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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 80, 905–907 (2002) https://doi.org/10.1063/1.1436530
Appl. Phys. Lett. 80, 908–910 (2002) https://doi.org/10.1063/1.1448174
Appl. Phys. Lett. 80, 911–913 (2002) https://doi.org/10.1063/1.1447595
Appl. Phys. Lett. 80, 914–916 (2002) https://doi.org/10.1063/1.1435806
Appl. Phys. Lett. 80, 917–919 (2002) https://doi.org/10.1063/1.1448386
Appl. Phys. Lett. 80, 920–922 (2002) https://doi.org/10.1063/1.1448664
Appl. Phys. Lett. 80, 923–925 (2002) https://doi.org/10.1063/1.1448146
Appl. Phys. Lett. 80, 926–928 (2002) https://doi.org/10.1063/1.1448382
Appl. Phys. Lett. 80, 929–931 (2002) https://doi.org/10.1063/1.1448861

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 80, 932–934 (2002) https://doi.org/10.1063/1.1448170

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 80, 935–937 (2002) https://doi.org/10.1063/1.1447012
Appl. Phys. Lett. 80, 938–940 (2002) https://doi.org/10.1063/1.1447601
Appl. Phys. Lett. 80, 941–943 (2002) https://doi.org/10.1063/1.1448660
Appl. Phys. Lett. 80, 944–946 (2002) https://doi.org/10.1063/1.1447014
Appl. Phys. Lett. 80, 947–949 (2002) https://doi.org/10.1063/1.1448856
Appl. Phys. Lett. 80, 950–952 (2002) https://doi.org/10.1063/1.1448398
Appl. Phys. Lett. 80, 953–955 (2002) https://doi.org/10.1063/1.1448145
Appl. Phys. Lett. 80, 956–958 (2002) https://doi.org/10.1063/1.1448175
Appl. Phys. Lett. 80, 959–961 (2002) https://doi.org/10.1063/1.1448657
Appl. Phys. Lett. 80, 962–964 (2002) https://doi.org/10.1063/1.1448656
Appl. Phys. Lett. 80, 965–967 (2002) https://doi.org/10.1063/1.1449538
Appl. Phys. Lett. 80, 968–970 (2002) https://doi.org/10.1063/1.1450255
Appl. Phys. Lett. 80, 971–973 (2002) https://doi.org/10.1063/1.1447596
Appl. Phys. Lett. 80, 974–976 (2002) https://doi.org/10.1063/1.1448166
Appl. Phys. Lett. 80, 977–979 (2002) https://doi.org/10.1063/1.1433164
Appl. Phys. Lett. 80, 980–982 (2002) https://doi.org/10.1063/1.1448860
Appl. Phys. Lett. 80, 983–985 (2002) https://doi.org/10.1063/1.1448662

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 80, 986–988 (2002) https://doi.org/10.1063/1.1445807
Appl. Phys. Lett. 80, 989–991 (2002) https://doi.org/10.1063/1.1446206
Appl. Phys. Lett. 80, 992–994 (2002) https://doi.org/10.1063/1.1447591
Appl. Phys. Lett. 80, 995–997 (2002) https://doi.org/10.1063/1.1447323
Appl. Phys. Lett. 80, 998–1000 (2002) https://doi.org/10.1063/1.1447597
Appl. Phys. Lett. 80, 1001–1003 (2002) https://doi.org/10.1063/1.1448666
Appl. Phys. Lett. 80, 1004–1006 (2002) https://doi.org/10.1063/1.1447322

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 80, 1007–1009 (2002) https://doi.org/10.1063/1.1447000
Appl. Phys. Lett. 80, 1010–1012 (2002) https://doi.org/10.1063/1.1445468
Appl. Phys. Lett. 80, 1013–1015 (2002) https://doi.org/10.1063/1.1445477
Appl. Phys. Lett. 80, 1016–1018 (2002) https://doi.org/10.1063/1.1447582
Appl. Phys. Lett. 80, 1019–1021 (2002) https://doi.org/10.1063/1.1448857
Appl. Phys. Lett. 80, 1022–1024 (2002) https://doi.org/10.1063/1.1448176
Appl. Phys. Lett. 80, 1025–1027 (2002) https://doi.org/10.1063/1.1447598
Appl. Phys. Lett. 80, 1028–1030 (2002) https://doi.org/10.1063/1.1447599
Appl. Phys. Lett. 80, 1031–1033 (2002) https://doi.org/10.1063/1.1448854

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 80, 1034–1036 (2002) https://doi.org/10.1063/1.1445482
Appl. Phys. Lett. 80, 1037–1039 (2002) https://doi.org/10.1063/1.1447602
Appl. Phys. Lett. 80, 1040–1042 (2002) https://doi.org/10.1063/1.1447321
Appl. Phys. Lett. 80, 1043–1045 (2002) https://doi.org/10.1063/1.1448385
Appl. Phys. Lett. 80, 1046–1048 (2002) https://doi.org/10.1063/1.1446214
Appl. Phys. Lett. 80, 1049–1051 (2002) https://doi.org/10.1063/1.1448654
Appl. Phys. Lett. 80, 1052–1054 (2002) https://doi.org/10.1063/1.1448667

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 80, 1055–1057 (2002) https://doi.org/10.1063/1.1447313
Appl. Phys. Lett. 80, 1058–1060 (2002) https://doi.org/10.1063/1.1447312
Appl. Phys. Lett. 80, 1061–1063 (2002) https://doi.org/10.1063/1.1448852
Appl. Phys. Lett. 80, 1064–1066 (2002) https://doi.org/10.1063/1.1448850
Appl. Phys. Lett. 80, 1067–1069 (2002) https://doi.org/10.1063/1.1447007
Appl. Phys. Lett. 80, 1070–1072 (2002) https://doi.org/10.1063/1.1448400
Appl. Phys. Lett. 80, 1073–1075 (2002) https://doi.org/10.1063/1.1448855
Appl. Phys. Lett. 80, 1076–1078 (2002) https://doi.org/10.1063/1.1448160
Appl. Phys. Lett. 80, 1079–1081 (2002) https://doi.org/10.1063/1.1448655

DEVICE PHYSICS

Appl. Phys. Lett. 80, 1082–1084 (2002) https://doi.org/10.1063/1.1448661
Appl. Phys. Lett. 80, 1085–1087 (2002) https://doi.org/10.1063/1.1436535
Appl. Phys. Lett. 80, 1088–1090 (2002) https://doi.org/10.1063/1.1448659

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 80, 1091–1093 (2002) https://doi.org/10.1063/1.1448167
Appl. Phys. Lett. 80, 1094–1096 (2002) https://doi.org/10.1063/1.1447320
Appl. Phys. Lett. 80, 1097–1099 (2002) https://doi.org/10.1063/1.1448172
Appl. Phys. Lett. 80, 1100–1102 (2002) https://doi.org/10.1063/1.1448390

ERRATA

Appl. Phys. Lett. 80, 1103 (2002) https://doi.org/10.1063/1.1448652
Appl. Phys. Lett. 80, 1104 (2002) https://doi.org/10.1063/1.1446202
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