In this work, we demonstrate that xPb(In1/2Nb1/2)O3-(1-x-y)Pb(Mg1/3Nb2/3)O3-yPbTiO3 [110]-poled domain-engineered relaxor single crystals can be dynamically and reversibly driven through a ferroelectric–ferroelectric phase transition exhibiting a highly enhanced piezoelectric response in a wide range of frequencies. Realization of this phase switching requires an applied compressive stress close to the critical values for the inter-ferroelectric phase transition, which can then be induced by a relatively small electric field (≤0.2 kV/mm). The required critical stress was established by in situ stress and x-ray diffraction measurements. The effective d32 coefficient measured dynamically up to 70 Hz was shown to be consistently twice that of the linear piezoelectric mode measured below the phase transformation region. The crystal was installed into a prototype transducer based on a Tonpilz configuration. The performance of the transducer was tested in water and showed up to 15 dBSPL higher acoustic power radiated when the crystal was driven through the phase transition than when operating in the linear piezoelectric regime.

The continuous development of highly efficient transducers for high-power, low-frequency, and compact-sized sound projectors demands a new class of materials with enhanced properties. High-power underwater acoustic projectors are generally very large and heavy, but recent single crystal transducer development1,2 promises significant size and weight reductions.3,4 Specifically, domain-engineered relaxor (1−x)Pb(Mg1/3Nb2/3O3xPbTiO3) (PMN–PT) and (1−x)Pb Zn1/3Nb2/3O3xPbTiO3 (PZN–PT) systems poled along the equivalent nonpolar (001)C pseudo-cubic direction are of highest interest. The crystals with compositions close to the morphotropic phase boundary (MPB)5–9 showed high electromechanical coupling factors of ∼0.9 and large piezoelectric coefficients up to 2000 pm/V.3–5 It was concluded that this phenomenon of enhanced piezoelectricity can be linked to the presence of intermediate monoclinic (FM) and orthorhombic (FO) ferroelectric states in-between the ferroelectric rhombohedral (FR) and tetragonal (FT) phases, allowing for enhanced polarization rotation.3–8 This FR-to-FT phase transformation can also be accessed electrically3 with maximum strains on the order of 1% (Ref. 4) in binary compositions of PZN–PT, whereas large an hysteretic strains of up to 0.6% in PMN–PT5 have been reported. Electrically induced discontinuities in strain were studied by Okawara and Amin11 and were asserted to be a first-order-like phase transition.

In addition, an elastic instability was reported in both binary and ternary domain engineered single crystals subjected to uniaxial stresses.9–12 The isothermal elastic response with harmonic stress (∼50 MPa) of domain-engineered (3–3 and 3–2 modes) PZN–PT single crystals with the composition near the MPB was investigated by Amin and Cross.13 Okawara and Amin11 observed a reversible and hysteretic stress–strain response of these crystals, which is characterized by a large and sharp strain discontinuity (up to 0.5%) occurring at a critical stress. This strain was attributed to a stress-induced FR to FO transition caused by polarization rotation under mechanical compression. The reversible effect is speculated to be due to internal electric fields such as those associated with charged domain walls.12 Similar observations in domain engineered ternary xPb(In1/2Nb1/2)O3-(1-x-y)Pb(Mg1/3Nb2/3)O3-yPbTiO3 (x =0.24, y =0.32) (PIN–PMN–PT) single crystals were reported by Finkel et al.14 Recently, using mechanically biased PIN–PMN–PT (110)-poled crystals, we presented a method to deliver strain levels of ∼0.5% at relatively low (∼0.1 kV/mm) drive fields, representing a fourfold increase in strain at only 20% of the drive field as compared to those of other piezoelectric relaxor ferroelectric single crystals (e.g., PMN–PT).15,16 Despite the critical importance for applications, these phase switching phenomena in PIN–PMN–PT crystals were reported predominately under quasi-static or nearly DC conditions. So far, there has been limited work extending this intrinsic structural phase switching phenomenon into higher frequency ranges required for real sound generating devices. Further progress in exploiting these large enhanced piezoelectric properties, potentially leading to transducers with even greater performance, requires the study of the underlying mechanism of this phase transformation. In this work, we demonstrate the dynamic response based on the large electrostrain generated in the crystalline phase transition found in relaxor ferroelectric [110]-oriented, domain-engineered PIN–PMN–PT single crystals. To achieve this, we have applied a compressive mechanical stress close to the critical compressive stress σc needed for phase transformation from FR to FO, i.e., mechanical confinement. Compared to the field-induced strain of ∼0.5% at 2 kV/mm in PZN–PT single crystals as reported by Park and Shrout7 the present results show similar strains but with over an order of magnitude reduction in the field.

Rectangular bars of PIN–PMN–PT with dimensions of 4 × 4× 12 mm were procured with the longest edge oriented along the pseudo-cubic [001], while the other faces were oriented along ⟨110⟩. These bars were compressed along [001] in several different loading devices for testing the piezoelectric coefficient d32 at different frequencies and compressive stresses.

The first step was to confirm if the prestress was sufficient for reaching the required critical threshold needed for realization of the transition to a phase that had been previously described as orthorhombic.8,10,11,13–15 We recorded the stress strain response this time using a custom-built stress rig permitting in situ x-ray diffraction characterization (see the supplementary material). Full 3D reciprocal mapping with a 2D camera revealed that the structural phases are a function of stress and field (more details can be found in Ref. 18). Strain was measured with a strain gauge affixed to the sample on the (1¯10) specular face, aligned in the [001] direction. Figure 1 shows the x-ray diffraction lattice parameter change as a function of applied uniaxial compressive stress at zero applied electric field along with simultaneously measured strain, corrected with a Poisson ratio of 0.37 to make the two graphs match. An initial quasi-linear strain softening is identified as the low stress FR phase. At a critical stress, σc > 20 MPa, the elastic properties changed dramatically to a much stiffer response, characteristic of the high-stress phase FO. The x-ray diffraction data from the (111) reflection plotted as x-ray intensity (H–K) contour plots at constant L (L = 1.131) (Fig. 1, insets) for Miller indices H, K, and L show two distinct (hkl) diffracting conditions at low stress transforming to only one (hkl) condition at stresses above σc.

FIG. 1.

In situ x-ray diffraction of the (1¯10)c reflection (d-spacing—green squares and all reflection indices based on a pseudo-cubic unit cell) compared to macroscopic strain (solid line) measured as a function of applied uniaxial stress at zero applied field. There is a stress-induced transformation from two phases/domains at low stress to one single (higher modulus) phase at high stresses. The features presented in the diffraction data are real and repeatable and indicate pathways from low stress rhombohedral symmetry to a higher stress lower symmetry phase. Contour maps show the 111c diffraction contrast for low stress (10 MPa) and the highest stress states (48 MPa), and the sample x-ray configuration schematic is provided for orientation clarity. Macroscopic strain is recorded along (001)c, and a Poisson ratio of 0.37 is used to match the x-ray data.

FIG. 1.

In situ x-ray diffraction of the (1¯10)c reflection (d-spacing—green squares and all reflection indices based on a pseudo-cubic unit cell) compared to macroscopic strain (solid line) measured as a function of applied uniaxial stress at zero applied field. There is a stress-induced transformation from two phases/domains at low stress to one single (higher modulus) phase at high stresses. The features presented in the diffraction data are real and repeatable and indicate pathways from low stress rhombohedral symmetry to a higher stress lower symmetry phase. Contour maps show the 111c diffraction contrast for low stress (10 MPa) and the highest stress states (48 MPa), and the sample x-ray configuration schematic is provided for orientation clarity. Macroscopic strain is recorded along (001)c, and a Poisson ratio of 0.37 is used to match the x-ray data.

Close modal

Next, the quasi-static (<1 Hz) stress–strain behavior of the crystals was characterized in a load frame (Instron), and from this measurement, the critical stress σc for the phase transition was determined to be close to the values evaluated from the in situ x-ray experiment and to the values reported earlier.17 Strain and polarization hysteresis curves were measured with a ferroelectric test system (Radiant Technologies), while the sample remained mechanically confined under stress along the [001] direction [as shown in the inset of Fig. 1(a)] accompanied by an electric field applied along [110]. Several of the resulting strain vs electric field curves at variable compressive stress ranging from 20 to 26 MPa are shown in Fig. 2. It should be noted that in this range of compressive stresses, an amplitude of the applied electric field <0.2 kV/mm was sufficient to cycle from FR to FO and back to FR. This sharp jump in strain (up to 2000 microstrain) was triggered reversibly with low hysteresis and approximately independent of prestress conditions.

FIG. 2.

Strain measured quasi-statically at 1 Hz depicting large nonlinearity due to the FR to Fo phase transition at various stresses from 20 to 26 MPa.

FIG. 2.

Strain measured quasi-statically at 1 Hz depicting large nonlinearity due to the FR to Fo phase transition at various stresses from 20 to 26 MPa.

Close modal

Subsequent to this, a dynamic piezoanalyzer was used to evaluate the direct d32 piezoelectric response under mechanical compressive loads up to 50 MPa, but this time with an AC stress signal (at 1 and 70 Hz) applied superposed on the static preload value for three preloads representing FR (<20 MPa), FTRANS (∼23 MPa), and FO (>26 MPa) phases. The dynamic charge-stress relation was measured with a home-built press. The press contains a quartz reference sensor to measure the force, a lead zirconate titanate, Pb[ZrxTi1-x]O3 (0 ≤ x ≤ 1), (PZT) actuator, two stiff zirconia columns with steel caps for electrical contacts between which the sample is placed, and a stepper motor, all connected mechanically in series and contained within a rigid steel frame. The AC stress is generated by the PZT actuator. The piezoelectric charges produced by the quartz sensor and the sample are measured by two separate charge amplifiers and recorded with an oscilloscope. Both longitudinal and transverse piezoelectric responses can be measured by appropriate orientation of the electroded faces with respect to the crystallographic axes of the sample and direction along which the stress is applied. For charge induced by stress during the phase transition, the compressive force was only applied from 0 to 40 MPa by the stepper motor. The total duration of force application and release for this technique lasts approximately 2 min. More details can be found in Refs. 19 and 20.

The stress-polarization dependence is plotted in Fig. 3(a). It is notable that there is almost no observable hysteresis upon loading and unloading. There are three clearly observable regions with different slopes [as denoted by blue, red, and green symbols in Fig. 3(a)], which correspond to the two phases separated by the sharply increasing polarization region where the transition between them is occurring. As shown by d32 vs stress in the inset of Fig. 3(a), the value is relatively constant in the FR condition with a large spike at stresses near the phase transition at ∼20 MPa, which corresponds to the optimal loading condition for FTRANS. At higher stress values, d32 drops off significantly once the crystal is in the orthorhombic regime.

FIG. 3.

(a) Stress dependence of the polarization at 20 mHz with slopes used for d32 highlighted in the three regions of interest FR, FTRANS, and FO denoted by blue, red, and green symbols, respectively, which were also used to calculate the slope for d32 values reported in Table I. The inset shows d32 vs stress as calculated from the slope. (b) Strain as a function of electric field measured at 10 Hz for three corresponding regions (FR, FTRANS, and Fo) as above.

FIG. 3.

(a) Stress dependence of the polarization at 20 mHz with slopes used for d32 highlighted in the three regions of interest FR, FTRANS, and FO denoted by blue, red, and green symbols, respectively, which were also used to calculate the slope for d32 values reported in Table I. The inset shows d32 vs stress as calculated from the slope. (b) Strain as a function of electric field measured at 10 Hz for three corresponding regions (FR, FTRANS, and Fo) as above.

Close modal

The crystals were also tested in a special spring and mechanical screw loaded fixture and compressively stressed in the ranges as described above. At these loads, bipolar electrical field-strain hysteresis measurements were performed at fields of 0.3 kV/mm at 10 Hz in order to characterize the converse d32* piezoelectric coefficient (i.e., normalized maximum strain at the maximum applied electric field). The electric field dependence of the strain is plotted in Fig. 3(b), while the crystal is held at a prestress corresponding to either the FR or FO phases or at σc to achieve the phase transition (FTRANS). There is a clear difference in the total strain generated for the same electric field swept at 10 Hz.

The d32 and d32* values as calculated from the slopes of these experiments, as well as the values calculated from the dynamic d32 setup, are summarized in Table I for the three loading conditions of interest corresponding to FR, FO, and FTRANS regions as denoted by blue, red, and green symbols in Fig. 1(a) From the data in Table I, it is clear that the d32 and d32* values are substantially higher in the transition region although there is a fairly large variation in magnitude depending on the measurement technique. The differences may be due to how the measurements were performed (i.e., changes in the boundary conditions in different load frames) since the dynamic d32 measurement showed only a modest decrease as the frequency changed from 1 to 70 Hz.

TABLE I.

Values of d32* and d32 derived from bipolar electric field-strain hysteresis (10 Hz, a: E-S hyst.), slopes of stress-polarization (20 mHz, b), and dynamic d32 measurements (1 and 70 Hz, c).

FRFTRANSFOSetup
20 mHz 1690 pC/N 3440 pC/N 184 pC/N 
1 Hz 1200 pC/N 1700 pC/N 222 pC/N 
10 Hz 824 pm/V 2090 pm/V 98.0 pm/V 
70 Hz 1310 pC/N 1570 pC/N 209 pC/N 
FRFTRANSFOSetup
20 mHz 1690 pC/N 3440 pC/N 184 pC/N 
1 Hz 1200 pC/N 1700 pC/N 222 pC/N 
10 Hz 824 pm/V 2090 pm/V 98.0 pm/V 
70 Hz 1310 pC/N 1570 pC/N 209 pC/N 

After initial characterization of the crystal under low frequency drive conditions, the crystal was installed into a transducer assembly (a Tonpilz-type design) driven over a broader range of frequencies (up to 70 kHz). For this, electrical leads were attached to the electrodes on the surface of the crystal, and the crystal was inserted into the transducer apparatus as shown in the schematic in Fig. 4. A screw on the top was used to apply an adjustable compressive preload to the crystal. The crystal was placed between two ceramic shims, and for optimal boundary conditions, there were several spring washers below the head adapter. Sound was transmitted from the cone on the opposite side, which was submerged in water and directed at the hydrophone. The transducer was not potted with oil or otherwise waterproofed and remained above the surface of water during testing. Initial testing with a square wave pulse was done at the Naval Undersea Warfare Center in Newport, RI. Comparison tests, and then subsequently final characterization discussed herein, were performed at the NRL facility described in detail in the supplementary material.

FIG. 4.

Schematic of the transducer used in the SPL in-water measurements, explaining the crystal placement and application of mechanical bias.

FIG. 4.

Schematic of the transducer used in the SPL in-water measurements, explaining the crystal placement and application of mechanical bias.

Close modal

There are various resonances within the structure, and those resonances shift in frequency and amplitude with applied stress due to the change in sample properties as confirmed by impedance measurements [Fig. 5(a)]; however, the general trend in the sound pressure level (SPL) data is in agreement with the measured piezoelectric coefficients for the three different prestress conditions. The SPL for a 400 V chirp pulse with a broad spectrum waveform [Fig. 5(b)] shows an overall higher result for the crystal under FTRANS loading conditions in the entire frequency range and particularly above 10 kHz. At a local maximum near 27 kHz, there is an enhancement of 15 dB in the SPL between the FTRANS (76 dB) and FR (60 dB) data and a similarly large enhancement as compared to that when the sample is in the FO regime. This suggests that even at much higher frequencies than shown in Table I, the relationship between the d32* coefficients still holds and that the corresponding increase in strain generated through the phase transition directly translates to an increase in the acoustic pressure level.

FIG. 5.

(a) Impedance as a function of frequency at 1 V drive. (b) Sound pressure level for three regimes (FR, FTRANS, and FO) in water at 500 V drive, normalized to 1 m. The inset shows the formed 1–40 kHz pulse used for excitation.

FIG. 5.

(a) Impedance as a function of frequency at 1 V drive. (b) Sound pressure level for three regimes (FR, FTRANS, and FO) in water at 500 V drive, normalized to 1 m. The inset shows the formed 1–40 kHz pulse used for excitation.

Close modal

We also monitored the temperature of the crystal inside the transducer using an IR camera (FLIR E95) while driving at 500 V at 1000 Hz through the phase transition for ∼30 min to achieve equilibrium and found that the sample heating is much less than 1 °C under continuous operation. With negligible heat dissipated and the lack of fatigue previously observed for tens of millions cycles in these PIN–PMN–PT systems,14–16 we believe that these results demonstrate the great potential for using this phase transformational regime for high-power sound-generation transduction. With further chemical and microstructural optimization of single crystal materials—specifically focused on their dynamic piezoelectric properties under stress—we anticipate that such large strains can be generated at even lower fields.

In summary, we investigated and demonstrated a broadband dynamic nonlinear piezoelectric response in [011]-poled ferroelectric 0.24PIN–0.44PMN–0.32PT relaxor single crystals and how to capture this large response for potential application in acoustic transducers. It was shown that compared to linear rhombohedral or orthorhombic modes, the effective nonlinear dynamic d32 or d32* coefficient is almost a factor of two higher, and this enhancement persists over a wide range of frequencies. Through the use of in situ compressive-stress x-ray diffraction, the optimum mechanical bias was identified as being close to the critical stress for triggering rhombohedral–orthorhombic phase transformations, and we demonstrated the excellent performance of a prototype transducer element and the viability of exploiting this effect. The sound pressure level was enhanced (10–15 dB) throughout a large frequency range when the crystal is driven through the phase transition as compared to that when it was in either of the linear piezoelectric regimes. The advantage of implementing nonlinear phase switching that is permitted in [110]-poled PIN–PMN–PT single crystals leads to opportunities for producing acoustic sources with enhanced performance at lower applied fields for highly efficient sound transduction.

See the supplementary material for a full description of a custom-built stress rig permitting in situ x-ray diffraction characterization and also detailed apparatus and the system for water SPL tests in acoustic sensors.

The authors would like to acknowledge funding from the Office of Naval Research under the U.S. Naval Research Laboratory's Basic Research Program and Office of Naval Research Global, ONRG-NICOP Project No. N62909-18-1-2008 Electrosciences Ltd. Parts of this research work was carried in the framework of the ADVENT project (Grant No. 16ENG06 ADVENT), which was supported by the European Metrology Programme for Innovation and Research (EMPIR). The EMPIR initiative was co-funded by the European's Horizon 2020 research and innovation program and the EMPIR Participating States.

All data generated or analyzed during this study are included in this published article (and its supplementary material files) and are also available from the corresponding author upon reasonable request.

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Supplementary Material