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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 80, 3467–3469 (2002) https://doi.org/10.1063/1.1476701
Appl. Phys. Lett. 80, 3470–3472 (2002) https://doi.org/10.1063/1.1478786
Appl. Phys. Lett. 80, 3473–3475 (2002) https://doi.org/10.1063/1.1477939
Appl. Phys. Lett. 80, 3476–3478 (2002) https://doi.org/10.1063/1.1477617
Appl. Phys. Lett. 80, 3479–3481 (2002) https://doi.org/10.1063/1.1478780
Appl. Phys. Lett. 80, 3482–3484 (2002) https://doi.org/10.1063/1.1478129
Appl. Phys. Lett. 80, 3485–3487 (2002) https://doi.org/10.1063/1.1476712
Appl. Phys. Lett. 80, 3488–3490 (2002) https://doi.org/10.1063/1.1476396
Appl. Phys. Lett. 80, 3491–3493 (2002) https://doi.org/10.1063/1.1479197
Appl. Phys. Lett. 80, 3494–3496 (2002) https://doi.org/10.1063/1.1479195
Appl. Phys. Lett. 80, 3497–3499 (2002) https://doi.org/10.1063/1.1478157
Appl. Phys. Lett. 80, 3500–3502 (2002) https://doi.org/10.1063/1.1477941
Appl. Phys. Lett. 80, 3503–3505 (2002) https://doi.org/10.1063/1.1477277
Appl. Phys. Lett. 80, 3506–3508 (2002) https://doi.org/10.1063/1.1474618
Appl. Phys. Lett. 80, 3509–3511 (2002) https://doi.org/10.1063/1.1474598
Appl. Phys. Lett. 80, 3512–3514 (2002) https://doi.org/10.1063/1.1476955

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 80, 3515–3517 (2002) https://doi.org/10.1063/1.1478777

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 80, 3518–3520 (2002) https://doi.org/10.1063/1.1479211
Appl. Phys. Lett. 80, 3521–3523 (2002) https://doi.org/10.1063/1.1479206
Appl. Phys. Lett. 80, 3524–3526 (2002) https://doi.org/10.1063/1.1479199
Appl. Phys. Lett. 80, 3527–3529 (2002) https://doi.org/10.1063/1.1478784
Appl. Phys. Lett. 80, 3530–3532 (2002) https://doi.org/10.1063/1.1479458
Appl. Phys. Lett. 80, 3533–3535 (2002) https://doi.org/10.1063/1.1478130
Appl. Phys. Lett. 80, 3536–3538 (2002) https://doi.org/10.1063/1.1479203
Appl. Phys. Lett. 80, 3539–3541 (2002) https://doi.org/10.1063/1.1476383

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 80, 3542–3544 (2002) https://doi.org/10.1063/1.1477620
Appl. Phys. Lett. 80, 3545–3547 (2002) https://doi.org/10.1063/1.1478148
Appl. Phys. Lett. 80, 3548–3550 (2002) https://doi.org/10.1063/1.1478158
Appl. Phys. Lett. 80, 3551–3553 (2002) https://doi.org/10.1063/1.1477275
Appl. Phys. Lett. 80, 3554–3556 (2002) https://doi.org/10.1063/1.1478154
Appl. Phys. Lett. 80, 3557–3559 (2002) https://doi.org/10.1063/1.1478779
Appl. Phys. Lett. 80, 3560–3562 (2002) https://doi.org/10.1063/1.1479457

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 80, 3563–3565 (2002) https://doi.org/10.1063/1.1478151
Appl. Phys. Lett. 80, 3566–3568 (2002) https://doi.org/10.1063/1.1478782
Appl. Phys. Lett. 80, 3569–3571 (2002) https://doi.org/10.1063/1.1479198

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 80, 3572–3574 (2002) https://doi.org/10.1063/1.1477619
Appl. Phys. Lett. 80, 3575–3577 (2002) https://doi.org/10.1063/1.1477268
Appl. Phys. Lett. 80, 3578–3580 (2002) https://doi.org/10.1063/1.1477616
Appl. Phys. Lett. 80, 3581–3583 (2002) https://doi.org/10.1063/1.1477934
Appl. Phys. Lett. 80, 3584–3586 (2002) https://doi.org/10.1063/1.1478781
Appl. Phys. Lett. 80, 3587–3589 (2002) https://doi.org/10.1063/1.1479205
Appl. Phys. Lett. 80, 3590–3592 (2002) https://doi.org/10.1063/1.1479207
Appl. Phys. Lett. 80, 3593–3595 (2002) https://doi.org/10.1063/1.1477272
Appl. Phys. Lett. 80, 3596–3598 (2002) https://doi.org/10.1063/1.1478159
Appl. Phys. Lett. 80, 3599–3601 (2002) https://doi.org/10.1063/1.1477281

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 80, 3602–3604 (2002) https://doi.org/10.1063/1.1477622
Appl. Phys. Lett. 80, 3605–3607 (2002) https://doi.org/10.1063/1.1478152
Appl. Phys. Lett. 80, 3608–3610 (2002) https://doi.org/10.1063/1.1475772
Appl. Phys. Lett. 80, 3611–3613 (2002) https://doi.org/10.1063/1.1479213
Appl. Phys. Lett. 80, 3614–3616 (2002) https://doi.org/10.1063/1.1479202
Appl. Phys. Lett. 80, 3617–3619 (2002) https://doi.org/10.1063/1.1479209
Appl. Phys. Lett. 80, 3620–3622 (2002) https://doi.org/10.1063/1.1478149
Appl. Phys. Lett. 80, 3623–3625 (2002) https://doi.org/10.1063/1.1479204
Appl. Phys. Lett. 80, 3626–3628 (2002) https://doi.org/10.1063/1.1477935
Appl. Phys. Lett. 80, 3629–3631 (2002) https://doi.org/10.1063/1.1479200

DEVICE PHYSICS

Appl. Phys. Lett. 80, 3632–3634 (2002) https://doi.org/10.1063/1.1478156
Appl. Phys. Lett. 80, 3635–3637 (2002) https://doi.org/10.1063/1.1478778
Appl. Phys. Lett. 80, 3638–3640 (2002) https://doi.org/10.1063/1.1478150
Appl. Phys. Lett. 80, 3641–3643 (2002) https://doi.org/10.1063/1.1479450

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 80, 3644–3646 (2002) https://doi.org/10.1063/1.1477942
Appl. Phys. Lett. 80, 3647–3649 (2002) https://doi.org/10.1063/1.1479208

ERRATA

Appl. Phys. Lett. 80, 3650 (2002) https://doi.org/10.1063/1.1472474
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