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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 80, 1111–1113 (2002) https://doi.org/10.1063/1.1450056
Appl. Phys. Lett. 80, 1114–1116 (2002) https://doi.org/10.1063/1.1448387
Appl. Phys. Lett. 80, 1117–1119 (2002) https://doi.org/10.1063/1.1447001
Appl. Phys. Lett. 80, 1120–1122 (2002) https://doi.org/10.1063/1.1449529
Appl. Phys. Lett. 80, 1123–1125 (2002) https://doi.org/10.1063/1.1445810
Appl. Phys. Lett. 80, 1126–1128 (2002) https://doi.org/10.1063/1.1451989
Appl. Phys. Lett. 80, 1129–1131 (2002) https://doi.org/10.1063/1.1449540

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 80, 1132–1134 (2002) https://doi.org/10.1063/1.1448399

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 80, 1135–1137 (2002) https://doi.org/10.1063/1.1450045
Appl. Phys. Lett. 80, 1138–1140 (2002) https://doi.org/10.1063/1.1450262
Appl. Phys. Lett. 80, 1141–1143 (2002) https://doi.org/10.1063/1.1450250
Appl. Phys. Lett. 80, 1144–1146 (2002) https://doi.org/10.1063/1.1448389
Appl. Phys. Lett. 80, 1147–1149 (2002) https://doi.org/10.1063/1.1448173
Appl. Phys. Lett. 80, 1150–1152 (2002) https://doi.org/10.1063/1.1448658
Appl. Phys. Lett. 80, 1153–1155 (2002) https://doi.org/10.1063/1.1449539
Appl. Phys. Lett. 80, 1156–1158 (2002) https://doi.org/10.1063/1.1451990
Appl. Phys. Lett. 80, 1159–1161 (2002) https://doi.org/10.1063/1.1450046
Appl. Phys. Lett. 80, 1162–1164 (2002) https://doi.org/10.1063/1.1450040
Appl. Phys. Lett. 80, 1165–1167 (2002) https://doi.org/10.1063/1.1450039
Appl. Phys. Lett. 80, 1168–1170 (2002) https://doi.org/10.1063/1.1451988
Appl. Phys. Lett. 80, 1171–1173 (2002) https://doi.org/10.1063/1.1449522
Appl. Phys. Lett. 80, 1174–1176 (2002) https://doi.org/10.1063/1.1450249
Appl. Phys. Lett. 80, 1177–1179 (2002) https://doi.org/10.1063/1.1450261
Appl. Phys. Lett. 80, 1180–1182 (2002) https://doi.org/10.1063/1.1450058
Appl. Phys. Lett. 80, 1183–1185 (2002) https://doi.org/10.1063/1.1451991
Appl. Phys. Lett. 80, 1186–1188 (2002) https://doi.org/10.1063/1.1450042

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 80, 1189–1191 (2002) https://doi.org/10.1063/1.1449525
Appl. Phys. Lett. 80, 1192–1194 (2002) https://doi.org/10.1063/1.1435809
Appl. Phys. Lett. 80, 1195–1197 (2002) https://doi.org/10.1063/1.1449528
Appl. Phys. Lett. 80, 1198–1200 (2002) https://doi.org/10.1063/1.1449527
Appl. Phys. Lett. 80, 1201–1203 (2002) https://doi.org/10.1063/1.1449526
Appl. Phys. Lett. 80, 1204–1206 (2002) https://doi.org/10.1063/1.1448668
Appl. Phys. Lett. 80, 1207–1209 (2002) https://doi.org/10.1063/1.1450252
Appl. Phys. Lett. 80, 1210–1212 (2002) https://doi.org/10.1063/1.1450038
Appl. Phys. Lett. 80, 1213–1215 (2002) https://doi.org/10.1063/1.1448171
Appl. Phys. Lett. 80, 1216–1218 (2002) https://doi.org/10.1063/1.1448388
Appl. Phys. Lett. 80, 1219–1221 (2002) https://doi.org/10.1063/1.1448663
Appl. Phys. Lett. 80, 1222–1224 (2002) https://doi.org/10.1063/1.1450044
Appl. Phys. Lett. 80, 1225–1227 (2002) https://doi.org/10.1063/1.1447593
Appl. Phys. Lett. 80, 1228–1230 (2002) https://doi.org/10.1063/1.1448401
Appl. Phys. Lett. 80, 1231–1233 (2002) https://doi.org/10.1063/1.1448168

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 80, 1234–1236 (2002) https://doi.org/10.1063/1.1448665
Appl. Phys. Lett. 80, 1237–1239 (2002) https://doi.org/10.1063/1.1450254
Appl. Phys. Lett. 80, 1240–1242 (2002) https://doi.org/10.1063/1.1449530
Appl. Phys. Lett. 80, 1243–1245 (2002) https://doi.org/10.1063/1.1450253
Appl. Phys. Lett. 80, 1246–1248 (2002) https://doi.org/10.1063/1.1447600

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 80, 1249–1251 (2002) https://doi.org/10.1063/1.1448384
Appl. Phys. Lett. 80, 1252–1254 (2002) https://doi.org/10.1063/1.1447314
Appl. Phys. Lett. 80, 1255–1257 (2002) https://doi.org/10.1063/1.1450263
Appl. Phys. Lett. 80, 1258–1260 (2002) https://doi.org/10.1063/1.1449532
Appl. Phys. Lett. 80, 1261–1263 (2002) https://doi.org/10.1063/1.1447006

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 80, 1264–1266 (2002) https://doi.org/10.1063/1.1450251
Appl. Phys. Lett. 80, 1267–1269 (2002) https://doi.org/10.1063/1.1450264
Appl. Phys. Lett. 80, 1270–1272 (2002) https://doi.org/10.1063/1.1449535
Appl. Phys. Lett. 80, 1273–1275 (2002) https://doi.org/10.1063/1.1447319
Appl. Phys. Lett. 80, 1276–1278 (2002) https://doi.org/10.1063/1.1449533
Appl. Phys. Lett. 80, 1279–1281 (2002) https://doi.org/10.1063/1.1430508

DEVICE PHYSICS

Appl. Phys. Lett. 80, 1282–1284 (2002) https://doi.org/10.1063/1.1448859
Appl. Phys. Lett. 80, 1285–1287 (2002) https://doi.org/10.1063/1.1450047
Appl. Phys. Lett. 80, 1288–1290 (2002) https://doi.org/10.1063/1.1446988
Appl. Phys. Lett. 80, 1291–1293 (2002) https://doi.org/10.1063/1.1449536
Appl. Phys. Lett. 80, 1294–1296 (2002) https://doi.org/10.1063/1.1450048

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 80, 1297–1299 (2002) https://doi.org/10.1063/1.1448851
Appl. Phys. Lett. 80, 1300–1302 (2002) https://doi.org/10.1063/1.1449534
Appl. Phys. Lett. 80, 1303–1305 (2002) https://doi.org/10.1063/1.1448383

COMMENTS

Appl. Phys. Lett. 80, 1306–1307 (2002) https://doi.org/10.1063/1.1452796
Appl. Phys. Lett. 80, 1308–1309 (2002) https://doi.org/10.1063/1.1452777

ERRATA

Appl. Phys. Lett. 80, 1310 (2002) https://doi.org/10.1063/1.1452815
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