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Issues
30 August 1999
ISSN 0003-6951
EISSN 1077-3118
In this Issue
LASERS, OPTICS, AND OPTOELECTRONICS
Red light emission by photoluminescence and electroluminescence from Eu-doped GaN
Appl. Phys. Lett. 75, 1189–1191 (1999)
https://doi.org/10.1063/1.124686
Room-temperature photopumped InGaN/GaN/AlGaN vertical-cavity surface-emitting laser
I. L. Krestnikov; W. V. Lundin; A. V. Sakharov; V. A. Semenov; A. S. Usikov; A. F. Tsatsul’nikov; Zh. I. Alferov; N. N. Ledentsov; A. Hoffmann; D. Bimberg
Appl. Phys. Lett. 75, 1192–1194 (1999)
https://doi.org/10.1063/1.124638
Experimental investigation of wavelength conversion based on four-wave mixing in a three-electrode distributed feedback laser
Appl. Phys. Lett. 75, 1195–1197 (1999)
https://doi.org/10.1063/1.124639
Wavelength shifting of optical pulses through cascaded second-order processes in a lithium–niobate channel waveguide
Appl. Phys. Lett. 75, 1198–1200 (1999)
https://doi.org/10.1063/1.124640
Two-dimensional metallodielectric photonic crystal with a large band gap
Chongjun Jin; Bingying Cheng; Baoyuan Man; Daozhong Zhang; Shouzheng Ban; Bo Sun; Lieming Li; Xiangdong Zhang; Zhaoqing Zhang
Appl. Phys. Lett. 75, 1201–1203 (1999)
https://doi.org/10.1063/1.124641
optical parametric oscillator continuously tunable from 3.9 to 11.3 μm
Appl. Phys. Lett. 75, 1204–1206 (1999)
https://doi.org/10.1063/1.124642
Efficient channel-waveguide laser in Nd:GGG at 1.062 μm wavelength
Appl. Phys. Lett. 75, 1210–1212 (1999)
https://doi.org/10.1063/1.124644
Effect of external feedback on lasing in random media
Appl. Phys. Lett. 75, 1213–1215 (1999)
https://doi.org/10.1063/1.124645
PLASMAS AND ELECTRICAL DISCHARGES
Nonlinear changes in plasma and crater properties during laser ablation of Si
Appl. Phys. Lett. 75, 1216–1218 (1999)
https://doi.org/10.1063/1.124646
STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER
Defects in thermal oxide studied by photoluminescence spectroscopy
Appl. Phys. Lett. 75, 1219–1221 (1999)
https://doi.org/10.1063/1.124647
Optical and structural studies of Ge nanocrystals embedded in AlN matrix fabricated by pulsed laser deposition
Appl. Phys. Lett. 75, 1222–1224 (1999)
https://doi.org/10.1063/1.124648
Optimized configuration for reflective bistable twisted nematic displays
Appl. Phys. Lett. 75, 1225–1227 (1999)
https://doi.org/10.1063/1.124649
Field-emission studies of smooth and nanostructured carbon films
Appl. Phys. Lett. 75, 1228–1230 (1999)
https://doi.org/10.1063/1.124650
Kinetics of radiative recombination in strongly excited ZnSe/BeTe superlattices with a type-II band alignment
A. A. Maksimov; S. V. Zaitsev; I. I. Tartakovskii; V. D. Kulakovskii; D. R. Yakovlev; W. Ossau; M. Keim; G. Reuscher; A. Waag; G. Landwehr
Appl. Phys. Lett. 75, 1231–1233 (1999)
https://doi.org/10.1063/1.124651
A regime of the yield point of silicon at high temperatures
Appl. Phys. Lett. 75, 1234–1236 (1999)
https://doi.org/10.1063/1.124652
Kelvin probe and scanning tunneling microscope characterization of Langmuir–Blodgett sapphyrin films
C. Goletti; A. Sgarlata; N. Motta; P. Chiaradia; R. Paolesse; A. Angelaccio; M. Drago; C. Di Natale; A. D’Amico; M. Cocco; V. I. Troitsky
Appl. Phys. Lett. 75, 1237–1239 (1999)
https://doi.org/10.1063/1.124653
ELECTRONIC TRANSPORT AND SEMICONDUCTORS
The role of potential fluctuations in continuous-wave donor–acceptor pair luminescence of heavily doped materials
Appl. Phys. Lett. 75, 1243–1245 (1999)
https://doi.org/10.1063/1.124655
Electro-optic recovery of the photoquenching effect
Appl. Phys. Lett. 75, 1252–1254 (1999)
https://doi.org/10.1063/1.124658
Observation of critical gate oxide thickness for substrate-defect related oxide failure
Appl. Phys. Lett. 75, 1255–1257 (1999)
https://doi.org/10.1063/1.124659
Cooling of a semiconductor by luminescence up-conversion
Appl. Phys. Lett. 75, 1258–1260 (1999)
https://doi.org/10.1063/1.124660
Characteristics of dielectric layers grown on Ge by low temperature vacuum ultraviolet-assisted oxidation
Appl. Phys. Lett. 75, 1261–1263 (1999)
https://doi.org/10.1063/1.124661
A method of highly efficient hydrolyzation oxidation of III–V semiconductor lattice matched to indium phosphide
Appl. Phys. Lett. 75, 1264–1266 (1999)
https://doi.org/10.1063/1.124662
Long wavelength (1.3 and 1.5 μm) photoluminescence from InGaAs/GaPAsSb quantum wells grown on GaAs
P. Dowd; W. Braun; David J. Smith; C. M. Ryu; C.-Z. Guo; S. L. Chen; U. Koelle; S. R. Johnson; Y.-H. Zhang
Appl. Phys. Lett. 75, 1267–1269 (1999)
https://doi.org/10.1063/1.124663
Temperature-dependent morphology of three-dimensional InAs islands grown on silicon
Appl. Phys. Lett. 75, 1273–1275 (1999)
https://doi.org/10.1063/1.124665
GaN homoepitaxial layers grown by metalorganic chemical vapor deposition
M. Leszczynski; B. Beaumont; E. Frayssinet; W. Knap; P. Prystawko; T. Suski; I. Grzegory; S. Porowski
Appl. Phys. Lett. 75, 1276–1278 (1999)
https://doi.org/10.1063/1.124666
Interstitial-type defects away from the projected ion range in high energy ion implanted and annealed silicon
Appl. Phys. Lett. 75, 1279–1281 (1999)
https://doi.org/10.1063/1.124667
Ion beam synthesized
J. S. Sharpe; Y. L. Chen; R. M. Gwilliam; A. K. Kewell; C. N. McKinty; M. A. Lourenço; G. Shao; K. P. Homewood; Karen Reeson Kirkby
Appl. Phys. Lett. 75, 1282–1283 (1999)
https://doi.org/10.1063/1.124668
Analysis of the improved contact resistance in metal- silicon Schottky barriers using the mixed implantation
Appl. Phys. Lett. 75, 1284–1286 (1999)
https://doi.org/10.1063/1.124669
Raman imaging of stress in a SiGe/Si photoelastic optical channel waveguide structure
Appl. Phys. Lett. 75, 1287–1289 (1999)
https://doi.org/10.1063/1.124670
MAGNETISM AND SUPERCONDUCTIVITY
Temperature dependence of the reversal mechanism in spin-valve films
Appl. Phys. Lett. 75, 1290–1292 (1999)
https://doi.org/10.1063/1.124671
Design and performance of a space based high temperature superconductivity experiment
Appl. Phys. Lett. 75, 1293–1295 (1999)
https://doi.org/10.1063/1.124672
Magnetic composite materials obtained by swift heavy-ion irradiation of yttrium iron garnet ceramics
Appl. Phys. Lett. 75, 1296–1298 (1999)
https://doi.org/10.1063/1.124673
DIELECTRICS AND FERROELECTRICITY
Accommodation of excess Ti in a thin film with 53.4% Ti grown on by metalorganic chemical-vapor deposition
Appl. Phys. Lett. 75, 1299–1301 (1999)
https://doi.org/10.1063/1.124674
DEVICE PHYSICS
High-quantum-efficiency 0.5 eV GaInAsSb/GaSb thermophotovoltaic devices
Appl. Phys. Lett. 75, 1305–1307 (1999)
https://doi.org/10.1063/1.124676
Si resonant interband tunnel diodes grown by low-temperature molecular-beam epitaxy
Phillip E. Thompson; Karl D. Hobart; Mark E. Twigg; Glenn G. Jernigan; Thomas E. Dillon; Sean L. Rommel; Paul R. Berger; David S. Simons; Peter H. Chi; Roger Lake; Alan C. Seabaugh
Appl. Phys. Lett. 75, 1308–1310 (1999)
https://doi.org/10.1063/1.124677
The reduction of base dopant outdiffusion in SiGe heterojunction bipolar transistors by carbon doping
Appl. Phys. Lett. 75, 1311–1313 (1999)
https://doi.org/10.1063/1.124678
Parallel nanodevice fabrication using a combination of shadow mask and scanning probe methods
Appl. Phys. Lett. 75, 1314–1316 (1999)
https://doi.org/10.1063/1.124679
INTERDISCIPLINARY AND GENERAL PHYSICS
Correlation between nano-scale friction and wear of boron carbide films deposited by dc-magnetron sputtering
Appl. Phys. Lett. 75, 1317–1319 (1999)
https://doi.org/10.1063/1.124687
Observation of a non Fowler–Nordheim field-induced electron emission phenomenon from chemical vapor deposited diamond films
Appl. Phys. Lett. 75, 1323–1325 (1999)
https://doi.org/10.1063/1.124681
Charge storage in structures by electrostatic force microscopy
Appl. Phys. Lett. 75, 1326–1328 (1999)
https://doi.org/10.1063/1.124682
Discrimination between nuclear recoils and electron recoils by simultaneous detection of phonons and scintillation light
P. Meunier; M. Bravin; M. Bruckmayer; S. Giordano; M. Loidl; O. Meier; F. Pröbst; W. Seidel; M. Sisti; L. Stodolsky; S. Uchaikin; L. Zerle
Appl. Phys. Lett. 75, 1335–1337 (1999)
https://doi.org/10.1063/1.124685
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.
Superconducting flip-chip devices using indium microspheres on Au-passivated Nb or NbN as under-bump metallization layer
Achintya Paradkar, Paul Nicaise, et al.