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Small Faraday rotation measurement with a Fabry–Pérot cavity
Appl. Phys. Lett. 66, 3546–3548 (1995)
https://doi.org/10.1063/1.113811
Improved laser performance at 946 and 473 nm from a composite Nd:Y3Al5O12 rod
Appl. Phys. Lett. 66, 3549–3551 (1995)
https://doi.org/10.1063/1.113812
Ultrahigh precision measurements of optical heterogeneity of high quality fused silica
Appl. Phys. Lett. 66, 3552–3554 (1995)
https://doi.org/10.1063/1.113813
Super‐resolution through illumination by diffraction‐born evanescent waves
Appl. Phys. Lett. 66, 3555–3557 (1995)
https://doi.org/10.1063/1.113814
High‐power mode‐locked semiconductor lasers using flared waveguides
Appl. Phys. Lett. 66, 3558–3560 (1995)
https://doi.org/10.1063/1.113786
Observation of wave front curvature inside a vertical‐cavity surface‐emitting laser
Appl. Phys. Lett. 66, 3561–3563 (1995)
https://doi.org/10.1063/1.113787
150 mW unsaturated output power at 3 μm from a single‐mode‐fiber erbium cascade laser
Appl. Phys. Lett. 66, 3564–3566 (1995)
https://doi.org/10.1063/1.113788
Temperature dispersion of refractive indices in crystalline and amorphous silicon
Appl. Phys. Lett. 66, 3570–3572 (1995)
https://doi.org/10.1063/1.113790
Phosphorus ablation process as a hydrogen atom probe in a remote H2 plasma reactor
Appl. Phys. Lett. 66, 3573–3575 (1995)
https://doi.org/10.1063/1.113791
Nanocomposite films of lead zirconate titanate and metallic nickel by sol‐gel route
Appl. Phys. Lett. 66, 3576–3578 (1995)
https://doi.org/10.1063/1.113792
Diamond deposition using a planar radio frequency inductively coupled plasma
Appl. Phys. Lett. 66, 3579–3581 (1995)
https://doi.org/10.1063/1.113793
Effects of linewidth, microstructure, and grain growth on voiding in passivated copper lines
Appl. Phys. Lett. 66, 3585–3587 (1995)
https://doi.org/10.1063/1.113795
Growth of epitaxial MgO films on Sb‐passivated (001)GaAs: Properties of the MgO/GaAs interface
Appl. Phys. Lett. 66, 3588–3590 (1995)
https://doi.org/10.1063/1.113796
Time‐resolved surface expansion of metals under picosecond laser illumination
Appl. Phys. Lett. 66, 3594–3596 (1995)
https://doi.org/10.1063/1.113798
Differential Al–Ga interdiffusion in AlGaAs/GaAs and AlGaInP/GaInP heterostructures
Appl. Phys. Lett. 66, 3597–3599 (1995)
https://doi.org/10.1063/1.113799
Electromigration induced resistance changes in a single aluminum via
Appl. Phys. Lett. 66, 3600–3602 (1995)
https://doi.org/10.1063/1.113800
Effect of electron‐electron interaction on hot ballistic electron beams
Appl. Phys. Lett. 66, 3603–3605 (1995)
https://doi.org/10.1063/1.113801
Rate equation model of high‐temperature performance of InGaAsP quantum well lasers
Appl. Phys. Lett. 66, 3606–3608 (1995)
https://doi.org/10.1063/1.113802
Substrate selectivity in the formation of microcrystalline silicon: Mechanisms and technological consequences
Appl. Phys. Lett. 66, 3609–3611 (1995)
https://doi.org/10.1063/1.113803
Thermal capacitance spectroscopy of epitaxial 3C and 6H‐SiC pn junction diodes grown side by side on a 6H‐SiC substrate
Appl. Phys. Lett. 66, 3612–3614 (1995)
https://doi.org/10.1063/1.113804
Back bias depending polarization sensitivity of PtSi/p‐Si Schottky barrier detectors
Appl. Phys. Lett. 66, 3615–3617 (1995)
https://doi.org/10.1063/1.113805
Electron and hole mobility in tris(8‐hydroxyquinolinolato‐N1,O8) aluminum
R. G. Kepler; P. M. Beeson; S. J. Jacobs; R. A. Anderson; M. B. Sinclair; V. S. Valencia; P. A. Cahill
Appl. Phys. Lett. 66, 3618–3620 (1995)
https://doi.org/10.1063/1.113806
Doping of chemically deposited intrinsic CdS thin films to n type by thermal diffusion of indium
Appl. Phys. Lett. 66, 3624–3626 (1995)
https://doi.org/10.1063/1.113808
Controlled manipulation of nanoparticles with an atomic force microscope
Appl. Phys. Lett. 66, 3627–3629 (1995)
https://doi.org/10.1063/1.113809
Direct evidence for the existence of exciton bound on Yb3+ ion in In(P,As) crystals
Appl. Phys. Lett. 66, 3630–3632 (1995)
https://doi.org/10.1063/1.114122
Twenty‐four percent efficient silicon solar cells with double layer antireflection coatings and reduced resistance loss
Appl. Phys. Lett. 66, 3636–3638 (1995)
https://doi.org/10.1063/1.114124
Measuring the tensor nature of stress in silicon using polarized off‐axis Raman spectroscopy
Appl. Phys. Lett. 66, 3639–3641 (1995)
https://doi.org/10.1063/1.114125
Evolution of strain relaxation in step‐graded SiGe/Si structures
Appl. Phys. Lett. 66, 3642–3644 (1995)
https://doi.org/10.1063/1.114126
Step bunching in chemical vapor deposition of 6H– and 4H–SiC on vicinal SiC(0001) faces
Appl. Phys. Lett. 66, 3645–3647 (1995)
https://doi.org/10.1063/1.114127
Millimeter wave distributed metal‐semiconductor‐metal photodetectors
Appl. Phys. Lett. 66, 3648–3650 (1995)
https://doi.org/10.1063/1.114128
Silicon‐on‐insulator produced by helium implantation and thermal oxidation
Appl. Phys. Lett. 66, 3654–3656 (1995)
https://doi.org/10.1063/1.114130
Lattice relaxation in InxAl1−xAs/GaAs heterostructure grown on exact oriented and misoriented GaAs substrates
Appl. Phys. Lett. 66, 3657–3659 (1995)
https://doi.org/10.1063/1.114131
Electron paramagnetic resonance study of luminescent stain etched porous silicon
Appl. Phys. Lett. 66, 3660–3662 (1995)
https://doi.org/10.1063/1.114132
In situ fabrication of self‐aligned InGaAs quantum dots on GaAs multiatomic steps by metalorganic chemical vapor deposition
Appl. Phys. Lett. 66, 3663–3665 (1995)
https://doi.org/10.1063/1.114133
Single electron charging at temperatures above 4 K in ultrasmall lateral quantum dots patterned on shallow GaAs/AlGaAs heterostructures
Z. Borsosfoldi; M. Rahman; I. A. Larkin; A. R. Long; J. H. Davies; J. M. R. Weaver; M. C. Holland; J. G. Williamson
Appl. Phys. Lett. 66, 3666–3668 (1995)
https://doi.org/10.1063/1.114134
How methanol affects the surface of blue and red emitting porous silicon
Appl. Phys. Lett. 66, 3669–3671 (1995)
https://doi.org/10.1063/1.114135
Tightly confined one‐dimensional states in T‐shaped GaAs edge quantum wires with AlAs barriers
Appl. Phys. Lett. 66, 3672–3673 (1995)
https://doi.org/10.1063/1.114136
Electrically tunable coplanar transmission line resonators using YBa2Cu3O7−x/SrTiO3 bilayers
Appl. Phys. Lett. 66, 3674–3676 (1995)
https://doi.org/10.1063/1.114137
Detection of new superconductors using phase‐spread alloy films
Appl. Phys. Lett. 66, 3677–3679 (1995)
https://doi.org/10.1063/1.114138
Magneto‐optical and high resolution electron microscopy studies of flux pinning at grain boundaries in Bi2Sr2CaCu2Ox crystals
Appl. Phys. Lett. 66, 3680–3682 (1995)
https://doi.org/10.1063/1.114139
High‐frequency response of capacitors fabricated from fine grain BaTiO3 thin films
P. K. Singh; S. Cochrane; W.‐T. Liu; K. Chen; D. B. Knorr; J. M. Borrego; E. J. Rymaszewski; T.‐M. Lu
Appl. Phys. Lett. 66, 3683–3685 (1995)
https://doi.org/10.1063/1.114140
Area‐selective formation of an organosilane monolayer on silicon oxide nanopatterns fabricated by scanning probe anodization
Appl. Phys. Lett. 66, 3686–3688 (1995)
https://doi.org/10.1063/1.114141
Special topic on Wide- and ultrawide-bandgap electronic semiconductor devices
Joachim Würfl, Tomás Palacios, et al.
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.
Feedback cooling of an insulating high-Q diamagnetically levitated plate
S. Tian, K. Jadeja, et al.