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Birefringence, Pockels, and Kerr effects in photorefractive polymers
Appl. Phys. Lett. 68, 1748–1750 (1996)
https://doi.org/10.1063/1.116653
Study of anomalous peak in the dielectric spectra of CdTe thin films using photoellipsometry
Appl. Phys. Lett. 68, 1751–1753 (1996)
https://doi.org/10.1063/1.116655
Second‐harmonic generation of blue light from [112]‐oriented III‐V antiresonant waveguide heterostructures
Appl. Phys. Lett. 68, 1754–1756 (1996)
https://doi.org/10.1063/1.116656
Estimation of scattering losses in dielectrically apertured vertical cavity lasers
Appl. Phys. Lett. 68, 1757–1759 (1996)
https://doi.org/10.1063/1.116657
Incoherently coupled soliton pairs in biased photorefractive crystals
Appl. Phys. Lett. 68, 1763–1765 (1996)
https://doi.org/10.1063/1.116659
Nanometer‐sized silicon crystallites prepared by excimer laser ablation in constant pressure inert gas
Appl. Phys. Lett. 68, 1772–1774 (1996)
https://doi.org/10.1063/1.116662
Electrical properties of Ta2O5 films obtained by plasma enhanced chemical vapor deposition using a TaF5 source
Appl. Phys. Lett. 68, 1775–1777 (1996)
https://doi.org/10.1063/1.116663
Microcrystallography using atomic force microscopy
Appl. Phys. Lett. 68, 1778–1780 (1996)
https://doi.org/10.1063/1.116664
Growth of dark spots by interdiffusion across organic layers in organic electroluminescent devices
Appl. Phys. Lett. 68, 1787–1789 (1996)
https://doi.org/10.1063/1.116667
Strain‐induced phase separation in annealed low‐temperature grown Al0.3Ga0.7As
Appl. Phys. Lett. 68, 1790–1792 (1996)
https://doi.org/10.1063/1.116668
Surface photoabsorption study of the effect of V/III ratio on ordering in GaInP
Appl. Phys. Lett. 68, 1796–1798 (1996)
https://doi.org/10.1063/1.116016
Fabrication of polymer nanodots with single electron patterning technology
Appl. Phys. Lett. 68, 1799–1801 (1996)
https://doi.org/10.1063/1.116017
Metastability and persistent photoconductivity in Mg‐doped p‐type GaN
Appl. Phys. Lett. 68, 1808–1810 (1996)
https://doi.org/10.1063/1.116020
Scanning‐tunneling‐microscopy modification of nitrogen‐passivated GaAs (001) surfaces on a nanometer scale
Appl. Phys. Lett. 68, 1811–1813 (1996)
https://doi.org/10.1063/1.116021
A model of size‐dependent photoluminescence in amorphous silicon nanostructures: Comparison with observations of porous silicon
Appl. Phys. Lett. 68, 1814–1816 (1996)
https://doi.org/10.1063/1.116022
Low‐temperature epitaxial growth of CoGe2(001)/GaAs(100) films using the partially ionized beam deposition technique
Appl. Phys. Lett. 68, 1817–1819 (1996)
https://doi.org/10.1063/1.116023
Atomic steps on a silicon (001) surface tilted toward an arbitrary direction
Appl. Phys. Lett. 68, 1823–1825 (1996)
https://doi.org/10.1063/1.116025
Generation of hole traps in thin silicon oxide layers under high‐field electron injection
Appl. Phys. Lett. 68, 1826–1828 (1996)
https://doi.org/10.1063/1.116026
Voltage‐tunable two‐color detection by interband and intersubband transitions in a p‐i‐n‐i‐n structure
Appl. Phys. Lett. 68, 1832–1834 (1996)
https://doi.org/10.1063/1.116028
Photocurrent multiplication in hydrogenated amorphous silicon staircase photodiode films
Appl. Phys. Lett. 68, 1835–1837 (1996)
https://doi.org/10.1063/1.116029
Dynamical switching behavior of n‐i‐p‐i modulator structures
Appl. Phys. Lett. 68, 1838–1840 (1996)
https://doi.org/10.1063/1.116030
Pd/Zn/Pd/Au and Pd/Zn/Au/LaB6/Au ohmic contacts to p‐type In0.53Ga0.47As
Appl. Phys. Lett. 68, 1841–1843 (1996)
https://doi.org/10.1063/1.116031
Screening effects on the band‐gap renormalization of strained InGaAs/InGaAsP quantum well lasers lattice matched to GaAs
Appl. Phys. Lett. 68, 1844–1846 (1996)
https://doi.org/10.1063/1.116032
Observation of lateral confinement effect in Ge quantum wires self‐aligned at step edges on Si(100)
Appl. Phys. Lett. 68, 1847–1849 (1996)
https://doi.org/10.1063/1.116033
Low interface trap density for remote plasma deposited SiO2 on n‐type GaN
Appl. Phys. Lett. 68, 1850–1852 (1996)
https://doi.org/10.1063/1.116034
ab‐plane anisotropy of the critical currents in twinned YBa2Cu3O7−δ superconductors
Appl. Phys. Lett. 68, 1853–1855 (1996)
https://doi.org/10.1063/1.116035
Low noise YBa2Cu3O7−x SQUID magnetometers operated with additional positive feedback
D. Drung; E. Dantsker; F. Ludwig; H. Koch; R. Kleiner; John Clarke; S. Krey; D. Reimer; B. David; O. Doessel
Appl. Phys. Lett. 68, 1856–1858 (1996)
https://doi.org/10.1063/1.116036
Properties of NdBa2Cu3O7−δ thin film prepared by off‐axis rf sputtering
Appl. Phys. Lett. 68, 1859–1861 (1996)
https://doi.org/10.1063/1.116037
A low‐noise micromachined millimeter‐wave heterodyne mixer using Nb superconducting tunnel junctions
Appl. Phys. Lett. 68, 1862–1864 (1996)
https://doi.org/10.1063/1.116038
Study of the leakage field of magnetic force microscopy thin‐film tips using electron holography
Appl. Phys. Lett. 68, 1865–1867 (1996)
https://doi.org/10.1063/1.116039
Comment on ‘‘Iron diffusivity in silicon: Impact of charge state’’ [Appl. Phys. Lett. 66, 860 (1995)]
Appl. Phys. Lett. 68, 1868–1869 (1996)
https://doi.org/10.1063/1.116040
Response to ‘‘Comment on ‘Iron diffusivity in silicon: Impact of charge state’ ’’ [Appl. Phys. Lett. 68, 1868 (1996)]
Appl. Phys. Lett. 68, 1870–1871 (1996)
https://doi.org/10.1063/1.116041
Attosecond physics and technology
O. Alexander, D. Ayuso, et al.
Significant improvement of breakdown voltage of Al0.86Ga0.14N Schottky barrier diodes by atomic layer etching
Tingang Liu, Zhiyuan Liu, et al.
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.