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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 82, 4411–4413 (2003) https://doi.org/10.1063/1.1584518
Appl. Phys. Lett. 82, 4414–4416 (2003) https://doi.org/10.1063/1.1584512
Appl. Phys. Lett. 82, 4417–4419 (2003) https://doi.org/10.1063/1.1583134
Appl. Phys. Lett. 82, 4420–4422 (2003) https://doi.org/10.1063/1.1584517
Appl. Phys. Lett. 82, 4423–4425 (2003) https://doi.org/10.1063/1.1584515
Appl. Phys. Lett. 82, 4426–4428 (2003) https://doi.org/10.1063/1.1586992
Appl. Phys. Lett. 82, 4429–4431 (2003) https://doi.org/10.1063/1.1585130
Appl. Phys. Lett. 82, 4432–4434 (2003) https://doi.org/10.1063/1.1586474
Appl. Phys. Lett. 82, 4435–4437 (2003) https://doi.org/10.1063/1.1584513
Appl. Phys. Lett. 82, 4438–4440 (2003) https://doi.org/10.1063/1.1585132
Appl. Phys. Lett. 82, 4441–4443 (2003) https://doi.org/10.1063/1.1585135
Appl. Phys. Lett. 82, 4444–4446 (2003) https://doi.org/10.1063/1.1585127

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 82, 4447–4449 (2003) https://doi.org/10.1063/1.1585137

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 82, 4450–4452 (2003) https://doi.org/10.1063/1.1585128
Appl. Phys. Lett. 82, 4453–4455 (2003) https://doi.org/10.1063/1.1584789
Appl. Phys. Lett. 82, 4456–4458 (2003) https://doi.org/10.1063/1.1586789
Appl. Phys. Lett. 82, 4459–4461 (2003) https://doi.org/10.1063/1.1583855
Appl. Phys. Lett. 82, 4462–4464 (2003) https://doi.org/10.1063/1.1586457
Appl. Phys. Lett. 82, 4465–4467 (2003) https://doi.org/10.1063/1.1586473
Appl. Phys. Lett. 82, 4468–4470 (2003) https://doi.org/10.1063/1.1586997
Appl. Phys. Lett. 82, 4471–4473 (2003) https://doi.org/10.1063/1.1584072
Appl. Phys. Lett. 82, 4474–4476 (2003) https://doi.org/10.1063/1.1586787
Appl. Phys. Lett. 82, 4477–4479 (2003) https://doi.org/10.1063/1.1585125
Appl. Phys. Lett. 82, 4480–4482 (2003) https://doi.org/10.1063/1.1586783
Appl. Phys. Lett. 82, 4483–4485 (2003) https://doi.org/10.1063/1.1585126
Appl. Phys. Lett. 82, 4486–4488 (2003) https://doi.org/10.1063/1.1585111
Appl. Phys. Lett. 82, 4489–4491 (2003) https://doi.org/10.1063/1.1586458

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 82, 4492–4494 (2003) https://doi.org/10.1063/1.1577826
Appl. Phys. Lett. 82, 4495–4497 (2003) https://doi.org/10.1063/1.1583872
Appl. Phys. Lett. 82, 4498–4500 (2003) https://doi.org/10.1063/1.1584524
Appl. Phys. Lett. 82, 4501–4503 (2003) https://doi.org/10.1063/1.1586782
Appl. Phys. Lett. 82, 4504–4506 (2003) https://doi.org/10.1063/1.1584784
Appl. Phys. Lett. 82, 4507–4509 (2003) https://doi.org/10.1063/1.1586785
Appl. Phys. Lett. 82, 4510–4512 (2003) https://doi.org/10.1063/1.1587256

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 82, 4513–4515 (2003) https://doi.org/10.1063/1.1584787
Appl. Phys. Lett. 82, 4516–4518 (2003) https://doi.org/10.1063/1.1583145
Appl. Phys. Lett. 82, 4519–4521 (2003) https://doi.org/10.1063/1.1584783
Appl. Phys. Lett. 82, 4522–4524 (2003) https://doi.org/10.1063/1.1582375
Appl. Phys. Lett. 82, 4525–4527 (2003) https://doi.org/10.1063/1.1584519
Appl. Phys. Lett. 82, 4528–4530 (2003) https://doi.org/10.1063/1.1586786
Appl. Phys. Lett. 82, 4531–4533 (2003) https://doi.org/10.1063/1.1587000
Appl. Phys. Lett. 82, 4534–4536 (2003) https://doi.org/10.1063/1.1586790

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 82, 4537–4539 (2003) https://doi.org/10.1063/1.1582363
Appl. Phys. Lett. 82, 4540–4542 (2003) https://doi.org/10.1063/1.1587272

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 82, 4543–4545 (2003) https://doi.org/10.1063/1.1583871
Appl. Phys. Lett. 82, 4546–4548 (2003) https://doi.org/10.1063/1.1585138
Appl. Phys. Lett. 82, 4549–4551 (2003) https://doi.org/10.1063/1.1584091
Appl. Phys. Lett. 82, 4552–4554 (2003) https://doi.org/10.1063/1.1584514
Appl. Phys. Lett. 82, 4555–4557 (2003) https://doi.org/10.1063/1.1584523
Appl. Phys. Lett. 82, 4558–4560 (2003) https://doi.org/10.1063/1.1586472
Appl. Phys. Lett. 82, 4561–4563 (2003) https://doi.org/10.1063/1.1586788
Appl. Phys. Lett. 82, 4564–4566 (2003) https://doi.org/10.1063/1.1583873
Appl. Phys. Lett. 82, 4567–4569 (2003) https://doi.org/10.1063/1.1585136
Appl. Phys. Lett. 82, 4570–4572 (2003) https://doi.org/10.1063/1.1586459
Appl. Phys. Lett. 82, 4573–4575 (2003) https://doi.org/10.1063/1.1586462

DEVICE PHYSICS

Appl. Phys. Lett. 82, 4576–4578 (2003) https://doi.org/10.1063/1.1581389
Appl. Phys. Lett. 82, 4579–4580 (2003) https://doi.org/10.1063/1.1584786
Appl. Phys. Lett. 82, 4581–4583 (2003) https://doi.org/10.1063/1.1577383
Appl. Phys. Lett. 82, 4584–4586 (2003) https://doi.org/10.1063/1.1577389
Appl. Phys. Lett. 82, 4587–4589 (2003) https://doi.org/10.1063/1.1586784
Appl. Phys. Lett. 82, 4590–4592 (2003) https://doi.org/10.1063/1.1586994
Appl. Phys. Lett. 82, 4593–4595 (2003) https://doi.org/10.1063/1.1587274

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 82, 4596–4598 (2003) https://doi.org/10.1063/1.1586482
Appl. Phys. Lett. 82, 4599–4601 (2003) https://doi.org/10.1063/1.1584788
Appl. Phys. Lett. 82, 4602–4604 (2003) https://doi.org/10.1063/1.1584782
Appl. Phys. Lett. 82, 4605–4607 (2003) https://doi.org/10.1063/1.1586456
Appl. Phys. Lett. 82, 4608–4610 (2003) https://doi.org/10.1063/1.1586463

ERRATA

Appl. Phys. Lett. 82, 4611 (2003) https://doi.org/10.1063/1.1589006
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