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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 81, 187–189 (2002) https://doi.org/10.1063/1.1491284
Appl. Phys. Lett. 81, 190–192 (2002) https://doi.org/10.1063/1.1492312
Appl. Phys. Lett. 81, 193–195 (2002) https://doi.org/10.1063/1.1492309
Appl. Phys. Lett. 81, 196–198 (2002) https://doi.org/10.1063/1.1492004
Appl. Phys. Lett. 81, 199–201 (2002) https://doi.org/10.1063/1.1492319
Appl. Phys. Lett. 81, 202–204 (2002) https://doi.org/10.1063/1.1491608
Appl. Phys. Lett. 81, 205–207 (2002) https://doi.org/10.1063/1.1492310
Appl. Phys. Lett. 81, 208–210 (2002) https://doi.org/10.1063/1.1491285
Appl. Phys. Lett. 81, 211–213 (2002) https://doi.org/10.1063/1.1492848
Appl. Phys. Lett. 81, 214–216 (2002) https://doi.org/10.1063/1.1490635
Appl. Phys. Lett. 81, 217–219 (2002) https://doi.org/10.1063/1.1491612
Appl. Phys. Lett. 81, 220–222 (2002) https://doi.org/10.1063/1.1494107
Appl. Phys. Lett. 81, 223–225 (2002) https://doi.org/10.1063/1.1493667

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 81, 226–228 (2002) https://doi.org/10.1063/1.1491290

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 81, 229–231 (2002) https://doi.org/10.1063/1.1491004
Appl. Phys. Lett. 81, 232–234 (2002) https://doi.org/10.1063/1.1490400
Appl. Phys. Lett. 81, 235–237 (2002) https://doi.org/10.1063/1.1491294
Appl. Phys. Lett. 81, 238–240 (2002) https://doi.org/10.1063/1.1492013
Appl. Phys. Lett. 81, 241–243 (2002) https://doi.org/10.1063/1.1492007
Appl. Phys. Lett. 81, 244–246 (2002) https://doi.org/10.1063/1.1491609
Appl. Phys. Lett. 81, 247–249 (2002) https://doi.org/10.1063/1.1492850
Appl. Phys. Lett. 81, 250–252 (2002) https://doi.org/10.1063/1.1491613
Appl. Phys. Lett. 81, 253–255 (2002) https://doi.org/10.1063/1.1494464
Appl. Phys. Lett. 81, 256–258 (2002) https://doi.org/10.1063/1.1493663

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 81, 259–261 (2002) https://doi.org/10.1063/1.1492010
Appl. Phys. Lett. 81, 262–264 (2002) https://doi.org/10.1063/1.1491598
Appl. Phys. Lett. 81, 265–267 (2002) https://doi.org/10.1063/1.1491010
Appl. Phys. Lett. 81, 268–270 (2002) https://doi.org/10.1063/1.1491009
Appl. Phys. Lett. 81, 271–273 (2002) https://doi.org/10.1063/1.1492023
Appl. Phys. Lett. 81, 274–276 (2002) https://doi.org/10.1063/1.1492847
Appl. Phys. Lett. 81, 277–279 (2002) https://doi.org/10.1063/1.1489721
Appl. Phys. Lett. 81, 280–282 (2002) https://doi.org/10.1063/1.1492302
Appl. Phys. Lett. 81, 283–285 (2002) https://doi.org/10.1063/1.1491600
Appl. Phys. Lett. 81, 286–288 (2002) https://doi.org/10.1063/1.1491280
Appl. Phys. Lett. 81, 289–291 (2002) https://doi.org/10.1063/1.1491604
Appl. Phys. Lett. 81, 292–294 (2002) https://doi.org/10.1063/1.1492857
Appl. Phys. Lett. 81, 295–297 (2002) https://doi.org/10.1063/1.1492853
Appl. Phys. Lett. 81, 298–300 (2002) https://doi.org/10.1063/1.1491014
Appl. Phys. Lett. 81, 301–303 (2002) https://doi.org/10.1063/1.1492313
Appl. Phys. Lett. 81, 304–306 (2002) https://doi.org/10.1063/1.1490415

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 81, 307–309 (2002) https://doi.org/10.1063/1.1491281
Appl. Phys. Lett. 81, 310–312 (2002) https://doi.org/10.1063/1.1490149
Appl. Phys. Lett. 81, 313–315 (2002) https://doi.org/10.1063/1.1483123
Appl. Phys. Lett. 81, 316–318 (2002) https://doi.org/10.1063/1.1492303
Appl. Phys. Lett. 81, 319–321 (2002) https://doi.org/10.1063/1.1491602
Appl. Phys. Lett. 81, 322–324 (2002) https://doi.org/10.1063/1.1492317
Appl. Phys. Lett. 81, 325–327 (2002) https://doi.org/10.1063/1.1481785
Appl. Phys. Lett. 81, 328–330 (2002) https://doi.org/10.1063/1.1493646
Appl. Phys. Lett. 81, 331–333 (2002) https://doi.org/10.1063/1.1491603

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 81, 334–336 (2002) https://doi.org/10.1063/1.1492320
Appl. Phys. Lett. 81, 337–339 (2002) https://doi.org/10.1063/1.1492854
Appl. Phys. Lett. 81, 340–342 (2002) https://doi.org/10.1063/1.1490148

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 81, 343–345 (2002) https://doi.org/10.1063/1.1489084
Appl. Phys. Lett. 81, 346–348 (2002) https://doi.org/10.1063/1.1492307
Appl. Phys. Lett. 81, 349–351 (2002) https://doi.org/10.1063/1.1492304
Appl. Phys. Lett. 81, 352–354 (2002) https://doi.org/10.1063/1.1492851
Appl. Phys. Lett. 81, 355–357 (2002) https://doi.org/10.1063/1.1492305
Appl. Phys. Lett. 81, 358–360 (2002) https://doi.org/10.1063/1.1492012
Appl. Phys. Lett. 81, 361–363 (2002) https://doi.org/10.1063/1.1484554
Appl. Phys. Lett. 81, 364–366 (2002) https://doi.org/10.1063/1.1491611

DEVICE PHYSICS

Appl. Phys. Lett. 81, 367–369 (2002) https://doi.org/10.1063/1.1490394
Appl. Phys. Lett. 81, 370–372 (2002) https://doi.org/10.1063/1.1491002
Appl. Phys. Lett. 81, 373–375 (2002) https://doi.org/10.1063/1.1492852
Appl. Phys. Lett. 81, 376–378 (2002) https://doi.org/10.1063/1.1492024
Appl. Phys. Lett. 81, 379–381 (2002) https://doi.org/10.1063/1.1492011
Appl. Phys. Lett. 81, 382–384 (2002) https://doi.org/10.1063/1.1492315

APPLIED BIOPHYSICS

Appl. Phys. Lett. 81, 385–387 (2002) https://doi.org/10.1063/1.1492308
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