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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 76, 3673–3675 (2000) https://doi.org/10.1063/1.126745
Appl. Phys. Lett. 76, 3676–3678 (2000) https://doi.org/10.1063/1.126746
Appl. Phys. Lett. 76, 3679–3681 (2000) https://doi.org/10.1063/1.126747
Appl. Phys. Lett. 76, 3682–3684 (2000) https://doi.org/10.1063/1.126748
Appl. Phys. Lett. 76, 3685–3687 (2000) https://doi.org/10.1063/1.126749
Appl. Phys. Lett. 76, 3688–3690 (2000) https://doi.org/10.1063/1.126750
Appl. Phys. Lett. 76, 3691–3693 (2000) https://doi.org/10.1063/1.126751

PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 76, 3694–3696 (2000) https://doi.org/10.1063/1.126752

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 76, 3697–3699 (2000) https://doi.org/10.1063/1.126753
Appl. Phys. Lett. 76, 3700–3702 (2000) https://doi.org/10.1063/1.126754
Appl. Phys. Lett. 76, 3703–3705 (2000) https://doi.org/10.1063/1.126755
Appl. Phys. Lett. 76, 3706–3708 (2000) https://doi.org/10.1063/1.126756
Appl. Phys. Lett. 76, 3709–3711 (2000) https://doi.org/10.1063/1.126757
Appl. Phys. Lett. 76, 3712–3714 (2000) https://doi.org/10.1063/1.126758
Appl. Phys. Lett. 76, 3715–3717 (2000) https://doi.org/10.1063/1.126759
Appl. Phys. Lett. 76, 3718–3720 (2000) https://doi.org/10.1063/1.126760
Appl. Phys. Lett. 76, 3721–3722 (2000) https://doi.org/10.1063/1.126761
Appl. Phys. Lett. 76, 3723–3725 (2000) https://doi.org/10.1063/1.126762
Appl. Phys. Lett. 76, 3726–3728 (2000) https://doi.org/10.1063/1.126763
Appl. Phys. Lett. 76, 3729–3731 (2000) https://doi.org/10.1063/1.126764
Appl. Phys. Lett. 76, 3732–3734 (2000) https://doi.org/10.1063/1.126765
Appl. Phys. Lett. 76, 3735–3737 (2000) https://doi.org/10.1063/1.126766
Appl. Phys. Lett. 76, 3738–3740 (2000) https://doi.org/10.1063/1.126767

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 76, 3741–3743 (2000) https://doi.org/10.1063/1.126768
Appl. Phys. Lett. 76, 3744–3746 (2000) https://doi.org/10.1063/1.126769
Appl. Phys. Lett. 76, 3747–3749 (2000) https://doi.org/10.1063/1.126770
Appl. Phys. Lett. 76, 3750–3752 (2000) https://doi.org/10.1063/1.126771
Appl. Phys. Lett. 76, 3753–3755 (2000) https://doi.org/10.1063/1.126744
Appl. Phys. Lett. 76, 3756–3758 (2000) https://doi.org/10.1063/1.126797
Appl. Phys. Lett. 76, 3759–3761 (2000) https://doi.org/10.1063/1.126772
Appl. Phys. Lett. 76, 3762–3764 (2000) https://doi.org/10.1063/1.126773
Appl. Phys. Lett. 76, 3765–3767 (2000) https://doi.org/10.1063/1.126774
Appl. Phys. Lett. 76, 3768–3770 (2000) https://doi.org/10.1063/1.126775
Appl. Phys. Lett. 76, 3771–3773 (2000) https://doi.org/10.1063/1.126776
Appl. Phys. Lett. 76, 3774–3776 (2000) https://doi.org/10.1063/1.126777
Appl. Phys. Lett. 76, 3777–3779 (2000) https://doi.org/10.1063/1.126778

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 76, 3780–3782 (2000) https://doi.org/10.1063/1.126779
Appl. Phys. Lett. 76, 3783–3785 (2000) https://doi.org/10.1063/1.126780
Appl. Phys. Lett. 76, 3786–3788 (2000) https://doi.org/10.1063/1.126781
Appl. Phys. Lett. 76, 3789–3791 (2000) https://doi.org/10.1063/1.126782
Appl. Phys. Lett. 76, 3792–3794 (2000) https://doi.org/10.1063/1.126783
Appl. Phys. Lett. 76, 3795–3797 (2000) https://doi.org/10.1063/1.126784

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 76, 3798–3800 (2000) https://doi.org/10.1063/1.126785
Appl. Phys. Lett. 76, 3801–3803 (2000) https://doi.org/10.1063/1.126786
Appl. Phys. Lett. 76, 3804–3806 (2000) https://doi.org/10.1063/1.126787

DEVICE PHYSICS

Appl. Phys. Lett. 76, 3807–3809 (2000) https://doi.org/10.1063/1.126788
Appl. Phys. Lett. 76, 3810–3812 (2000) https://doi.org/10.1063/1.126789
Appl. Phys. Lett. 76, 3813–3815 (2000) https://doi.org/10.1063/1.126790
Appl. Phys. Lett. 76, 3816–3818 (2000) https://doi.org/10.1063/1.126791
Appl. Phys. Lett. 76, 3819–3821 (2000) https://doi.org/10.1063/1.126792

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 76, 3822–3824 (2000) https://doi.org/10.1063/1.126793
Appl. Phys. Lett. 76, 3825–3827 (2000) https://doi.org/10.1063/1.126794
Appl. Phys. Lett. 76, 3828–3830 (2000) https://doi.org/10.1063/1.126795
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