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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 81, 5099–5101 (2002) https://doi.org/10.1063/1.1531221
Appl. Phys. Lett. 81, 5102–5104 (2002) https://doi.org/10.1063/1.1532554
Appl. Phys. Lett. 81, 5105–5107 (2002) https://doi.org/10.1063/1.1533837
Appl. Phys. Lett. 81, 5108–5110 (2002) https://doi.org/10.1063/1.1533846
Appl. Phys. Lett. 81, 5111–5113 (2002) https://doi.org/10.1063/1.1533123

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 81, 5114–5116 (2002) https://doi.org/10.1063/1.1532774

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 81, 5117–5119 (2002) https://doi.org/10.1063/1.1527975
Appl. Phys. Lett. 81, 5120–5122 (2002) https://doi.org/10.1063/1.1530376
Appl. Phys. Lett. 81, 5123–5125 (2002) https://doi.org/10.1063/1.1533118
Appl. Phys. Lett. 81, 5126–5128 (2002) https://doi.org/10.1063/1.1533840
Appl. Phys. Lett. 81, 5129–5131 (2002) https://doi.org/10.1063/1.1531837
Appl. Phys. Lett. 81, 5132–5134 (2002) https://doi.org/10.1063/1.1531222
Appl. Phys. Lett. 81, 5135–5137 (2002) https://doi.org/10.1063/1.1532551
Appl. Phys. Lett. 81, 5138–5140 (2002) https://doi.org/10.1063/1.1533856
Appl. Phys. Lett. 81, 5141–5143 (2002) https://doi.org/10.1063/1.1533855
Appl. Phys. Lett. 81, 5144–5146 (2002) https://doi.org/10.1063/1.1506943
Appl. Phys. Lett. 81, 5147–5149 (2002) https://doi.org/10.1063/1.1534385
Appl. Phys. Lett. 81, 5150–5152 (2002) https://doi.org/10.1063/1.1533109
Appl. Phys. Lett. 81, 5153–5155 (2002) https://doi.org/10.1063/1.1533124
Appl. Phys. Lett. 81, 5156–5158 (2002) https://doi.org/10.1063/1.1534387

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 81, 5159–5161 (2002) https://doi.org/10.1063/1.1530374
Appl. Phys. Lett. 81, 5162–5164 (2002) https://doi.org/10.1063/1.1532753
Appl. Phys. Lett. 81, 5165–5167 (2002) https://doi.org/10.1063/1.1523155
Appl. Phys. Lett. 81, 5168–5170 (2002) https://doi.org/10.1063/1.1530745
Appl. Phys. Lett. 81, 5171–5173 (2002) https://doi.org/10.1063/1.1532555
Appl. Phys. Lett. 81, 5174–5176 (2002) https://doi.org/10.1063/1.1533122
Appl. Phys. Lett. 81, 5177–5179 (2002) https://doi.org/10.1063/1.1532772
Appl. Phys. Lett. 81, 5180–5182 (2002) https://doi.org/10.1063/1.1532533
Appl. Phys. Lett. 81, 5183–5185 (2002) https://doi.org/10.1063/1.1533857
Appl. Phys. Lett. 81, 5186–5188 (2002) https://doi.org/10.1063/1.1533119
Appl. Phys. Lett. 81, 5189–5191 (2002) https://doi.org/10.1063/1.1534407
Appl. Phys. Lett. 81, 5192–5194 (2002) https://doi.org/10.1063/1.1534395
Appl. Phys. Lett. 81, 5195–5197 (2002) https://doi.org/10.1063/1.1534416

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 81, 5198–5200 (2002) https://doi.org/10.1063/1.1526910
Appl. Phys. Lett. 81, 5201–5203 (2002) https://doi.org/10.1063/1.1532105

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 81, 5204–5206 (2002) https://doi.org/10.1063/1.1532548
Appl. Phys. Lett. 81, 5207–5209 (2002) https://doi.org/10.1063/1.1530744
Appl. Phys. Lett. 81, 5210–5212 (2002) https://doi.org/10.1063/1.1533115

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 81, 5213–5215 (2002) https://doi.org/10.1063/1.1532546
Appl. Phys. Lett. 81, 5216–5218 (2002) https://doi.org/10.1063/1.1527702
Appl. Phys. Lett. 81, 5219–5221 (2002) https://doi.org/10.1063/1.1531833
Appl. Phys. Lett. 81, 5222–5224 (2002) https://doi.org/10.1063/1.1532757
Appl. Phys. Lett. 81, 5225–5227 (2002) https://doi.org/10.1063/1.1534415
Appl. Phys. Lett. 81, 5228–5230 (2002) https://doi.org/10.1063/1.1533858
Appl. Phys. Lett. 81, 5231–5233 (2002) https://doi.org/10.1063/1.1534412
Appl. Phys. Lett. 81, 5234–5236 (2002) https://doi.org/10.1063/1.1533842
Appl. Phys. Lett. 81, 5237–5239 (2002) https://doi.org/10.1063/1.1533859

DEVICE PHYSICS

Appl. Phys. Lett. 81, 5240–5242 (2002) https://doi.org/10.1063/1.1533112
Appl. Phys. Lett. 81, 5243–5245 (2002) https://doi.org/10.1063/1.1532532
Appl. Phys. Lett. 81, 5246–5248 (2002) https://doi.org/10.1063/1.1533114

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 81, 5249–5251 (2002) https://doi.org/10.1063/1.1481985
Appl. Phys. Lett. 81, 5252–5254 (2002) https://doi.org/10.1063/1.1533113
Appl. Phys. Lett. 81, 5255–5257 (2002) https://doi.org/10.1063/1.1533847
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