Topics
Ferromagnetic materials, Semiconductors

This article was originally published online and in print with an incorrect version of Fig. 4. AIP apologizes for this error. All online versions of the article have been corrected. The correct version of Fig. 4 appears below:

FIG. 4.
FIG. 4. SIMS depth profiles of the MnAs/Si junction, for Mn (dotted line), As (solid line), and Si (dashed line). The dot-dashed circle represents the Mn and As profiles at ∼58⁢nm.
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SIMS depth profiles of the MnAs/Si junction, for Mn (dotted line), As (solid line), and Si (dashed line). The dot-dashed circle represents the Mn and As profiles at ∼58⁢nm⁠.

FIG. 4.
FIG. 4. SIMS depth profiles of the MnAs/Si junction, for Mn (dotted line), As (solid line), and Si (dashed line). The dot-dashed circle represents the Mn and As profiles at ∼58⁢nm.
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SIMS depth profiles of the MnAs/Si junction, for Mn (dotted line), As (solid line), and Si (dashed line). The dot-dashed circle represents the Mn and As profiles at ∼58⁢nm⁠.

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© 2007 American Institute of Physics.
2007
American Institute of Physics