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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 82, 3379–3381 (2003) https://doi.org/10.1063/1.1575927
Appl. Phys. Lett. 82, 3382–3384 (2003) https://doi.org/10.1063/1.1575509
Appl. Phys. Lett. 82, 3385–3387 (2003) https://doi.org/10.1063/1.1575938
Appl. Phys. Lett. 82, 3388–3390 (2003) https://doi.org/10.1063/1.1576296
Appl. Phys. Lett. 82, 3391–3393 (2003) https://doi.org/10.1063/1.1576294
Appl. Phys. Lett. 82, 3394–3396 (2003) https://doi.org/10.1063/1.1576504
Appl. Phys. Lett. 82, 3397–3399 (2003) https://doi.org/10.1063/1.1574404
Appl. Phys. Lett. 82, 3400–3402 (2003) https://doi.org/10.1063/1.1576511
Appl. Phys. Lett. 82, 3403–3405 (2003) https://doi.org/10.1063/1.1577384
Appl. Phys. Lett. 82, 3406–3408 (2003) https://doi.org/10.1063/1.1576911
Appl. Phys. Lett. 82, 3409–3411 (2003) https://doi.org/10.1063/1.1576908

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 82, 3412–3414 (2003) https://doi.org/10.1063/1.1575507
Appl. Phys. Lett. 82, 3415–3417 (2003) https://doi.org/10.1063/1.1575931
Appl. Phys. Lett. 82, 3418–3420 (2003) https://doi.org/10.1063/1.1573368
Appl. Phys. Lett. 82, 3421–3423 (2003) https://doi.org/10.1063/1.1575508
Appl. Phys. Lett. 82, 3424–3426 (2003) https://doi.org/10.1063/1.1576309
Appl. Phys. Lett. 82, 3427–3429 (2003) https://doi.org/10.1063/1.1575503
Appl. Phys. Lett. 82, 3430–3432 (2003) https://doi.org/10.1063/1.1575932
Appl. Phys. Lett. 82, 3433–3435 (2003) https://doi.org/10.1063/1.1569414
Appl. Phys. Lett. 82, 3436–3438 (2003) https://doi.org/10.1063/1.1573335
Appl. Phys. Lett. 82, 3439–3441 (2003) https://doi.org/10.1063/1.1563834
Appl. Phys. Lett. 82, 3442–3444 (2003) https://doi.org/10.1063/1.1576293
Appl. Phys. Lett. 82, 3445–3447 (2003) https://doi.org/10.1063/1.1577217
Appl. Phys. Lett. 82, 3448–3450 (2003) https://doi.org/10.1063/1.1576912
Appl. Phys. Lett. 82, 3451–3453 (2003) https://doi.org/10.1063/1.1577393
Appl. Phys. Lett. 82, 3454–3456 (2003) https://doi.org/10.1063/1.1577386
Appl. Phys. Lett. 82, 3457–3459 (2003) https://doi.org/10.1063/1.1578169
Appl. Phys. Lett. 82, 3460–3462 (2003) https://doi.org/10.1063/1.1575935
Appl. Phys. Lett. 82, 3463–3465 (2003) https://doi.org/10.1063/1.1578162
Appl. Phys. Lett. 82, 3466–3468 (2003) https://doi.org/10.1063/1.1571660

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 82, 3469–3471 (2003) https://doi.org/10.1063/1.1576508
Appl. Phys. Lett. 82, 3472–3474 (2003) https://doi.org/10.1063/1.1576910

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 82, 3475–3477 (2003) https://doi.org/10.1063/1.1576501
Appl. Phys. Lett. 82, 3478–3480 (2003) https://doi.org/10.1063/1.1573333
Appl. Phys. Lett. 82, 3481–3483 (2003) https://doi.org/10.1063/1.1576292
Appl. Phys. Lett. 82, 3484–3486 (2003) https://doi.org/10.1063/1.1576917
Appl. Phys. Lett. 82, 3487–3489 (2003) https://doi.org/10.1063/1.1572968
Appl. Phys. Lett. 82, 3490–3492 (2003) https://doi.org/10.1063/1.1578183

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 82, 3493–3495 (2003) https://doi.org/10.1063/1.1576308
Appl. Phys. Lett. 82, 3496–3498 (2003) https://doi.org/10.1063/1.1576307
Appl. Phys. Lett. 82, 3499–3501 (2003) https://doi.org/10.1063/1.1576503
Appl. Phys. Lett. 82, 3502–3504 (2003) https://doi.org/10.1063/1.1575505
Appl. Phys. Lett. 82, 3505–3507 (2003) https://doi.org/10.1063/1.1576916
Appl. Phys. Lett. 82, 3508–3510 (2003) https://doi.org/10.1063/1.1575934

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 82, 3511–3513 (2003) https://doi.org/10.1063/1.1575504
Appl. Phys. Lett. 82, 3514–3516 (2003) https://doi.org/10.1063/1.1575506
Appl. Phys. Lett. 82, 3517–3519 (2003) https://doi.org/10.1063/1.1576498
Appl. Phys. Lett. 82, 3520–3522 (2003) https://doi.org/10.1063/1.1576310
Appl. Phys. Lett. 82, 3523–3525 (2003) https://doi.org/10.1063/1.1572553
Appl. Phys. Lett. 82, 3526–3528 (2003) https://doi.org/10.1063/1.1576909
Appl. Phys. Lett. 82, 3529–3531 (2003) https://doi.org/10.1063/1.1575502
Appl. Phys. Lett. 82, 3532–3534 (2003) https://doi.org/10.1063/1.1577385
Appl. Phys. Lett. 82, 3535–3537 (2003) https://doi.org/10.1063/1.1571978
Appl. Phys. Lett. 82, 3538–3540 (2003) https://doi.org/10.1063/1.1576914
Appl. Phys. Lett. 82, 3541–3543 (2003) https://doi.org/10.1063/1.1577388

DEVICE PHYSICS

Appl. Phys. Lett. 82, 3544–3546 (2003) https://doi.org/10.1063/1.1575936
Appl. Phys. Lett. 82, 3547–3549 (2003) https://doi.org/10.1063/1.1576295
Appl. Phys. Lett. 82, 3550–3552 (2003) https://doi.org/10.1063/1.1577216
Appl. Phys. Lett. 82, 3553–3555 (2003) https://doi.org/10.1063/1.1577213
Appl. Phys. Lett. 82, 3556–3558 (2003) https://doi.org/10.1063/1.1572532
Appl. Phys. Lett. 82, 3559–3561 (2003) https://doi.org/10.1063/1.1576500

APPLIED BIOPHYSICS

Appl. Phys. Lett. 82, 3562–3564 (2003) https://doi.org/10.1063/1.1576915

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 82, 3565–3567 (2003) https://doi.org/10.1063/1.1575937

COMMENTS

Appl. Phys. Lett. 82, 3568–3569 (2003) https://doi.org/10.1063/1.1576890
Appl. Phys. Lett. 82, 3570 (2003) https://doi.org/10.1063/1.1577821
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