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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 80, 707–709 (2002) https://doi.org/10.1063/1.1447004
Appl. Phys. Lett. 80, 710–712 (2002) https://doi.org/10.1063/1.1445464
Appl. Phys. Lett. 80, 713–715 (2002) https://doi.org/10.1063/1.1445272
Appl. Phys. Lett. 80, 716–718 (2002) https://doi.org/10.1063/1.1445473
Appl. Phys. Lett. 80, 719–721 (2002) https://doi.org/10.1063/1.1446207
Appl. Phys. Lett. 80, 722–724 (2002) https://doi.org/10.1063/1.1430855
Appl. Phys. Lett. 80, 725–727 (2002) https://doi.org/10.1063/1.1446992
Appl. Phys. Lett. 80, 728–730 (2002) https://doi.org/10.1063/1.1447318
Appl. Phys. Lett. 80, 731–733 (2002) https://doi.org/10.1063/1.1446205
Appl. Phys. Lett. 80, 734–736 (2002) https://doi.org/10.1063/1.1446213

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 80, 737–739 (2002) https://doi.org/10.1063/1.1445470

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 80, 740–742 (2002) https://doi.org/10.1063/1.1445803
Appl. Phys. Lett. 80, 743–745 (2002) https://doi.org/10.1063/1.1445472
Appl. Phys. Lett. 80, 746–748 (2002) https://doi.org/10.1063/1.1432448
Appl. Phys. Lett. 80, 749–751 (2002) https://doi.org/10.1063/1.1446212
Appl. Phys. Lett. 80, 752–754 (2002) https://doi.org/10.1063/1.1445463
Appl. Phys. Lett. 80, 755–757 (2002) https://doi.org/10.1063/1.1434305
Appl. Phys. Lett. 80, 758–760 (2002) https://doi.org/10.1063/1.1446203
Appl. Phys. Lett. 80, 761–762 (2002) https://doi.org/10.1063/1.1433916
Appl. Phys. Lett. 80, 763–765 (2002) https://doi.org/10.1063/1.1445471
Appl. Phys. Lett. 80, 766–768 (2002) https://doi.org/10.1063/1.1445465
Appl. Phys. Lett. 80, 769–771 (2002) https://doi.org/10.1063/1.1436270
Appl. Phys. Lett. 80, 772–774 (2002) https://doi.org/10.1063/1.1447324
Appl. Phys. Lett. 80, 775–777 (2002) https://doi.org/10.1063/1.1447317
Appl. Phys. Lett. 80, 778–780 (2002) https://doi.org/10.1063/1.1446986
Appl. Phys. Lett. 80, 781–783 (2002) https://doi.org/10.1063/1.1447015
Appl. Phys. Lett. 80, 784–786 (2002) https://doi.org/10.1063/1.1435069
Appl. Phys. Lett. 80, 787–789 (2002) https://doi.org/10.1063/1.1445478
Appl. Phys. Lett. 80, 790–792 (2002) https://doi.org/10.1063/1.1445476
Appl. Phys. Lett. 80, 793–795 (2002) https://doi.org/10.1063/1.1446987

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 80, 796–798 (2002) https://doi.org/10.1063/1.1436524
Appl. Phys. Lett. 80, 799–801 (2002) https://doi.org/10.1063/1.1446991
Appl. Phys. Lett. 80, 802–804 (2002) https://doi.org/10.1063/1.1446204
Appl. Phys. Lett. 80, 805–807 (2002) https://doi.org/10.1063/1.1445274

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 80, 808–810 (2002) https://doi.org/10.1063/1.1436286
Appl. Phys. Lett. 80, 811–813 (2002) https://doi.org/10.1063/1.1445467
Appl. Phys. Lett. 80, 814–816 (2002) https://doi.org/10.1063/1.1446998
Appl. Phys. Lett. 80, 817–819 (2002) https://doi.org/10.1063/1.1445462
Appl. Phys. Lett. 80, 820–822 (2002) https://doi.org/10.1063/1.1436276
Appl. Phys. Lett. 80, 823–825 (2002) https://doi.org/10.1063/1.1446995
Appl. Phys. Lett. 80, 826–828 (2002) https://doi.org/10.1063/1.1447592
Appl. Phys. Lett. 80, 829–831 (2002) https://doi.org/10.1063/1.1447010

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 80, 832–834 (2002) https://doi.org/10.1063/1.1445812
Appl. Phys. Lett. 80, 835–837 (2002) https://doi.org/10.1063/1.1446997
Appl. Phys. Lett. 80, 838–840 (2002) https://doi.org/10.1063/1.1447013

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 80, 841–843 (2002) https://doi.org/10.1063/1.1435802
Appl. Phys. Lett. 80, 844–846 (2002) https://doi.org/10.1063/1.1445811
Appl. Phys. Lett. 80, 847–849 (2002) https://doi.org/10.1063/1.1445804
Appl. Phys. Lett. 80, 850–852 (2002) https://doi.org/10.1063/1.1432748
Appl. Phys. Lett. 80, 853–855 (2002) https://doi.org/10.1063/1.1447316
Appl. Phys. Lett. 80, 856–858 (2002) https://doi.org/10.1063/1.1446994
Appl. Phys. Lett. 80, 859–861 (2002) https://doi.org/10.1063/1.1447315

DEVICE PHYSICS

Appl. Phys. Lett. 80, 862–864 (2002) https://doi.org/10.1063/1.1435071
Appl. Phys. Lett. 80, 865–867 (2002) https://doi.org/10.1063/1.1436275
Appl. Phys. Lett. 80, 868–870 (2002) https://doi.org/10.1063/1.1445484
Appl. Phys. Lett. 80, 871–873 (2002) https://doi.org/10.1063/1.1447594
Appl. Phys. Lett. 80, 874–876 (2002) https://doi.org/10.1063/1.1445271
Appl. Phys. Lett. 80, 877–879 (2002) https://doi.org/10.1063/1.1446990
Appl. Phys. Lett. 80, 880–882 (2002) https://doi.org/10.1063/1.1447005

APPLIED BIOPHYSICS

Appl. Phys. Lett. 80, 883–885 (2002) https://doi.org/10.1063/1.1447008

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 80, 886–887 (2002) https://doi.org/10.1063/1.1447311
Appl. Phys. Lett. 80, 888–890 (2002) https://doi.org/10.1063/1.1446999
Appl. Phys. Lett. 80, 891–893 (2002) https://doi.org/10.1063/1.1447009
Appl. Phys. Lett. 80, 894–896 (2002) https://doi.org/10.1063/1.1446989
Appl. Phys. Lett. 80, 897–899 (2002) https://doi.org/10.1063/1.1446996
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