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Issues
1 March 1999
ISSN 0003-6951
EISSN 1077-3118
LASERS, OPTICS, AND OPTOELECTRONICS
Electro-optic sampling near zero optical transmission point
Appl. Phys. Lett. 74, 1191–1193 (1999)
https://doi.org/10.1063/1.123495
High power asymmetrical InAsSb/InAsSbP/AlAsSb double heterostructure lasers emitting at 3.4 μm
Appl. Phys. Lett. 74, 1194–1196 (1999)
https://doi.org/10.1063/1.123496
Optical modulation in a resonant tunneling relaxation oscillator
Appl. Phys. Lett. 74, 1197–1199 (1999)
https://doi.org/10.1063/1.123497
Ultrashort laser pulse induced deformation of silver nanoparticles in glass
Appl. Phys. Lett. 74, 1200–1202 (1999)
https://doi.org/10.1063/1.123498
Silicon-based resonant-cavity-enchanced photodiode with a buried reflector
Appl. Phys. Lett. 74, 1203–1205 (1999)
https://doi.org/10.1063/1.123499
A array of organic light-emitting diodes and their anisotropic electroluminescence
Appl. Phys. Lett. 74, 1206–1208 (1999)
https://doi.org/10.1063/1.123500
Growth and optical characterization of aluminum nitride thin films deposited on silicon by radio-frequency sputtering
Appl. Phys. Lett. 74, 1209–1211 (1999)
https://doi.org/10.1063/1.123501
Self-collimating phenomena in photonic crystals
Hideo Kosaka; Takayuki Kawashima; Akihisa Tomita; Masaya Notomi; Toshiaki Tamamura; Takashi Sato; Shojiro Kawakami
Appl. Phys. Lett. 74, 1212–1214 (1999)
https://doi.org/10.1063/1.123502
Spatial hole burning and multimode generation threshold in quantum-dot lasers
Appl. Phys. Lett. 74, 1215–1217 (1999)
https://doi.org/10.1063/1.123503
Electron paramagnetic resonance of a cation antisite defect in
Appl. Phys. Lett. 74, 1218–1220 (1999)
https://doi.org/10.1063/1.123504
STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER
Structure control and characterization of thin films by a modified annealing method
Appl. Phys. Lett. 74, 1221–1223 (1999)
https://doi.org/10.1063/1.123505
Shape transition of InAs quantum dots by growth at high temperature
Appl. Phys. Lett. 74, 1224–1226 (1999)
https://doi.org/10.1063/1.123506
Optical properties of GaN pyramids
Appl. Phys. Lett. 74, 1227–1229 (1999)
https://doi.org/10.1063/1.123507
The effects of misfit dislocation distribution and capping layer on excess stress
Appl. Phys. Lett. 74, 1230–1232 (1999)
https://doi.org/10.1063/1.123508
Variable energy blast modeling of the stress generation associated with laser ablation
Appl. Phys. Lett. 74, 1233–1235 (1999)
https://doi.org/10.1063/1.123509
Artificial skin to sense mechanical stress by visible light emission
Appl. Phys. Lett. 74, 1236–1238 (1999)
https://doi.org/10.1063/1.123510
SEMICONDUCTORS
Photoconductivity investigation of the electron dynamics in GaAs grown at low temperature
Appl. Phys. Lett. 74, 1239–1241 (1999)
https://doi.org/10.1063/1.123511
Low-pressure metal organic chemical vapor deposition of GaN on silicon(111) substrates using an AlAs nucleation layer
Appl. Phys. Lett. 74, 1242–1244 (1999)
https://doi.org/10.1063/1.123512
Temperature-dependent Hall scattering factor and drift mobility in remotely doped Si:B/SiGe/Si heterostructures
Appl. Phys. Lett. 74, 1245–1247 (1999)
https://doi.org/10.1063/1.123513
Comparison of ultralow-energy ion implantation of boron and for ultrashallow junction formation
Appl. Phys. Lett. 74, 1248–1250 (1999)
https://doi.org/10.1063/1.123514
Spin injection into semiconductors
Appl. Phys. Lett. 74, 1251–1253 (1999)
https://doi.org/10.1063/1.123515
Thermal evolution of impurities in wet chemical silicon oxides
Appl. Phys. Lett. 74, 1257–1259 (1999)
https://doi.org/10.1063/1.123517
Oxidation of Si beneath thin layers during exposure to plasmas, investigated by vacuum transfer x-ray photoelectron spectroscopy
Appl. Phys. Lett. 74, 1260–1262 (1999)
https://doi.org/10.1063/1.123518
Evolution of deep-level centers in p-type silicon following ion implantation at 85 K
Appl. Phys. Lett. 74, 1263–1265 (1999)
https://doi.org/10.1063/1.123519
High voltage (450 V) GaN Schottky rectifiers
Appl. Phys. Lett. 74, 1266–1268 (1999)
https://doi.org/10.1063/1.123520
Femtosecond response times and high optical nonlinearity in beryllium-doped low-temperature grown GaAs
Appl. Phys. Lett. 74, 1269–1271 (1999)
https://doi.org/10.1063/1.123521
Modified Stranski–Krastanov growth in stacked layers of self-assembled islands
Appl. Phys. Lett. 74, 1272–1274 (1999)
https://doi.org/10.1063/1.123522
Low-resistance ohmic contacts to p-type GaN
Appl. Phys. Lett. 74, 1275–1277 (1999)
https://doi.org/10.1063/1.123546
Controlled spontaneous emissions from current-driven semiconductor microcavity triodes
Appl. Phys. Lett. 74, 1278–1280 (1999)
https://doi.org/10.1063/1.123523
Ballistic electron focusing by elliptic reflecting barriers
Appl. Phys. Lett. 74, 1281–1283 (1999)
https://doi.org/10.1063/1.123524
Growth and characterization of small band gap (∼0.6 eV) InGaAsN layers on InP
Appl. Phys. Lett. 74, 1287–1289 (1999)
https://doi.org/10.1063/1.123526
Arsenic-doped Si(001) gas-source molecular-beam epitaxy: Growth kinetics and transport properties
Appl. Phys. Lett. 74, 1290–1292 (1999)
https://doi.org/10.1063/1.123527
A memory cell with single-electron and metal-oxide-semiconductor transistor integration
Appl. Phys. Lett. 74, 1293–1295 (1999)
https://doi.org/10.1063/1.123528
The effect of disorder on excited state dynamics in organic molecular films
A. J. Mäkinen; S. Xu; Z. Zhang; S. J. Diol; Yongli Gao; M. G. Mason; A. A. Muenter; D. A. Mantell; A. R. Melnyk
Appl. Phys. Lett. 74, 1296–1298 (1999)
https://doi.org/10.1063/1.123529
Mechanism for the reduction of interstitial supersaturations in MeV-implanted silicon
V. C. Venezia; T. E. Haynes; Aditya Agarwal; L. Pelaz; H.-J. Gossmann; D. C. Jacobson; D. J. Eaglesham
Appl. Phys. Lett. 74, 1299–1301 (1999)
https://doi.org/10.1063/1.123530
MAGNETISM AND SUPERCONDUCTIVITY
High- directly coupled direct current SQUID gradiometer with flip-chip flux transformer
Appl. Phys. Lett. 74, 1302–1304 (1999)
https://doi.org/10.1063/1.123531
Exchange biasing in ferromagnetic amorphous wires: A controllable micromagnetic configuration
Appl. Phys. Lett. 74, 1305–1307 (1999)
https://doi.org/10.1063/1.123532
Measuring the gigahertz response of recording heads with the magnetic force microscope
Appl. Phys. Lett. 74, 1308–1310 (1999)
https://doi.org/10.1063/1.123533
Magnetic phase diagram of ultrathin Co/Si(111) film studied by surface magneto-optic Kerr effect
Appl. Phys. Lett. 74, 1311–1313 (1999)
https://doi.org/10.1063/1.123534
Increasing the exchange-bias field of films by microstructural control
Appl. Phys. Lett. 74, 1314–1316 (1999)
https://doi.org/10.1063/1.123535
Observation of supercurrent distribution in thin films using THz radiation excited with femtosecond laser pulses
Appl. Phys. Lett. 74, 1317–1319 (1999)
https://doi.org/10.1063/1.123536
Contributions of individual Fe sites to magnetocrystalline anisotropy of compounds
Appl. Phys. Lett. 74, 1320–1322 (1999)
https://doi.org/10.1063/1.123537
Superconducting transport properties of 2.2-GeV Au-ion irradiated c-axis twist bicrystals
Appl. Phys. Lett. 74, 1323–1325 (1999)
https://doi.org/10.1063/1.123538
DIELECTRICS AND FERROELECTRICITY
Injection-controlled size effect on switching of ferroelectric thin films
Appl. Phys. Lett. 74, 1326–1328 (1999)
https://doi.org/10.1063/1.123539
DEVICE PHYSICS
Ultrahigh-density atomic force microscopy data storage with erase capability
G. Binnig; M. Despont; U. Drechsler; W. Häberle; M. Lutwyche; P. Vettiger; H. J. Mamin; B. W. Chui; T. W. Kenny
Appl. Phys. Lett. 74, 1329–1331 (1999)
https://doi.org/10.1063/1.123540
Microscale lithography via channel stamping: Relationships between capillarity, channel filling, and debonding
Appl. Phys. Lett. 74, 1332–1334 (1999)
https://doi.org/10.1063/1.123541
INTERDISCIPLINARY AND GENERAL PHYSICS
Transient grating measurements of picosecond acoustic pulses in metal films
Appl. Phys. Lett. 74, 1344–1346 (1999)
https://doi.org/10.1063/1.123545
ERRATA
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.
Sputter epitaxy of ScAlN films on GaN high electron mobility transistor structures
Tomoya Okuda, Shunsuke Ota, et al.
Era of entropy: Synthesis, structure, properties, and applications of high-entropy materials
Christina M. Rost, Alessandro R. Mazza, et al.