In quantum dots (QDs), the Auger recombination is a non-radiative scattering process in which the optical transition energy of a charged exciton (trion) is transferred to an additional electron leaving the dot. Electron tunneling from a reservoir is the competing process that replenishes the QD with an electron again. Here, we study the dependence of the tunneling and Auger recombination rate on the applied electric field using high-resolution time-resolved resonance fluorescence (RF) measurements. With the given p–i–n diode structure and a tunnel barrier between the electron reservoir and the QD of 45 nm, we measured a tunneling rate into the QD in the order of ms−1. This rate shows a strong decrease by almost an order of magnitude for decreasing electric field, while the Auger emission rate decreases by a factor of five in the same voltage range. Furthermore, we study in detail the influence of the Auger recombination and the tunneling rate from the charge reservoir into the QD on the intensity and linewidth of the trion transition. In addition to the well-known quenching of the trion transition, we observe in our time-resolved RF measurements a strong influence of the tunneling rate on the observed linewidth. The steady-state RF measurement yields a broadened trion transition of about 1.5 GHz for an Auger emission rate of the same order as the electron tunneling rate. In a non-equilibrium measurement, the Auger recombination can be suppressed, and a more than four times smaller linewidth of (1.4 μeV) is measured.
A promising stationary quantum bit (qubit) is the spin of an electron (or hole) in a solid state environment,1,2 where the quantum state of the spin3 can be transferred by a spin–photon interface4–7 to a photon that serves as a flying qubit. The connection between both qubits can be realized by the charged exciton state (the trion)8–11 in a single self-assembled quantum dot (QD).12,13 Therefore, long coherence times and highly indistinguishable photons6,14,15 are needed. Previous findings showed spin and charge noise as the main dephasing mechanisms,16,17 which led to a broadening of the natural linewidth of the exciton and trion transition. The influence of other possible mechanisms on the linewidth and coherence of the single photons, such as the non-radiative Auger effect,18–20 the radiative Auger effect,21 or the internal photoeffect,22 are still under investigation.
We study here in time-resolved resonance fluorescence the influence of the electron tunneling and the non-radiative Auger recombination on the applied electric field and measure simultaneously linewidth and intensity of the trion transition. The QD is weakly coupled to an electron reservoir23 with tunneling rates in the order of ms−1. This rate shows a strong decrease for decreasing electric field,24 while the Auger scattering rate decreases by a factor of five in the same voltage range. The tunneling rate and the electron emission rate by the Auger recombination can be tuned by the laser intensity to the same order of magnitude to investigate the interplay between the electron tunneling and the Auger emission on linewidth and intensity of the trion transition. In this regime of competing rates, where an electron is emitted from the dot (by Auger) and an electron is recharged from the reservoir (by tunneling), we measure in a steady-state resonance fluorescence measurement an artificially broadened linewidth of and a reduced trion intensity. In a non-equilibrium transient RF, where the Auger recombination can be suppressed, we obtain a four times smaller value for the linewidth of (1.4 μeV). The resulting dephasing time T2 of 957 ps is in good agreement with previously observed values for self-assembled QDs.19,25 These results demonstrate the strong influence of the Auger recombination on the optical properties of the charged exciton transition, which may help to improve the fabrication of optimized single photon emitters as well as spin-to-charge and spin-to-photon conversion devices.
The measurements were performed on a single self-assembled (InGa)As QD, grown in a Stranski–Krastanov process26 by molecular beam epitaxy. The layer of QDs is embedded in a p–i–n diode structure with an electron reservoir consisting of a highly n-doped GaAs:Si layer, a 45 nm thick (AlGa)As tunneling barrier, and a highly p-doped GaAs layer as the epitaxial gate,27 see Fig. 1(b) or for a more detailed description in the supplementary material (Fig. S1). An indium-flush28 during the growth process limits the height of the QDs so that their exciton emission wavelength is between 900 and . A voltage, applied between the electron reservoir and the epitaxial gate, allows us to charge the QD with single electrons from the reservoir.29 Furthermore, we can use the quantum confined Stark effect25,30 to tune the QD states in resonance with our excitation laser. To read out the charge states, we use resonance fluorescence spectroscopy in a confocal microscope setup at a sample temperature of 4.2 K. To distinguish the QD photons from the laser photons, i.e., to suppress the backscattered laser light, we use the cross-polarization method with a maximum suppression of the backscattered laser photons by a factor of 107.5,19
(a) Time-resolved N-shot measurement scheme with a 2 ms pulse of the gate voltage. The pulses from to set the electron reservoir out of and into resonance with the s1-ground state of the QD. (b) Schematic conduction band structure for two different gate voltages as a function of the growth direction z. The red dashed line indicates the Fermi energy of the electron reservoir (for a more detailed description see FIG. S1 in the supplementary material). (c) Exciton RF intensity for a binning time during the pulse. An exponential decrease in the intensity is observed, caused by an electron tunneling from the electron reservoir into the QD. (d) Occupation probability of a single electron in the QD. The shape corresponds to the Fermi distribution of the electron reservoir, with a temperature of .
(a) Time-resolved N-shot measurement scheme with a 2 ms pulse of the gate voltage. The pulses from to set the electron reservoir out of and into resonance with the s1-ground state of the QD. (b) Schematic conduction band structure for two different gate voltages as a function of the growth direction z. The red dashed line indicates the Fermi energy of the electron reservoir (for a more detailed description see FIG. S1 in the supplementary material). (c) Exciton RF intensity for a binning time during the pulse. An exponential decrease in the intensity is observed, caused by an electron tunneling from the electron reservoir into the QD. (d) Occupation probability of a single electron in the QD. The shape corresponds to the Fermi distribution of the electron reservoir, with a temperature of .
We will show in the following the gate voltage dependent tunneling dynamics for a single electron tunneling event. We use a time-resolved gate voltage N-shot pulse scheme with a pulse duration of 2 ms, as shown in Fig. 1(a). The continuous-wave laser with an excitation intensity of μW/μm2 will not be pulsed. The pulses from to set the electron reservoir out of and into resonance with the s-shell ground state of the dot [see small insets in Fig. 1(a)] to tunnel an electron into and out of the QD. The non-resonant gate voltage is set to zero voltage.
The long-term limit of this function ( ) gives us the steady-state occupation probability as a function of the gate voltage, shown in Fig. 1(d). The blue line describes the Fermi function of the electron reservoir fitted to the data. From this, we can obtain the temperature of the QD sample's electron reservoir of , which is in excellent agreement with the liquid helium temperature.
(a) Single electron tunneling rates into ( , blue) and out of ( , gray) the QD as a function of the gate voltage . The inset shows four exponentially decaying transients, recorded at the color-coded gate voltages. The tunneling rates were calculated from all transients using Eq. (1). (b) Maximum trion counts per second extracted from steady-state RF measurements [shown in Fig. 2(c)] at μW/μm2 [which corresponds to a trion occupation probability of ] as a function of the gate voltage. (c) Color-coded trion RF intensity of the QD as a function of gate voltage and excitation frequency. The quantum confined Stark effect shifts the resonance frequency linearly with the gate voltage.
(a) Single electron tunneling rates into ( , blue) and out of ( , gray) the QD as a function of the gate voltage . The inset shows four exponentially decaying transients, recorded at the color-coded gate voltages. The tunneling rates were calculated from all transients using Eq. (1). (b) Maximum trion counts per second extracted from steady-state RF measurements [shown in Fig. 2(c)] at μW/μm2 [which corresponds to a trion occupation probability of ] as a function of the gate voltage. (c) Color-coded trion RF intensity of the QD as a function of gate voltage and excitation frequency. The quantum confined Stark effect shifts the resonance frequency linearly with the gate voltage.
With this strong dependence of the tunneling rate in mind, we will show how this rate has a strong influence on the trion intensity and linewidth in a steady-state gate voltage dependent measurement.
Figure 2(c) displays the color-coded RF intensity of the trion recombination as a function of the excitation frequency and the gate voltage. The three areas represent the empty (I), the singly charged (II), and the doubly charged QD (III). These measurements were performed as steady-state measurement, so that they represent the trion intensity in the long-term limit ( ). In addition to the linear quantum confined Stark effect of the trion transition, we can also observe the gate voltage dependence of the maximum trion intensity, depicted in Fig. 2(b). These measurements show a decreasing trion intensity as a function of the gate voltage, almost identical to the shape of the tunneling rate into the QD, shown in Fig. 2(a). The resonance-like features, previously discussed for the tunneling rate , are also observed in the maximum trion intensity.
The Auger emission rate for a fixed trion excitation intensity of μW/μm2 [which corresponds to a trion occupation probability of ] as a function of the gate voltage is shown in Fig. 3. We observe that the Auger emission rate decreases by a factor of five ( ) with increasing gate voltage. In comparison with the tunneling rate, the behavior of the Auger emission rate is rather smooth and has no resonances or rapid slope changes. These are not expected either, since the Auger effect is not affected by the electron transition through the tunnel barrier Γ or by defects in the environment of the QD. The tunneling rates and , on the other hand, which result from the same fit to the exponentially decaying trion transients, show the same behavior as the tunneling rates that were determined from the exciton data in Fig. 2(a) (see the supplementary material).
Auger emission rate as a function of the gate voltage, derived from Eq. (5), using the tunneling rates and , and the Auger emission rate as free fit parameters. For this time-resolved N-shot measurement, the laser was pulsed with a trion excitation intensity of μW/μm2 [which corresponds to a trion occupation probability of ].
Auger emission rate as a function of the gate voltage, derived from Eq. (5), using the tunneling rates and , and the Auger emission rate as free fit parameters. For this time-resolved N-shot measurement, the laser was pulsed with a trion excitation intensity of μW/μm2 [which corresponds to a trion occupation probability of ].
In Fig. 4(a), the linewidth of the trion recombination as a function of the gate voltage is exemplarily shown, for three laser excitation frequencies [horizontal cuts through Fig. 2(c)] [① , ② , and ③ ]. Since these measurements were performed in steady state, the resonances are broadened due to mechanisms, which empty the QD non-radiatively, such as the Auger effect19 or the internal photoeffect.22 It can be observed that with increasing excitation frequency, the linewidth increases between at a tunneling rate of and an Auger emission rate of and at a tunneling rate of and an Auger emission rate of . In the supplementary material (see Fig. S4), we show that the linewidth of the trion emission also follows the electron tunneling rate very well. Since for these measurements, the frequency and the excitation intensity are consistent, here the broadening of the trion resonance is given by the gate voltage dependent ratio between the tunneling rates , and the Auger emission rate , according to Eq. (4). A measurement of the trion linewidth in a gate voltage scan for nearly equal electron tunneling and Auger emission rates must therefore be treated with caution.
(a) Three exemplary RF resonances with different excitation frequencies ① , ② and ③ extracted from the full scan shown in Fig. 2(c), with normalized RF trion intensity as a function of the gate voltage (horizontal cuts). The area under the curve represents a Lorentz fit to the data. b) Three exemplary RF resonances with different gate voltages ① , ② , and ③ extracted from the full scan shown in Fig. 2(c), with normalized RF trion intensity as a function of the excitation frequency (vertical cuts). The colored area under the curve represents a Lorentz fit to the data.
(a) Three exemplary RF resonances with different excitation frequencies ① , ② and ③ extracted from the full scan shown in Fig. 2(c), with normalized RF trion intensity as a function of the gate voltage (horizontal cuts). The area under the curve represents a Lorentz fit to the data. b) Three exemplary RF resonances with different gate voltages ① , ② , and ③ extracted from the full scan shown in Fig. 2(c), with normalized RF trion intensity as a function of the excitation frequency (vertical cuts). The colored area under the curve represents a Lorentz fit to the data.
However, the same caution has to be taken even if the gate voltage is fixed and the linewidth should be determined by a frequency scan as vertical cuts through Fig. 2(c). Three of such vertical cuts are shown in Fig. 4(b).
Therefore, in Fig. 4(b), a broadening of the trion resonance is still observed, now due to the Auger emission rate that depends on the average trion occupation probability, cf. Eq. (4). To determine the intrinsic trion linewidth, we use the trion intensity in a pulsed measurement scheme at the beginning of the pulse ( ), shown in detail in the supplementary material (Fig. S5). The resulting linewidth of is about a factor of four narrower than the linewidth of the steady-state trion resonance and corresponds to a dephasing time T2 of .
Using Eqs. (4) and (7), an excitation frequency of [curve ② in Fig. 4(b)], and the previously measured values ( = 1.2 μs–1, and ), an occupation in resonance of is obtained, which is in perfect agreement with the used laser intensity of μW/μm2 in Figs. 2(b) and 2(c) and 4.
In summary, for a single self-assembled (InGa)As QD, coupled to an electron reservoir by a rather thick tunnel barrier of thickness, we observed a strong dependence of the tunneling rate into the QD, of the order of ms−1, on the applied electric field. The tunneling rate decreases by almost an order of magnitude for increasing gate voltage, while the Auger emission rate decreases by a factor of five in the same voltage range. The varying tunneling rate, as well as the Auger effect, affects the trion transition and its amplitude as well as the linewidth in steady-state measurements significantly. In the regime of equal rate for the electron emission by the Auger recombination and the electron tunneling into the dot, we determined in a steady-state resonance fluorescence measurement an artificially broadened linewidth and a reduced trion intensity. In a non-equilibrium RF transient, where the Auger recombination can be suppressed, we obtain a four times smaller value for the linewidth of (1.4 μeV), which is in good agreement with previous results on a different self-assembled QD.19 This shows that the linewidth of the trion resonance measured in steady state should always be interpreted with caution. However, for much larger tunneling rates into the QD in relation to the Auger emission rate, the Auger effect can be neglected [cf. Eq. (4)] and the trion transition should not be artificially broadened.
SUPPLEMENTARY MATERIAL
See the supplementary material for additional measurements and a simulation of the trion resonance based on the measured results.
This work was funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation)—Project-ID 278162697—SFB 1242, the individual research Grant No. 383065199, and the Mercator Research Center Ruhr (MERCUR)—Project-ID 2022-0013. A. Lu. and A.D.W. acknowledges support by DFG-TRR160, BMBF—QR.X KIS6QK4001, and the DFH/UFA CDFA-05-06.
AUTHOR DECLARATIONS
Conflict of Interest
The authors have no conflicts to disclose.
Author Contributions
M. Zöllner: Data curation (lead); Formal analysis (lead); Investigation (lead); Validation (equal); Visualization (lead); Writing – original draft (lead); Writing – review & editing (equal). H. Mannel: Data curation (equal); Formal analysis (equal); Validation (equal); Writing – review & editing (equal). F. Rimek: Data curation (supporting); Validation (supporting); Writing – review & editing (supporting). B. Maib: Data curation (supporting); Validation (supporting); Writing – review & editing (supporting). N. Schwarz: Data curation (supporting); Validation (supporting); Writing – review & editing (supporting). A. D. Wieck: Project administration (supporting); Resources (supporting); Writing – review & editing (supporting). A. Ludwig: Project administration (supporting); Resources (equal); Writing – review & editing (equal). A. Lorke: Conceptualization (equal); Formal analysis (equal); Funding acquisition (equal); Project administration (equal); Resources (equal); Supervision (equal); Visualization (supporting); Writing – review & editing (equal). M. Geller: Conceptualization (lead); Formal analysis (supporting); Funding acquisition (equal); Investigation (equal); Project administration (equal); Supervision (lead); Validation (equal); Visualization (equal); Writing – original draft (equal); Writing – review & editing (equal).
DATA AVAILABILITY
The data that support the findings of this study are available from the corresponding author upon reasonable request.