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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 81, 4685–4687 (2002) https://doi.org/10.1063/1.1526919
Appl. Phys. Lett. 81, 4688–4690 (2002) https://doi.org/10.1063/1.1527986
Appl. Phys. Lett. 81, 4691–4693 (2002) https://doi.org/10.1063/1.1529083
Appl. Phys. Lett. 81, 4694–4696 (2002) https://doi.org/10.1063/1.1529310
Appl. Phys. Lett. 81, 4697–4699 (2002) https://doi.org/10.1063/1.1529078
Appl. Phys. Lett. 81, 4700–4702 (2002) https://doi.org/10.1063/1.1528729
Appl. Phys. Lett. 81, 4703–4705 (2002) https://doi.org/10.1063/1.1530749
Appl. Phys. Lett. 81, 4706–4708 (2002) https://doi.org/10.1063/1.1526171
Appl. Phys. Lett. 81, 4709–4711 (2002) https://doi.org/10.1063/1.1530378
Appl. Phys. Lett. 81, 4712–4714 (2002) https://doi.org/10.1063/1.1529309

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 81, 4715–4717 (2002) https://doi.org/10.1063/1.1529081
Appl. Phys. Lett. 81, 4718–4720 (2002) https://doi.org/10.1063/1.1527988
Appl. Phys. Lett. 81, 4721–4723 (2002) https://doi.org/10.1063/1.1527225
Appl. Phys. Lett. 81, 4724–4726 (2002) https://doi.org/10.1063/1.1528286
Appl. Phys. Lett. 81, 4727–4729 (2002) https://doi.org/10.1063/1.1529080
Appl. Phys. Lett. 81, 4730–4732 (2002) https://doi.org/10.1063/1.1527694
Appl. Phys. Lett. 81, 4733–4735 (2002) https://doi.org/10.1063/1.1530733
Appl. Phys. Lett. 81, 4736–4738 (2002) https://doi.org/10.1063/1.1530750
Appl. Phys. Lett. 81, 4739–4741 (2002) https://doi.org/10.1063/1.1530371
Appl. Phys. Lett. 81, 4742–4744 (2002) https://doi.org/10.1063/1.1530742
Appl. Phys. Lett. 81, 4745–4747 (2002) https://doi.org/10.1063/1.1530730
Appl. Phys. Lett. 81, 4748–4750 (2002) https://doi.org/10.1063/1.1527981

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 81, 4751–4753 (2002) https://doi.org/10.1063/1.1527979
Appl. Phys. Lett. 81, 4754–4756 (2002) https://doi.org/10.1063/1.1524300
Appl. Phys. Lett. 81, 4757–4759 (2002) https://doi.org/10.1063/1.1529306
Appl. Phys. Lett. 81, 4760–4762 (2002) https://doi.org/10.1063/1.1522131
Appl. Phys. Lett. 81, 4763–4765 (2002) https://doi.org/10.1063/1.1528727
Appl. Phys. Lett. 81, 4766–4768 (2002) https://doi.org/10.1063/1.1528280
Appl. Phys. Lett. 81, 4769–4771 (2002) https://doi.org/10.1063/1.1530743
Appl. Phys. Lett. 81, 4772–4774 (2002) https://doi.org/10.1063/1.1529313
Appl. Phys. Lett. 81, 4775–4777 (2002) https://doi.org/10.1063/1.1529308
Appl. Phys. Lett. 81, 4778–4780 (2002) https://doi.org/10.1063/1.1529311
Appl. Phys. Lett. 81, 4781–4783 (2002) https://doi.org/10.1063/1.1530737

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 81, 4784–4786 (2002) https://doi.org/10.1063/1.1526160
Appl. Phys. Lett. 81, 4787–4789 (2002) https://doi.org/10.1063/1.1528737
Appl. Phys. Lett. 81, 4790–4792 (2002) https://doi.org/10.1063/1.1528724
Appl. Phys. Lett. 81, 4793–4795 (2002) https://doi.org/10.1063/1.1530734
Appl. Phys. Lett. 81, 4796–4798 (2002) https://doi.org/10.1063/1.1528284
Appl. Phys. Lett. 81, 4799–4801 (2002) https://doi.org/10.1063/1.1530738
Appl. Phys. Lett. 81, 4802–4804 (2002) https://doi.org/10.1063/1.1530735

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 81, 4805–4807 (2002) https://doi.org/10.1063/1.1528288
Appl. Phys. Lett. 81, 4808–4810 (2002) https://doi.org/10.1063/1.1528278
Appl. Phys. Lett. 81, 4811–4813 (2002) https://doi.org/10.1063/1.1529088
Appl. Phys. Lett. 81, 4814–4816 (2002) https://doi.org/10.1063/1.1529085
Appl. Phys. Lett. 81, 4817–4819 (2002) https://doi.org/10.1063/1.1529087

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 81, 4820–4822 (2002) https://doi.org/10.1063/1.1527696
Appl. Phys. Lett. 81, 4823–4825 (2002) https://doi.org/10.1063/1.1529084
Appl. Phys. Lett. 81, 4826–4828 (2002) https://doi.org/10.1063/1.1527693
Appl. Phys. Lett. 81, 4829–4831 (2002) https://doi.org/10.1063/1.1529086
Appl. Phys. Lett. 81, 4832–4834 (2002) https://doi.org/10.1063/1.1529307
Appl. Phys. Lett. 81, 4835–4837 (2002) https://doi.org/10.1063/1.1530373
Appl. Phys. Lett. 81, 4838–4840 (2002) https://doi.org/10.1063/1.1529312
Appl. Phys. Lett. 81, 4841–4843 (2002) https://doi.org/10.1063/1.1529314
Appl. Phys. Lett. 81, 4844–4846 (2002) https://doi.org/10.1063/1.1530740
Appl. Phys. Lett. 81, 4847–4849 (2002) https://doi.org/10.1063/1.1530747
Appl. Phys. Lett. 81, 4850–4852 (2002) https://doi.org/10.1063/1.1527235

DEVICE PHYSICS

Appl. Phys. Lett. 81, 4853–4855 (2002) https://doi.org/10.1063/1.1528730
Appl. Phys. Lett. 81, 4856–4858 (2002) https://doi.org/10.1063/1.1528731
Appl. Phys. Lett. 81, 4859–4861 (2002) https://doi.org/10.1063/1.1530751
Appl. Phys. Lett. 81, 4862–4864 (2002) https://doi.org/10.1063/1.1526166

APPLIED BIOPHYSICS

Appl. Phys. Lett. 81, 4865–4867 (2002) https://doi.org/10.1063/1.1531228

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 81, 4868–4870 (2002) https://doi.org/10.1063/1.1522829

ERRATA

Appl. Phys. Lett. 81, 4871 (2002) https://doi.org/10.1063/1.1524027
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