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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 80, 2239–2241 (2002) https://doi.org/10.1063/1.1464228
Appl. Phys. Lett. 80, 2242–2244 (2002) https://doi.org/10.1063/1.1466519
Appl. Phys. Lett. 80, 2245–2247 (2002) https://doi.org/10.1063/1.1465111
Appl. Phys. Lett. 80, 2248–2250 (2002) https://doi.org/10.1063/1.1465113
Appl. Phys. Lett. 80, 2251–2253 (2002) https://doi.org/10.1063/1.1466537
Appl. Phys. Lett. 80, 2254–2256 (2002) https://doi.org/10.1063/1.1463699
Appl. Phys. Lett. 80, 2257–2259 (2002) https://doi.org/10.1063/1.1465520
Appl. Phys. Lett. 80, 2260–2262 (2002) https://doi.org/10.1063/1.1465131
Appl. Phys. Lett. 80, 2263–2265 (2002) https://doi.org/10.1063/1.1459769

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 80, 2266–2268 (2002) https://doi.org/10.1063/1.1466521
Appl. Phys. Lett. 80, 2269–2271 (2002) https://doi.org/10.1063/1.1458071
Appl. Phys. Lett. 80, 2272–2274 (2002) https://doi.org/10.1063/1.1463702
Appl. Phys. Lett. 80, 2275–2277 (2002) https://doi.org/10.1063/1.1464664
Appl. Phys. Lett. 80, 2278–2280 (2002) https://doi.org/10.1063/1.1465517
Appl. Phys. Lett. 80, 2281–2283 (2002) https://doi.org/10.1063/1.1465530
Appl. Phys. Lett. 80, 2284–2286 (2002) https://doi.org/10.1063/1.1459762
Appl. Phys. Lett. 80, 2287–2289 (2002) https://doi.org/10.1063/1.1465130
Appl. Phys. Lett. 80, 2290–2292 (2002) https://doi.org/10.1063/1.1466518
Appl. Phys. Lett. 80, 2293–2295 (2002) https://doi.org/10.1063/1.1465531
Appl. Phys. Lett. 80, 2296–2298 (2002) https://doi.org/10.1063/1.1465107
Appl. Phys. Lett. 80, 2299–2301 (2002) https://doi.org/10.1063/1.1465524
Appl. Phys. Lett. 80, 2302–2304 (2002) https://doi.org/10.1063/1.1465105
Appl. Phys. Lett. 80, 2305–2307 (2002) https://doi.org/10.1063/1.1463205

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 80, 2308–2310 (2002) https://doi.org/10.1063/1.1462862
Appl. Phys. Lett. 80, 2311–2313 (2002) https://doi.org/10.1063/1.1465521
Appl. Phys. Lett. 80, 2314–2316 (2002) https://doi.org/10.1063/1.1465522
Appl. Phys. Lett. 80, 2317–2319 (2002) https://doi.org/10.1063/1.1464666
Appl. Phys. Lett. 80, 2320–2322 (2002) https://doi.org/10.1063/1.1463706
Appl. Phys. Lett. 80, 2323–2325 (2002) https://doi.org/10.1063/1.1466522
Appl. Phys. Lett. 80, 2326–2328 (2002) https://doi.org/10.1063/1.1465108
Appl. Phys. Lett. 80, 2329–2331 (2002) https://doi.org/10.1063/1.1465527
Appl. Phys. Lett. 80, 2332–2334 (2002) https://doi.org/10.1063/1.1461056

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 80, 2335–2337 (2002) https://doi.org/10.1063/1.1462872
Appl. Phys. Lett. 80, 2338–2340 (2002) https://doi.org/10.1063/1.1459484
Appl. Phys. Lett. 80, 2341–2343 (2002) https://doi.org/10.1063/1.1464661
Appl. Phys. Lett. 80, 2344–2346 (2002) https://doi.org/10.1063/1.1464662
Appl. Phys. Lett. 80, 2347–2349 (2002) https://doi.org/10.1063/1.1465129
Appl. Phys. Lett. 80, 2350–2352 (2002) https://doi.org/10.1063/1.1464663
Appl. Phys. Lett. 80, 2353–2355 (2002) https://doi.org/10.1063/1.1466520
Appl. Phys. Lett. 80, 2356–2358 (2002) https://doi.org/10.1063/1.1467616

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 80, 2359–2361 (2002) https://doi.org/10.1063/1.1464665
Appl. Phys. Lett. 80, 2362–2364 (2002) https://doi.org/10.1063/1.1465532
Appl. Phys. Lett. 80, 2365–2367 (2002) https://doi.org/10.1063/1.1465132
Appl. Phys. Lett. 80, 2368–2370 (2002) https://doi.org/10.1063/1.1466534
Appl. Phys. Lett. 80, 2371–2373 (2002) https://doi.org/10.1063/1.1463697
Appl. Phys. Lett. 80, 2374–2376 (2002) https://doi.org/10.1063/1.1459765
Appl. Phys. Lett. 80, 2377–2379 (2002) https://doi.org/10.1063/1.1467619

NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 80, 2380–2382 (2002) https://doi.org/10.1063/1.1463704
Appl. Phys. Lett. 80, 2383–2385 (2002) https://doi.org/10.1063/1.1465529
Appl. Phys. Lett. 80, 2386–2388 (2002) https://doi.org/10.1063/1.1463212
Appl. Phys. Lett. 80, 2389–2391 (2002) https://doi.org/10.1063/1.1466517
Appl. Phys. Lett. 80, 2392–2394 (2002) https://doi.org/10.1063/1.1465109
Appl. Phys. Lett. 80, 2395–2397 (2002) https://doi.org/10.1063/1.1465528
Appl. Phys. Lett. 80, 2398–2400 (2002) https://doi.org/10.1063/1.1465128

DEVICE PHYSICS

Appl. Phys. Lett. 80, 2401–2403 (2002) https://doi.org/10.1063/1.1467614
Appl. Phys. Lett. 80, 2404–2406 (2002) https://doi.org/10.1063/1.1467615

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 80, 2407–2409 (2002) https://doi.org/10.1063/1.1464224
Appl. Phys. Lett. 80, 2410–2412 (2002) https://doi.org/10.1063/1.1465518
Appl. Phys. Lett. 80, 2413–2415 (2002) https://doi.org/10.1063/1.1465525
Appl. Phys. Lett. 80, 2416–2418 (2002) https://doi.org/10.1063/1.1465110

COMMENTS

Appl. Phys. Lett. 80, 2419 (2002) https://doi.org/10.1063/1.1465126
Appl. Phys. Lett. 80, 2420 (2002) https://doi.org/10.1063/1.1465127

ERRATA

Appl. Phys. Lett. 80, 2421 (2002) https://doi.org/10.1063/1.1471915

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