Topics
Thin films, Chemical elements

In this letter, the horizontal axis of Fig. 3(a) was inadvertently mislabeled. The correct horizontal axis should extend from 2 θ = 15 – 55 ° rather than 2 θ = 15 – 70 ° ⁠. All other aspects of the published figure are correct. The results and conclusions of the paper remain the same. The corrected figure is shown below.

FIG. 3.
FIG. 3. (a) X-ray diffraction 2 θ - 2 θ scans for MgB 2 films with carbon doping. From top to bottom, the nominal carbon concentrations are 0, 7.4, 15, 22, 28, 39, 42, and 45 at .%. The spectra are shifted vertically for clarity. The peaks labeled with “*” are due to the SiC substrate.
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(a) X-ray diffraction 2 θ - 2 θ scans for MgB 2 films with carbon doping. From top to bottom, the nominal carbon concentrations are 0, 7.4, 15, 22, 28, 39, 42, and 45 at ⁠.%. The spectra are shifted vertically for clarity. The peaks labeled with “*” are due to the SiC substrate.

FIG. 3.
FIG. 3. (a) X-ray diffraction 2 θ - 2 θ scans for MgB 2 films with carbon doping. From top to bottom, the nominal carbon concentrations are 0, 7.4, 15, 22, 28, 39, 42, and 45 at .%. The spectra are shifted vertically for clarity. The peaks labeled with “*” are due to the SiC substrate.
View largeDownload slide

(a) X-ray diffraction 2 θ - 2 θ scans for MgB 2 films with carbon doping. From top to bottom, the nominal carbon concentrations are 0, 7.4, 15, 22, 28, 39, 42, and 45 at ⁠.%. The spectra are shifted vertically for clarity. The peaks labeled with “*” are due to the SiC substrate.

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© 2006 American Institute of Physics.
2006
American Institute of Physics