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Issues

LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 76, 3161–3163 (2000) https://doi.org/10.1063/1.126616
Appl. Phys. Lett. 76, 3164–3166 (2000) https://doi.org/10.1063/1.126617
Appl. Phys. Lett. 76, 3167–3169 (2000) https://doi.org/10.1063/1.126618
Appl. Phys. Lett. 76, 3170–3172 (2000) https://doi.org/10.1063/1.126619
Appl. Phys. Lett. 76, 3173–3175 (2000) https://doi.org/10.1063/1.126620
Appl. Phys. Lett. 76, 3176–3178 (2000) https://doi.org/10.1063/1.126621
Appl. Phys. Lett. 76, 3179–3181 (2000) https://doi.org/10.1063/1.126622
Appl. Phys. Lett. 76, 3182–3184 (2000) https://doi.org/10.1063/1.126639
Appl. Phys. Lett. 76, 3185–3187 (2000) https://doi.org/10.1063/1.126623
Appl. Phys. Lett. 76, 3188–3190 (2000) https://doi.org/10.1063/1.126624
Appl. Phys. Lett. 76, 3191–3193 (2000) https://doi.org/10.1063/1.126625

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 76, 3194–3196 (2000) https://doi.org/10.1063/1.126626
Appl. Phys. Lett. 76, 3197–3199 (2000) https://doi.org/10.1063/1.126627
Appl. Phys. Lett. 76, 3200–3202 (2000) https://doi.org/10.1063/1.126628
Appl. Phys. Lett. 76, 3203–3205 (2000) https://doi.org/10.1063/1.126629
Appl. Phys. Lett. 76, 3206–3208 (2000) https://doi.org/10.1063/1.126630
Appl. Phys. Lett. 76, 3209–3211 (2000) https://doi.org/10.1063/1.126631
Appl. Phys. Lett. 76, 3212–3214 (2000) https://doi.org/10.1063/1.126632
Appl. Phys. Lett. 76, 3215–3217 (2000) https://doi.org/10.1063/1.126633
Appl. Phys. Lett. 76, 3218–3220 (2000) https://doi.org/10.1063/1.126634
Appl. Phys. Lett. 76, 3221–3223 (2000) https://doi.org/10.1063/1.126587
Appl. Phys. Lett. 76, 3224–3226 (2000) https://doi.org/10.1063/1.126588
Appl. Phys. Lett. 76, 3227–3229 (2000) https://doi.org/10.1063/1.126589
Appl. Phys. Lett. 76, 3230–3232 (2000) https://doi.org/10.1063/1.126590
Appl. Phys. Lett. 76, 3233–3235 (2000) https://doi.org/10.1063/1.126591
Appl. Phys. Lett. 76, 3236–3238 (2000) https://doi.org/10.1063/1.126592
Appl. Phys. Lett. 76, 3239–3241 (2000) https://doi.org/10.1063/1.126593
Appl. Phys. Lett. 76, 3242–3244 (2000) https://doi.org/10.1063/1.126594

ELECTRONIC TRANSPORT AND SEMICONDUCTORS

Appl. Phys. Lett. 76, 3245–3247 (2000) https://doi.org/10.1063/1.126595
Appl. Phys. Lett. 76, 3248–3250 (2000) https://doi.org/10.1063/1.126596
Appl. Phys. Lett. 76, 3251–3253 (2000) https://doi.org/10.1063/1.126597
Appl. Phys. Lett. 76, 3254–3256 (2000) https://doi.org/10.1063/1.126598
Appl. Phys. Lett. 76, 3257–3258 (2000) https://doi.org/10.1063/1.126599
Appl. Phys. Lett. 76, 3259–3261 (2000) https://doi.org/10.1063/1.126600
Appl. Phys. Lett. 76, 3262–3264 (2000) https://doi.org/10.1063/1.126601
Appl. Phys. Lett. 76, 3265–3267 (2000) https://doi.org/10.1063/1.126640
Appl. Phys. Lett. 76, 3268–3270 (2000) https://doi.org/10.1063/1.126602
Appl. Phys. Lett. 76, 3271–3273 (2000) https://doi.org/10.1063/1.126603

MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 76, 3274–3276 (2000) https://doi.org/10.1063/1.126604
Appl. Phys. Lett. 76, 3277–3279 (2000) https://doi.org/10.1063/1.126605
Appl. Phys. Lett. 76, 3280–3282 (2000) https://doi.org/10.1063/1.126606
Appl. Phys. Lett. 76, 3283–3285 (2000) https://doi.org/10.1063/1.126607
Appl. Phys. Lett. 76, 3286–3288 (2000) https://doi.org/10.1063/1.126608
Appl. Phys. Lett. 76, 3289–3291 (2000) https://doi.org/10.1063/1.126609

DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 76, 3292–3294 (2000) https://doi.org/10.1063/1.126610
Appl. Phys. Lett. 76, 3295–3297 (2000) https://doi.org/10.1063/1.126611

DEVICE PHYSICS

Appl. Phys. Lett. 76, 3298–3300 (2000) https://doi.org/10.1063/1.126612
Appl. Phys. Lett. 76, 3301–3303 (2000) https://doi.org/10.1063/1.126613
Appl. Phys. Lett. 76, 3304–3306 (2000) https://doi.org/10.1063/1.126614
Appl. Phys. Lett. 76, 3307–3309 (2000) https://doi.org/10.1063/1.126615

INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 76, 3310–3312 (2000) https://doi.org/10.1063/1.126635
Appl. Phys. Lett. 76, 3313–3315 (2000) https://doi.org/10.1063/1.126636
Appl. Phys. Lett. 76, 3316–3318 (2000) https://doi.org/10.1063/1.126637
Appl. Phys. Lett. 76, 3319–3321 (2000) https://doi.org/10.1063/1.126638
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