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Bragg gratings fabricated in monomode photosensitive optical fiber by UV exposure through a phase mask
Appl. Phys. Lett. 62, 1035–1037 (1993)
https://doi.org/10.1063/1.108786
Semiconductor lasers on Si substrates using the technology of bonding by atomic rearrangement
Appl. Phys. Lett. 62, 1038–1040 (1993)
https://doi.org/10.1063/1.108787
Novel biphotonic holographic storage in a side‐chain liquid crystalline polyester
Appl. Phys. Lett. 62, 1041–1043 (1993)
https://doi.org/10.1063/1.108788
Phase contrast and amplitude pseudoheterodyne interference near field scanning optical microscopy
Appl. Phys. Lett. 62, 1044–1046 (1993)
https://doi.org/10.1063/1.108789
Modeling the current to light characteristics of index‐guided vertical‐cavity surface‐emitting lasers
Appl. Phys. Lett. 62, 1050–1052 (1993)
https://doi.org/10.1063/1.108791
Colliding pulse mode locking of a semiconductor laser in an external ring cavity
Appl. Phys. Lett. 62, 1053–1055 (1993)
https://doi.org/10.1063/1.108792
Excimer laser ablated barium strontium titanate thin films for dynamic random access memory applications
Appl. Phys. Lett. 62, 1056–1058 (1993)
https://doi.org/10.1063/1.108793
Tunable guided‐wave optical polarization converters in lithium tantalate
Appl. Phys. Lett. 62, 1059–1061 (1993)
https://doi.org/10.1063/1.108794
High‐power buried InGaAsP/GaAs (λ=0.8 μm) laser diodes
D. Z. Garbuzov; N. Ju. Antonishkis; S. N. Zhigulin; N. D. Il’inskaya; A. V. Kochergin; D. A. Lifshitz; E. U. Rafailov; M. V. Fuksman
Appl. Phys. Lett. 62, 1062–1064 (1993)
https://doi.org/10.1063/1.108795
Efficient coupling of high‐intensity subpicosecond laser pulses into solids
Appl. Phys. Lett. 62, 1068–1070 (1993)
https://doi.org/10.1063/1.108797
Scanning tunneling microscopy studies of vapor deposited films of tetrathiafulvalene with iodine
Appl. Phys. Lett. 62, 1074–1076 (1993)
https://doi.org/10.1063/1.108799
Real time electron microscopy inspection of high temperature processes in W free standing wires
Appl. Phys. Lett. 62, 1077–1078 (1993)
https://doi.org/10.1063/1.108800
Simulation of three‐dimensional director structures in twisted nematic liquid crystal displays
Appl. Phys. Lett. 62, 1079–1081 (1993)
https://doi.org/10.1063/1.108801
Demonstration of a new tool for degradation of amorphous hydrogenated silicon and the importance of the Fermi level shift
Appl. Phys. Lett. 62, 1082–1084 (1993)
https://doi.org/10.1063/1.109602
Transmission of phonons through grain boundaries in diamond films
Appl. Phys. Lett. 62, 1085–1087 (1993)
https://doi.org/10.1063/1.108802
Electric‐field‐induced phase changes in polyvinylidene fluoride: Effects from corona polarity and moisture
Appl. Phys. Lett. 62, 1091–1093 (1993)
https://doi.org/10.1063/1.108804
Geometrical shape dependent polarization anisotropy in electroluminescence from InGaAs/InP quantum wires
Appl. Phys. Lett. 62, 1094–1096 (1993)
https://doi.org/10.1063/1.108752
Large blue shift of light emitting porous silicon by boiling water treatment
Appl. Phys. Lett. 62, 1097–1098 (1993)
https://doi.org/10.1063/1.108753
Role of Si‐H and Si‐H2 in the photoluminescence of porous Si
Appl. Phys. Lett. 62, 1099–1101 (1993)
https://doi.org/10.1063/1.108754
Semi‐insulating crystalline silicon formed by oxygen doping during low‐temperature chemical vapor deposition
Appl. Phys. Lett. 62, 1102–1104 (1993)
https://doi.org/10.1063/1.108755
Modulation‐doped In0.48Al0.52P/In0.2Ga0.8As field‐effect transistors
Appl. Phys. Lett. 62, 1105–1107 (1993)
https://doi.org/10.1063/1.108756
Transport mechanisms in low‐resistance ohmic contacts to p‐InP formed by rapid thermal annealing
Appl. Phys. Lett. 62, 1108–1109 (1993)
https://doi.org/10.1063/1.108757
Microscale elastic‐strain determination by backscatter Kikuchi diffraction in the scanning electron microscope
Appl. Phys. Lett. 62, 1110–1112 (1993)
https://doi.org/10.1063/1.108758
Interpretation of photoluminescence excitation spectroscopy of porous Si layers
Appl. Phys. Lett. 62, 1113–1115 (1993)
https://doi.org/10.1063/1.108759
Bound‐to‐bound intersubband transitions in a δ‐doped p‐type Si/SixGe1−x/Si quantum well
Appl. Phys. Lett. 62, 1119–1121 (1993)
https://doi.org/10.1063/1.108761
Saturation of multiplication factor in InGaAsP/InAlAs superlattice avalanche photodiodes
Appl. Phys. Lett. 62, 1122–1124 (1993)
https://doi.org/10.1063/1.108762
Positive charge and interface state creation at the Si‐SiO2 interface during low‐fluence and high‐field electron injections
Appl. Phys. Lett. 62, 1125–1127 (1993)
https://doi.org/10.1063/1.108763
Ion implantation induced defects in SiO2: The applicability of the positron probe
Appl. Phys. Lett. 62, 1131–1133 (1993)
https://doi.org/10.1063/1.108765
Infrared photoconductor fabricated with HgTe/CdTe superlattice grown by molecular beam epitaxy
Appl. Phys. Lett. 62, 1134–1136 (1993)
https://doi.org/10.1063/1.108766
Ultralow damage depth by electron cyclotron resonance plasma etching of GaAs/InGaAs quantum wells
Appl. Phys. Lett. 62, 1137–1139 (1993)
https://doi.org/10.1063/1.108767
p+/n/n+ InP solar cells directly on Si substrates
Appl. Phys. Lett. 62, 1140–1142 (1993)
https://doi.org/10.1063/1.108768
Determination of electron recombination parameters in GaAs/AlGaAs quantum wells by impedance spectroscopy
Appl. Phys. Lett. 62, 1143–1145 (1993)
https://doi.org/10.1063/1.108769
Spatially resolved Raman spectroscopy of a step graded GexSi1−x strain relief structure
Appl. Phys. Lett. 62, 1146–1148 (1993)
https://doi.org/10.1063/1.108770
Study of characteristics of photoluminescence spectra in double‐barrier resonant tunneling structures
Appl. Phys. Lett. 62, 1149–1151 (1993)
https://doi.org/10.1063/1.108771
Enhancement and stabilization of porous silicon photoluminescence by oxygen incorporation with a remote‐plasma treatment
Appl. Phys. Lett. 62, 1152–1154 (1993)
https://doi.org/10.1063/1.108772
Optical absorption evidence of a quantum size effect in porous silicon
Appl. Phys. Lett. 62, 1155–1157 (1993)
https://doi.org/10.1063/1.108773
Identification of nonbolometric photoresponse in YBa2Cu3O7−δ thin films based on magnetic field dependence
Appl. Phys. Lett. 62, 1158–1160 (1993)
https://doi.org/10.1063/1.109613
Secondary ion mass spectrometry study for Josephson junction with Nb/AlOx‐Al/Nb structure
Appl. Phys. Lett. 62, 1164–1166 (1993)
https://doi.org/10.1063/1.108775
Special topic on Wide- and ultrawide-bandgap electronic semiconductor devices
Joachim Würfl, Tomás Palacios, et al.
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.
Feedback cooling of an insulating high-Q diamagnetically levitated plate
S. Tian, K. Jadeja, et al.