.1689755
Appl. Phys. Lett. 84, 2112–2114 (2004) https://doi.org/10.1063/1.1689392
Appl. Phys. Lett. 84, 2115–2117 (2004) https://doi.org/10.1063/1.1689398

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 84, 2118–2120 (2004) https://doi.org/10.1063/1.1667002
Appl. Phys. Lett. 84, 2121–2123 (2004) https://doi.org/10.1063/1.1655707
Appl. Phys. Lett. 84, 2124–2126 (2004) https://doi.org/10.1063/1.1688452
Appl. Phys. Lett. 84, 2127–2129 (2004) https://doi.org/10.1063/1.1682675
Appl. Phys. Lett. 84, 2130–2132 (2004) https://doi.org/10.1063/1.1688449
Appl. Phys. Lett. 84, 2133–2135 (2004) https://doi.org/10.1063/1.1650912
Appl. Phys. Lett. 84, 2136–2138 (2004) https://doi.org/10.1063/1.1688979
Appl. Phys. Lett. 84, 2139–2141 (2004) https://doi.org/10.1063/1.1689739

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 84, 2142–2144 (2004) https://doi.org/10.1063/1.1689394
Appl. Phys. Lett. 84, 2145–2147 (2004) https://doi.org/10.1063/1.1688455
Appl. Phys. Lett. 84, 2148–2150 (2004) https://doi.org/10.1063/1.1689744

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 84, 2151–2153 (2004) https://doi.org/10.1063/1.1664034
Appl. Phys. Lett. 84, 2154–2156 (2004) https://doi.org/10.1063/1.1667013
Appl. Phys. Lett. 84, 2157–2159 (2004) https://doi.org/10.1063/1.1687985
Appl. Phys. Lett. 84, 2160–2162 (2004) https://doi.org/10.1063/1.1689399
Appl. Phys. Lett. 84, 2163–2165 (2004) https://doi.org/10.1063/1.1687458
Appl. Phys. Lett. 84, 2166–2168 (2004) https://doi.org/10.1063/1.1688982
Appl. Phys. Lett. 84, 2169–2171 (2004) https://doi.org/10.1063/1.1689391
Appl. Phys. Lett. 84, 2172–2174 (2004) https://doi.org/10.1063/1.1689405
Appl. Phys. Lett. 84, 2175–2177 (2004) https://doi.org/10.1063/1.1687452

DEVICE PHYSICS

Appl. Phys. Lett. 84, 2178–2180 (2004) https://doi.org/10.1063/1.1669065
Appl. Phys. Lett. 84, 2181–2183 (2004) https://doi.org/10.1063/1.1687451
Appl. Phys. Lett. 84, 2184–2186 (2004) https://doi.org/10.1063/1.1687983

APPLIED BIOPHYSICS

Appl. Phys. Lett. 84, 2187–2189 (2004) https://doi.org/10.1063/1.1655689
Appl. Phys. Lett. 84, 2190–2192 (2004) https://doi.org/10.1063/1.1688448
Appl. Phys. Lett. 84, 2193–2195 (2004) https://doi.org/10.1063/1.1686895

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 84, 2196–2198 (2004) https://doi.org/10.1063/1.1686896
Appl. Phys. Lett. 84, 2199–2201 (2004) https://doi.org/10.1063/1.1686892
Appl. Phys. Lett. 84, 2202–2204 (2004) https://doi.org/10.1063/1.1667613
Appl. Phys. Lett. 84, 2205–2207 (2004) https://doi.org/10.1063/1.1688998
Appl. Phys. Lett. 84, 2208–2210 (2004) https://doi.org/10.1063/1.1689757

ADDENDA

Appl. Phys. Lett. 84, 2211 (2004) https://doi.org/10.1063/1.1690492
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