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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 80, 3247–3249 (2002) https://doi.org/10.1063/1.1476720
Appl. Phys. Lett. 80, 3250–3252 (2002) https://doi.org/10.1063/1.1476399
Appl. Phys. Lett. 80, 3253–3255 (2002) https://doi.org/10.1063/1.1475364
Appl. Phys. Lett. 80, 3256–3258 (2002) https://doi.org/10.1063/1.1476711
Appl. Phys. Lett. 80, 3259–3261 (2002) https://doi.org/10.1063/1.1475366
Appl. Phys. Lett. 80, 3262–3264 (2002) https://doi.org/10.1063/1.1476395
Appl. Phys. Lett. 80, 3265–3267 (2002) https://doi.org/10.1063/1.1476387
Appl. Phys. Lett. 80, 3268–3270 (2002) https://doi.org/10.1063/1.1477267
Appl. Phys. Lett. 80, 3271–3273 (2002) https://doi.org/10.1063/1.1476959
Appl. Phys. Lett. 80, 3274–3276 (2002) https://doi.org/10.1063/1.1476723
Appl. Phys. Lett. 80, 3277–3279 (2002) https://doi.org/10.1063/1.1476708
Appl. Phys. Lett. 80, 3280–3282 (2002) https://doi.org/10.1063/1.1476384
Appl. Phys. Lett. 80, 3283–3285 (2002) https://doi.org/10.1063/1.1477270
Appl. Phys. Lett. 80, 3286–3288 (2002) https://doi.org/10.1063/1.1471933
Appl. Phys. Lett. 80, 3289–3291 (2002) https://doi.org/10.1063/1.1479214

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 80, 3292–3294 (2002) https://doi.org/10.1063/1.1476386
Appl. Phys. Lett. 80, 3295–3297 (2002) https://doi.org/10.1063/1.1475774
Appl. Phys. Lett. 80, 3298–3300 (2002) https://doi.org/10.1063/1.1469659
Appl. Phys. Lett. 80, 3301–3303 (2002) https://doi.org/10.1063/1.1476058
Appl. Phys. Lett. 80, 3304–3306 (2002) https://doi.org/10.1063/1.1473237
Appl. Phys. Lett. 80, 3307–3309 (2002) https://doi.org/10.1063/1.1476721
Appl. Phys. Lett. 80, 3310–3312 (2002) https://doi.org/10.1063/1.1476064
Appl. Phys. Lett. 80, 3313–3315 (2002) https://doi.org/10.1063/1.1476705
Appl. Phys. Lett. 80, 3316–3318 (2002) https://doi.org/10.1063/1.1476960
Appl. Phys. Lett. 80, 3319–3321 (2002) https://doi.org/10.1063/1.1476388
Appl. Phys. Lett. 80, 3322–3324 (2002) https://doi.org/10.1063/1.1476401
Appl. Phys. Lett. 80, 3325–3327 (2002) https://doi.org/10.1063/1.1476706
Appl. Phys. Lett. 80, 3328–3330 (2002) https://doi.org/10.1063/1.1477269

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 80, 3331–3333 (2002) https://doi.org/10.1063/1.1476700
Appl. Phys. Lett. 80, 3334–3336 (2002) https://doi.org/10.1063/1.1476709
Appl. Phys. Lett. 80, 3337–3339 (2002) https://doi.org/10.1063/1.1476394
Appl. Phys. Lett. 80, 3340–3342 (2002) https://doi.org/10.1063/1.1477274
Appl. Phys. Lett. 80, 3343–3345 (2002) https://doi.org/10.1063/1.1471376
Appl. Phys. Lett. 80, 3346–3348 (2002) https://doi.org/10.1063/1.1473868
Appl. Phys. Lett. 80, 3349–3351 (2002) https://doi.org/10.1063/1.1476400
Appl. Phys. Lett. 80, 3352–3354 (2002) https://doi.org/10.1063/1.1477273
Appl. Phys. Lett. 80, 3355–3357 (2002) https://doi.org/10.1063/1.1477271

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 80, 3358–3360 (2002) https://doi.org/10.1063/1.1478146
Appl. Phys. Lett. 80, 3361–3363 (2002) https://doi.org/10.1063/1.1473870
Appl. Phys. Lett. 80, 3364–3366 (2002) https://doi.org/10.1063/1.1474610
Appl. Phys. Lett. 80, 3367–3369 (2002) https://doi.org/10.1063/1.1477940

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 80, 3370–3372 (2002) https://doi.org/10.1063/1.1472476
Appl. Phys. Lett. 80, 3373–3375 (2002) https://doi.org/10.1063/1.1476063
Appl. Phys. Lett. 80, 3376–3378 (2002) https://doi.org/10.1063/1.1475367
Appl. Phys. Lett. 80, 3379–3381 (2002) https://doi.org/10.1063/1.1477279
Appl. Phys. Lett. 80, 3382–3384 (2002) https://doi.org/10.1063/1.1476707
Appl. Phys. Lett. 80, 3385–3387 (2002) https://doi.org/10.1063/1.1477266
Appl. Phys. Lett. 80, 3388–3390 (2002) https://doi.org/10.1063/1.1476385
Appl. Phys. Lett. 80, 3391–3393 (2002) https://doi.org/10.1063/1.1477278
Appl. Phys. Lett. 80, 3394–3396 (2002) https://doi.org/10.1063/1.1477618

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 80, 3397–3399 (2002) https://doi.org/10.1063/1.1476059
Appl. Phys. Lett. 80, 3400–3402 (2002) https://doi.org/10.1063/1.1476956
Appl. Phys. Lett. 80, 3403–3405 (2002) https://doi.org/10.1063/1.1476713
Appl. Phys. Lett. 80, 3406–3408 (2002) https://doi.org/10.1063/1.1476398
Appl. Phys. Lett. 80, 3409–3411 (2002) https://doi.org/10.1063/1.1476062
Appl. Phys. Lett. 80, 3412–3414 (2002) https://doi.org/10.1063/1.1476702
Appl. Phys. Lett. 80, 3415–3417 (2002) https://doi.org/10.1063/1.1478155

DEVICE PHYSICS

Appl. Phys. Lett. 80, 3418–3420 (2002) https://doi.org/10.1063/1.1476061
Appl. Phys. Lett. 80, 3421–3423 (2002) https://doi.org/10.1063/1.1476060
Appl. Phys. Lett. 80, 3424–3426 (2002) https://doi.org/10.1063/1.1473871
Appl. Phys. Lett. 80, 3427–3429 (2002) https://doi.org/10.1063/1.1475360
Appl. Phys. Lett. 80, 3430–3432 (2002) https://doi.org/10.1063/1.1476704
Appl. Phys. Lett. 80, 3433–3435 (2002) https://doi.org/10.1063/1.1473685
Appl. Phys. Lett. 80, 3436–3438 (2002) https://doi.org/10.1063/1.1473861
Appl. Phys. Lett. 80, 3439–3441 (2002) https://doi.org/10.1063/1.1476389

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 80, 3442–3444 (2002) https://doi.org/10.1063/1.1476722
Appl. Phys. Lett. 80, 3445–3447 (2002) https://doi.org/10.1063/1.1477276
Appl. Phys. Lett. 80, 3448–3450 (2002) https://doi.org/10.1063/1.1468267
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