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Issues
29 May 2000
ISSN 0003-6951
EISSN 1077-3118
LASERS, OPTICS, AND OPTOELECTRONICS
Improvement of quantum efficiency in polymer light-emitting diodes by a single-ion conductor
Appl. Phys. Lett. 76, 3161–3163 (2000)
https://doi.org/10.1063/1.126616
Mid-infrared angled-grating distributed feedback laser
Appl. Phys. Lett. 76, 3164–3166 (2000)
https://doi.org/10.1063/1.126617
Low-threshold interband cascade lasers with power efficiency exceeding 9%
Appl. Phys. Lett. 76, 3167–3169 (2000)
https://doi.org/10.1063/1.126618
Wavelength switching by positively detuned side-mode injection in semiconductor lasers
Appl. Phys. Lett. 76, 3170–3172 (2000)
https://doi.org/10.1063/1.126619
All-optical wavelength converter and switch based on electromagnetically induced transparency
Appl. Phys. Lett. 76, 3173–3175 (2000)
https://doi.org/10.1063/1.126620
Picosecond dynamics of terahertz-sideband generation in far-infrared illuminated quantum wells
Appl. Phys. Lett. 76, 3176–3178 (2000)
https://doi.org/10.1063/1.126621
Spontaneous emission model of lateral light extraction from heterostructure light-emitting diodes
Appl. Phys. Lett. 76, 3179–3181 (2000)
https://doi.org/10.1063/1.126622
Photoluminescence studies of type-II self-assembled quantum dots grown on GaAs substrate
Appl. Phys. Lett. 76, 3188–3190 (2000)
https://doi.org/10.1063/1.126624
Generation and field-resolved detection of femtosecond electromagnetic pulses tunable up to 41 THz
Appl. Phys. Lett. 76, 3191–3193 (2000)
https://doi.org/10.1063/1.126625
STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER
Oxidation resistance of protective coatings studied by spectroscopic ellipsometry
Appl. Phys. Lett. 76, 3194–3196 (2000)
https://doi.org/10.1063/1.126626
Annealing of ultrashallow junction by 248 nm excimer laser and rapid thermal processing with different preamorphization depths
Appl. Phys. Lett. 76, 3197–3199 (2000)
https://doi.org/10.1063/1.126627
Resistless pattern definition and Si selective-area deposition using an ultrathin mask layer treated by
Appl. Phys. Lett. 76, 3203–3205 (2000)
https://doi.org/10.1063/1.126629
Implanted argon atoms as sensing probes of residual stress in ultrathin films
Appl. Phys. Lett. 76, 3206–3208 (2000)
https://doi.org/10.1063/1.126630
Ultraviolet photoluminescence of porous silica
Appl. Phys. Lett. 76, 3209–3211 (2000)
https://doi.org/10.1063/1.126631
Selective growth of InGaN quantum dot structures and their microphotoluminescence at room temperature
Appl. Phys. Lett. 76, 3212–3214 (2000)
https://doi.org/10.1063/1.126632
Nanoscale pattern formation in Pt thin films due to ion-beam-induced dewetting
Appl. Phys. Lett. 76, 3215–3217 (2000)
https://doi.org/10.1063/1.126633
Ordering and orientation of granular films with additive Ag
Appl. Phys. Lett. 76, 3218–3220 (2000)
https://doi.org/10.1063/1.126634
Dielectric constant measurement of thin films by differential time-domain spectroscopy
Appl. Phys. Lett. 76, 3221–3223 (2000)
https://doi.org/10.1063/1.126587
Time-resolved photoluminescence study of isoelectronic In-doped GaN films grown by metalorganic vapor-phase epitaxy
Appl. Phys. Lett. 76, 3224–3226 (2000)
https://doi.org/10.1063/1.126588
Surface relief gratings from electrostatically layered azo dye films
Appl. Phys. Lett. 76, 3233–3235 (2000)
https://doi.org/10.1063/1.126591
Long ropes of boron nitride nanotubes grown by a continuous laser heating
Appl. Phys. Lett. 76, 3239–3241 (2000)
https://doi.org/10.1063/1.126593
Comparison of Si doping effect in optical properties of GaN epilayers and quantum wells
Appl. Phys. Lett. 76, 3242–3244 (2000)
https://doi.org/10.1063/1.126594
ELECTRONIC TRANSPORT AND SEMICONDUCTORS
Photocarrier injection effect on double exchange ferromagnetism in heterostructure
Appl. Phys. Lett. 76, 3245–3247 (2000)
https://doi.org/10.1063/1.126595
Nature of the fundamental band gap in alloys
Appl. Phys. Lett. 76, 3251–3253 (2000)
https://doi.org/10.1063/1.126597
Large electrically induced transmission changes of GaAs/AlGaAs quantum-cascade structures
Appl. Phys. Lett. 76, 3254–3256 (2000)
https://doi.org/10.1063/1.126598
Complete surface exfoliation of 4H–SiC by - and -coimplantation
Appl. Phys. Lett. 76, 3265–3267 (2000)
https://doi.org/10.1063/1.126640
Low-frequency noise in gate overlapped lightly doped drain polycrystalline silicon thin-film transistors
Appl. Phys. Lett. 76, 3268–3270 (2000)
https://doi.org/10.1063/1.126602
Formation of silicon islands on a silicon on insulator substrate upon thermal annealing
Appl. Phys. Lett. 76, 3271–3273 (2000)
https://doi.org/10.1063/1.126603
MAGNETISM AND SUPERCONDUCTIVITY
Unprecedented magnetoresistance in Cd-substituted pyrochlores
J. A. Alonso; P. Velasco; M. J. Martı́nez-Lope; M. T. Casais; J. L. Martı́nez; Marı́a T. Fernández-Dı́az; J. M. de Paoli
Appl. Phys. Lett. 76, 3274–3276 (2000)
https://doi.org/10.1063/1.126604
Low-frequency noise reduction in superconducting quantum interference devices by antidots
Appl. Phys. Lett. 76, 3277–3279 (2000)
https://doi.org/10.1063/1.126605
Epitaxial growth and magnetic properties of single-crystal Heusler alloy films on GaAs (001)
Appl. Phys. Lett. 76, 3280–3282 (2000)
https://doi.org/10.1063/1.126606
Hall cross size scaling and its application to measurements on nanometer-size iron particle arrays
Appl. Phys. Lett. 76, 3283–3285 (2000)
https://doi.org/10.1063/1.126607
Magnetoresistive tunnel junctions deposited on laterally modulated substrates
F. Montaigne; P. Gogol; J. Briatico; J. L. Maurice; F. Nguyen Van Dau; F. Petroff; A. Fert; A. Schuhl
Appl. Phys. Lett. 76, 3286–3288 (2000)
https://doi.org/10.1063/1.126608
DIELECTRICS AND FERROELECTRICITY
Evaluation of niobium effects on the longitudinal piezoelectric coefficients of thin films
Appl. Phys. Lett. 76, 3292–3294 (2000)
https://doi.org/10.1063/1.126610
Simultaneous imaging of dielectric properties and topography in a crystal by near-field scanning microwave microscopy
Appl. Phys. Lett. 76, 3295–3297 (2000)
https://doi.org/10.1063/1.126611
DEVICE PHYSICS
Direct response of twin-slot antenna-coupled hot-electron bolometer mixers designed for 2.5 THz radiation detection
Appl. Phys. Lett. 76, 3304–3306 (2000)
https://doi.org/10.1063/1.126614
Reliable contacts to two-dimensional conduction layers
Victor Souw; Shi Li; M. McElfresh; Zhan Duan; D. McInturff; Aristo Yulius; E.-H. Chen; J. M. Woodall
Appl. Phys. Lett. 76, 3307–3309 (2000)
https://doi.org/10.1063/1.126615
INTERDISCIPLINARY AND GENERAL PHYSICS
Particle imaging technique for measuring the deformation rate of hydrogel microstructures
Appl. Phys. Lett. 76, 3310–3312 (2000)
https://doi.org/10.1063/1.126635
Electrochemical passivation of gallium arsenide surface with organic self-assembled monolayers in aqueous electrolytes
Klaus Adlkofer; Motomu Tanaka; Heiko Hillebrandt; Gerald Wiegand; Erich Sackmann; Tibor Bolom; Rainer Deutschmann; Gerhard Abstreiter
Appl. Phys. Lett. 76, 3313–3315 (2000)
https://doi.org/10.1063/1.126636
High-resolution micromachined interferometric accelerometer
Appl. Phys. Lett. 76, 3316–3318 (2000)
https://doi.org/10.1063/1.126637
Maskless fabrication of field-emitter array by focused ion and electron beam
Appl. Phys. Lett. 76, 3319–3321 (2000)
https://doi.org/10.1063/1.126638
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.
Era of entropy: Synthesis, structure, properties, and applications of high-entropy materials
Christina M. Rost, Alessandro R. Mazza, et al.
Piezoelectric phononic integrated circuits
Krishna C. Balram